Understanding sub-20 nm breakdown behavior of liquid dielectrics
Nanoscale confinement of dielectric molecules is expected to influence their breakdown mechanism in applications such as nanoprobe based machining, molecular electronics, and other related technologies. This Letter presents the first experimental study of the breakdown of nonpolar, nonthiolated liqu...
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| Veröffentlicht in: | Physical review letters 2007-07, Vol.99 (1), p.017601-017601 |
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| container_title | Physical review letters |
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| creator | Virwani, Kumar R Malshe, Ajay P Rajurkar, Kamlakar P |
| description | Nanoscale confinement of dielectric molecules is expected to influence their breakdown mechanism in applications such as nanoprobe based machining, molecular electronics, and other related technologies. This Letter presents the first experimental study of the breakdown of nonpolar, nonthiolated liquid dielectrics in the nanometer regime and develops a field emission assisted avalanche based approach to model such behavior. The studies show that dielectric breakdown in the sub-20 nm regime is independent of the cathode materials and is dominated by the electron emission and atomic cluster migration due to the "sub-20 nm scale confinement of the liquid dielectric." |
| doi_str_mv | 10.1103/PhysRevLett.99.017601 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_20957859</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>68132884</sourcerecordid><originalsourceid>FETCH-LOGICAL-o167t-e7a30d97c46222f44a8663d579a552b81a5f71fee30062daefef4b93287425c93</originalsourceid><addsrcrecordid>eNo10F1LwzAYBeAgipvTn6AUBO863yRtPu6U4RcMFHHXJU3eumjXbk062b-3snl1bh4Oh0PIJYUppcBv35a78I7bOcY41XoKVAqgR2RMQepUUpodkzEAp6kGkCNyFsIXAFAm1CkZDVgqqtSY3C0ah12IpnG--UxCX6YMkmaVlB2ab9f-NEmJS7P1bZe0VVL7Te9d4jzWaGPnbTgnJ5WpA14cckIWjw8fs-d0_vr0Mrufpy0VMqYoDQenpc0EY6zKMqOE4C6X2uQ5KxU1eSVphcgBBHMGK6yyUnOmZMZyq_mEXO972xB9EayPaJe2bZphR8FA51Llf-pmr9Zdu-kxxGLlg8W6Ng22fSiEokOlygZ4dYB9uUJXrDu_Mt2u-H-G_wJgTGbm</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>68132884</pqid></control><display><type>article</type><title>Understanding sub-20 nm breakdown behavior of liquid dielectrics</title><source>American Physical Society Journals</source><creator>Virwani, Kumar R ; Malshe, Ajay P ; Rajurkar, Kamlakar P</creator><creatorcontrib>Virwani, Kumar R ; Malshe, Ajay P ; Rajurkar, Kamlakar P</creatorcontrib><description>Nanoscale confinement of dielectric molecules is expected to influence their breakdown mechanism in applications such as nanoprobe based machining, molecular electronics, and other related technologies. This Letter presents the first experimental study of the breakdown of nonpolar, nonthiolated liquid dielectrics in the nanometer regime and develops a field emission assisted avalanche based approach to model such behavior. The studies show that dielectric breakdown in the sub-20 nm regime is independent of the cathode materials and is dominated by the electron emission and atomic cluster migration due to the "sub-20 nm scale confinement of the liquid dielectric."</description><identifier>ISSN: 0031-9007</identifier><identifier>EISSN: 1079-7114</identifier><identifier>DOI: 10.1103/PhysRevLett.99.017601</identifier><identifier>PMID: 17678188</identifier><language>eng</language><publisher>United States</publisher><subject>ATOMIC CLUSTERS ; BREAKDOWN ; CATHODES ; CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ; CONFINEMENT ; DIELECTRIC MATERIALS ; ELECTRON EMISSION ; FIELD EMISSION ; LIQUIDS ; MACHINING ; NANOSTRUCTURES</subject><ispartof>Physical review letters, 2007-07, Vol.99 (1), p.017601-017601</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/17678188$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/20957859$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Virwani, Kumar R</creatorcontrib><creatorcontrib>Malshe, Ajay P</creatorcontrib><creatorcontrib>Rajurkar, Kamlakar P</creatorcontrib><title>Understanding sub-20 nm breakdown behavior of liquid dielectrics</title><title>Physical review letters</title><addtitle>Phys Rev Lett</addtitle><description>Nanoscale confinement of dielectric molecules is expected to influence their breakdown mechanism in applications such as nanoprobe based machining, molecular electronics, and other related technologies. This Letter presents the first experimental study of the breakdown of nonpolar, nonthiolated liquid dielectrics in the nanometer regime and develops a field emission assisted avalanche based approach to model such behavior. The studies show that dielectric breakdown in the sub-20 nm regime is independent of the cathode materials and is dominated by the electron emission and atomic cluster migration due to the "sub-20 nm scale confinement of the liquid dielectric."</description><subject>ATOMIC CLUSTERS</subject><subject>BREAKDOWN</subject><subject>CATHODES</subject><subject>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</subject><subject>CONFINEMENT</subject><subject>DIELECTRIC MATERIALS</subject><subject>ELECTRON EMISSION</subject><subject>FIELD EMISSION</subject><subject>LIQUIDS</subject><subject>MACHINING</subject><subject>NANOSTRUCTURES</subject><issn>0031-9007</issn><issn>1079-7114</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNo10F1LwzAYBeAgipvTn6AUBO863yRtPu6U4RcMFHHXJU3eumjXbk062b-3snl1bh4Oh0PIJYUppcBv35a78I7bOcY41XoKVAqgR2RMQepUUpodkzEAp6kGkCNyFsIXAFAm1CkZDVgqqtSY3C0ah12IpnG--UxCX6YMkmaVlB2ab9f-NEmJS7P1bZe0VVL7Te9d4jzWaGPnbTgnJ5WpA14cckIWjw8fs-d0_vr0Mrufpy0VMqYoDQenpc0EY6zKMqOE4C6X2uQ5KxU1eSVphcgBBHMGK6yyUnOmZMZyq_mEXO972xB9EayPaJe2bZphR8FA51Llf-pmr9Zdu-kxxGLlg8W6Ng22fSiEokOlygZ4dYB9uUJXrDu_Mt2u-H-G_wJgTGbm</recordid><startdate>20070706</startdate><enddate>20070706</enddate><creator>Virwani, Kumar R</creator><creator>Malshe, Ajay P</creator><creator>Rajurkar, Kamlakar P</creator><scope>NPM</scope><scope>7X8</scope><scope>OTOTI</scope></search><sort><creationdate>20070706</creationdate><title>Understanding sub-20 nm breakdown behavior of liquid dielectrics</title><author>Virwani, Kumar R ; Malshe, Ajay P ; Rajurkar, Kamlakar P</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-o167t-e7a30d97c46222f44a8663d579a552b81a5f71fee30062daefef4b93287425c93</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>ATOMIC CLUSTERS</topic><topic>BREAKDOWN</topic><topic>CATHODES</topic><topic>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</topic><topic>CONFINEMENT</topic><topic>DIELECTRIC MATERIALS</topic><topic>ELECTRON EMISSION</topic><topic>FIELD EMISSION</topic><topic>LIQUIDS</topic><topic>MACHINING</topic><topic>NANOSTRUCTURES</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Virwani, Kumar R</creatorcontrib><creatorcontrib>Malshe, Ajay P</creatorcontrib><creatorcontrib>Rajurkar, Kamlakar P</creatorcontrib><collection>PubMed</collection><collection>MEDLINE - Academic</collection><collection>OSTI.GOV</collection><jtitle>Physical review letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Virwani, Kumar R</au><au>Malshe, Ajay P</au><au>Rajurkar, Kamlakar P</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Understanding sub-20 nm breakdown behavior of liquid dielectrics</atitle><jtitle>Physical review letters</jtitle><addtitle>Phys Rev Lett</addtitle><date>2007-07-06</date><risdate>2007</risdate><volume>99</volume><issue>1</issue><spage>017601</spage><epage>017601</epage><pages>017601-017601</pages><issn>0031-9007</issn><eissn>1079-7114</eissn><abstract>Nanoscale confinement of dielectric molecules is expected to influence their breakdown mechanism in applications such as nanoprobe based machining, molecular electronics, and other related technologies. This Letter presents the first experimental study of the breakdown of nonpolar, nonthiolated liquid dielectrics in the nanometer regime and develops a field emission assisted avalanche based approach to model such behavior. The studies show that dielectric breakdown in the sub-20 nm regime is independent of the cathode materials and is dominated by the electron emission and atomic cluster migration due to the "sub-20 nm scale confinement of the liquid dielectric."</abstract><cop>United States</cop><pmid>17678188</pmid><doi>10.1103/PhysRevLett.99.017601</doi><tpages>1</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
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| ispartof | Physical review letters, 2007-07, Vol.99 (1), p.017601-017601 |
| issn | 0031-9007 1079-7114 |
| language | eng |
| recordid | cdi_osti_scitechconnect_20957859 |
| source | American Physical Society Journals |
| subjects | ATOMIC CLUSTERS BREAKDOWN CATHODES CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS CONFINEMENT DIELECTRIC MATERIALS ELECTRON EMISSION FIELD EMISSION LIQUIDS MACHINING NANOSTRUCTURES |
| title | Understanding sub-20 nm breakdown behavior of liquid dielectrics |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-22T09%3A04%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Understanding%20sub-20%20nm%20breakdown%20behavior%20of%20liquid%20dielectrics&rft.jtitle=Physical%20review%20letters&rft.au=Virwani,%20Kumar%20R&rft.date=2007-07-06&rft.volume=99&rft.issue=1&rft.spage=017601&rft.epage=017601&rft.pages=017601-017601&rft.issn=0031-9007&rft.eissn=1079-7114&rft_id=info:doi/10.1103/PhysRevLett.99.017601&rft_dat=%3Cproquest_osti_%3E68132884%3C/proquest_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=68132884&rft_id=info:pmid/17678188&rfr_iscdi=true |