Method for measurement of the density of thin films of small organic molecules
An accurate and sensitive method is reported to measure the thin-film density of vacuum-deposited, small-molecular organic semiconductor materials. A spectrophotometer and surface profiler had been used to determine the mass and thickness of organic thin film, respectively. The calculated density of...
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| Veröffentlicht in: | Review of scientific instruments 2007-03, Vol.78 (3), p.034104-034104 |
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| container_title | Review of scientific instruments |
| container_volume | 78 |
| creator | Xiang, Hai-Feng Xu, Zong-Xiang Roy, V. A. L. Che, Chi-Ming Lai, P. T. |
| description | An accurate and sensitive method is reported to measure the thin-film density of vacuum-deposited, small-molecular organic semiconductor materials. A spectrophotometer and surface profiler had been used to determine the mass and thickness of organic thin film, respectively. The calculated density of tris-(8-hydroxyquinolato) aluminum
(
Alq
3
)
thin film was
1.31
±
0.01
g
∕
cm
3
. Vacuum pressures and thin-film growth rates are found to have less impact on the thin-film density of organic material. However, the thin-film density of organic material strongly depends on its chemical structure and molecular weight. Specifically, the chemical structure determines the density of organic material that affects the molecular volume and intermolecular stacking. |
| doi_str_mv | 10.1063/1.2712932 |
| format | Article |
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(
Alq
3
)
thin film was
1.31
±
0.01
g
∕
cm
3
. Vacuum pressures and thin-film growth rates are found to have less impact on the thin-film density of organic material. However, the thin-film density of organic material strongly depends on its chemical structure and molecular weight. Specifically, the chemical structure determines the density of organic material that affects the molecular volume and intermolecular stacking.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.2712932</identifier><identifier>PMID: 17411199</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>United States</publisher><subject>ALUMINIUM ; COATINGS ; DENSITY ; MATERIALS SCIENCE ; MOLECULAR STRUCTURE ; MOLECULAR WEIGHT ; MOLECULES ; Organic Chemicals - chemistry ; ORGANIC SEMICONDUCTORS ; Semiconductors ; SPECTROPHOTOMETERS ; SPECTROPHOTOMETRY ; Spectrophotometry - instrumentation ; Surface Properties ; SURFACES ; THICKNESS ; THIN FILMS ; Vacuum</subject><ispartof>Review of scientific instruments, 2007-03, Vol.78 (3), p.034104-034104</ispartof><rights>American Institute of Physics</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c482t-c7f21a5b7b26f4e01d1252c2d7b4709502ecfc3ba00ef3e3fb8268cfee4180b33</citedby><cites>FETCH-LOGICAL-c482t-c7f21a5b7b26f4e01d1252c2d7b4709502ecfc3ba00ef3e3fb8268cfee4180b33</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.2712932$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,314,776,780,790,881,1553,4497,27903,27904,76130,76136</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/17411199$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/20953395$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Xiang, Hai-Feng</creatorcontrib><creatorcontrib>Xu, Zong-Xiang</creatorcontrib><creatorcontrib>Roy, V. A. L.</creatorcontrib><creatorcontrib>Che, Chi-Ming</creatorcontrib><creatorcontrib>Lai, P. T.</creatorcontrib><title>Method for measurement of the density of thin films of small organic molecules</title><title>Review of scientific instruments</title><addtitle>Rev Sci Instrum</addtitle><description>An accurate and sensitive method is reported to measure the thin-film density of vacuum-deposited, small-molecular organic semiconductor materials. A spectrophotometer and surface profiler had been used to determine the mass and thickness of organic thin film, respectively. The calculated density of tris-(8-hydroxyquinolato) aluminum
(
Alq
3
)
thin film was
1.31
±
0.01
g
∕
cm
3
. Vacuum pressures and thin-film growth rates are found to have less impact on the thin-film density of organic material. However, the thin-film density of organic material strongly depends on its chemical structure and molecular weight. Specifically, the chemical structure determines the density of organic material that affects the molecular volume and intermolecular stacking.</description><subject>ALUMINIUM</subject><subject>COATINGS</subject><subject>DENSITY</subject><subject>MATERIALS SCIENCE</subject><subject>MOLECULAR STRUCTURE</subject><subject>MOLECULAR WEIGHT</subject><subject>MOLECULES</subject><subject>Organic Chemicals - chemistry</subject><subject>ORGANIC SEMICONDUCTORS</subject><subject>Semiconductors</subject><subject>SPECTROPHOTOMETERS</subject><subject>SPECTROPHOTOMETRY</subject><subject>Spectrophotometry - instrumentation</subject><subject>Surface Properties</subject><subject>SURFACES</subject><subject>THICKNESS</subject><subject>THIN FILMS</subject><subject>Vacuum</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNp90F1LwzAUBuAgis7phX9ACoKg0JmTdE17KcMv8ONGr0OanrhI28wkFfz3dnS4C8FACAce3hxeQk6AzoDm_ApmTAArOdshE6BFmYqc8V0yoZRnaS6y4oAchvBBhzMH2CcHIDIAKMsJeX7CuHR1YpxPWlSh99hiFxNnkrjEpMYu2Pg9jrZLjG3asJ5Cq5omcf5ddVYnrWtQ9w2GI7JnVBPwePNOydvtzeviPn18uXtYXD-mOitYTLUwDNS8EhXLTYYUamBzplktqkzQck4ZaqN5pShFw5GbqmB5oQ1iBgWtOJ-SszHXhWhl0DaiXmrXdaijZEMC58OdkvNRrbz77DFE2dqgsWlUh64PUlA-tJOt4cUItXcheDRy5W2r_LcEKtcVS5Cbigd7ugntqxbrrdx0OoDLEazXUtG67td8Ob9Nkqva_If_fv0DeOGRgQ</recordid><startdate>20070301</startdate><enddate>20070301</enddate><creator>Xiang, Hai-Feng</creator><creator>Xu, Zong-Xiang</creator><creator>Roy, V. A. L.</creator><creator>Che, Chi-Ming</creator><creator>Lai, P. T.</creator><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>OTOTI</scope></search><sort><creationdate>20070301</creationdate><title>Method for measurement of the density of thin films of small organic molecules</title><author>Xiang, Hai-Feng ; Xu, Zong-Xiang ; Roy, V. A. L. ; Che, Chi-Ming ; Lai, P. T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c482t-c7f21a5b7b26f4e01d1252c2d7b4709502ecfc3ba00ef3e3fb8268cfee4180b33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>ALUMINIUM</topic><topic>COATINGS</topic><topic>DENSITY</topic><topic>MATERIALS SCIENCE</topic><topic>MOLECULAR STRUCTURE</topic><topic>MOLECULAR WEIGHT</topic><topic>MOLECULES</topic><topic>Organic Chemicals - chemistry</topic><topic>ORGANIC SEMICONDUCTORS</topic><topic>Semiconductors</topic><topic>SPECTROPHOTOMETERS</topic><topic>SPECTROPHOTOMETRY</topic><topic>Spectrophotometry - instrumentation</topic><topic>Surface Properties</topic><topic>SURFACES</topic><topic>THICKNESS</topic><topic>THIN FILMS</topic><topic>Vacuum</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Xiang, Hai-Feng</creatorcontrib><creatorcontrib>Xu, Zong-Xiang</creatorcontrib><creatorcontrib>Roy, V. A. L.</creatorcontrib><creatorcontrib>Che, Chi-Ming</creatorcontrib><creatorcontrib>Lai, P. T.</creatorcontrib><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>OSTI.GOV</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Xiang, Hai-Feng</au><au>Xu, Zong-Xiang</au><au>Roy, V. A. L.</au><au>Che, Chi-Ming</au><au>Lai, P. T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Method for measurement of the density of thin films of small organic molecules</atitle><jtitle>Review of scientific instruments</jtitle><addtitle>Rev Sci Instrum</addtitle><date>2007-03-01</date><risdate>2007</risdate><volume>78</volume><issue>3</issue><spage>034104</spage><epage>034104</epage><pages>034104-034104</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>An accurate and sensitive method is reported to measure the thin-film density of vacuum-deposited, small-molecular organic semiconductor materials. A spectrophotometer and surface profiler had been used to determine the mass and thickness of organic thin film, respectively. The calculated density of tris-(8-hydroxyquinolato) aluminum
(
Alq
3
)
thin film was
1.31
±
0.01
g
∕
cm
3
. Vacuum pressures and thin-film growth rates are found to have less impact on the thin-film density of organic material. However, the thin-film density of organic material strongly depends on its chemical structure and molecular weight. Specifically, the chemical structure determines the density of organic material that affects the molecular volume and intermolecular stacking.</abstract><cop>United States</cop><pmid>17411199</pmid><doi>10.1063/1.2712932</doi><tpages>5</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
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| ispartof | Review of scientific instruments, 2007-03, Vol.78 (3), p.034104-034104 |
| issn | 0034-6748 1089-7623 |
| language | eng |
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| source | MEDLINE; AIP Journals Complete; AIP Digital Archive |
| subjects | ALUMINIUM COATINGS DENSITY MATERIALS SCIENCE MOLECULAR STRUCTURE MOLECULAR WEIGHT MOLECULES Organic Chemicals - chemistry ORGANIC SEMICONDUCTORS Semiconductors SPECTROPHOTOMETERS SPECTROPHOTOMETRY Spectrophotometry - instrumentation Surface Properties SURFACES THICKNESS THIN FILMS Vacuum |
| title | Method for measurement of the density of thin films of small organic molecules |
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