Surface elemental analysis in ambient atmosphere using electron-induced x-ray fluorescence

The progress in the development of the atmospheric electron x-ray spectrometer (AEXS) is described. The AEXS is a surface analysis tool based on excitation of characteristic x-ray fluorescence (XRF) spectra from samples in ambient atmospheres using a focused electron beam. Operation in ambient atmos...

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Bibliographische Detailangaben

Veröffentlicht in:	Review of scientific instruments 2006-01, Vol.77 (1)
Hauptverfasser:	Urgiles, Eduardo, Toda, Risaku, Wilcox, Jaroslava Z.
Format:	Artikel
Sprache:	eng
Schlagworte:	ELECTRON BEAMS ELECTRON MICROPROBE ANALYSIS ELECTRON PROBES ELECTRONS EXCITATION FLUORESCENCE INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY KEV RANGE 10-100 OPERATION SPATIAL RESOLUTION SPECTRA SURFACES X RADIATION X-RAY FLUORESCENCE ANALYSIS X-RAY SPECTROMETERS
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