Efficient sub 100 nm focusing of hard x rays
An x-ray beam with energy of 20.5 keV has been efficiently focused down to a spot size as small as 90 nm × 90 nm by a Kirkpatrick-Baez reflecting mirrors device. The first mirror, coated with a graded multilayer, plays both the role of vertical focusing device and monochromator, resulting in a very...
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| Veröffentlicht in: | Review of scientific instruments 2005-06, Vol.76 (6), p.063709-063709-5 |
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| container_end_page | 063709-5 |
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| container_issue | 6 |
| container_start_page | 063709 |
| container_title | Review of scientific instruments |
| container_volume | 76 |
| creator | Hignette, O. Cloetens, P. Rostaing, G. Bernard, P. Morawe, C. |
| description | An x-ray beam with energy of
20.5
keV
has been efficiently focused down to a spot size as small as
90
nm
×
90
nm
by a Kirkpatrick-Baez reflecting mirrors device. The first mirror, coated with a graded multilayer, plays both the role of vertical focusing device and monochromator, resulting in a very high flux
(
2
×
10
11
photons
∕
s
)
and medium monochromaticity
(
Δ
E
∕
E
∼
10
−
2
)
. Evaluation of the error contributions shows that the vertical focus is presently limited by the mirror figure errors, while the horizontal focus is limited by the horizontal extension of the x-ray source. With a gain in excess of a few million, this device opens up new possibilities in trace element nanoanalysis and fast projection microscopy. |
| doi_str_mv | 10.1063/1.1928191 |
| format | Article |
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20.5
keV
has been efficiently focused down to a spot size as small as
90
nm
×
90
nm
by a Kirkpatrick-Baez reflecting mirrors device. The first mirror, coated with a graded multilayer, plays both the role of vertical focusing device and monochromator, resulting in a very high flux
(
2
×
10
11
photons
∕
s
)
and medium monochromaticity
(
Δ
E
∕
E
∼
10
−
2
)
. Evaluation of the error contributions shows that the vertical focus is presently limited by the mirror figure errors, while the horizontal focus is limited by the horizontal extension of the x-ray source. With a gain in excess of a few million, this device opens up new possibilities in trace element nanoanalysis and fast projection microscopy.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1928191</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>United States: American Institute of Physics</publisher><subject>BEAMS ; ERRORS ; FOCUSING ; HARD X RADIATION ; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY ; KEV RANGE 10-100 ; MICROSCOPY ; MIRRORS ; MONOCHROMATORS ; OPTICS ; PHOTONS ; X-RAY SOURCES</subject><ispartof>Review of scientific instruments, 2005-06, Vol.76 (6), p.063709-063709-5</ispartof><rights>2005 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-o233t-7e9cf6b070814244290aa5cff3a67048eeb3f8325b0351f2c04e5cafb27735243</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1928191$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,314,780,784,794,885,1559,4511,27923,27924,76255,76261</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/20722907$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Hignette, O.</creatorcontrib><creatorcontrib>Cloetens, P.</creatorcontrib><creatorcontrib>Rostaing, G.</creatorcontrib><creatorcontrib>Bernard, P.</creatorcontrib><creatorcontrib>Morawe, C.</creatorcontrib><title>Efficient sub 100 nm focusing of hard x rays</title><title>Review of scientific instruments</title><description>An x-ray beam with energy of
20.5
keV
has been efficiently focused down to a spot size as small as
90
nm
×
90
nm
by a Kirkpatrick-Baez reflecting mirrors device. The first mirror, coated with a graded multilayer, plays both the role of vertical focusing device and monochromator, resulting in a very high flux
(
2
×
10
11
photons
∕
s
)
and medium monochromaticity
(
Δ
E
∕
E
∼
10
−
2
)
. Evaluation of the error contributions shows that the vertical focus is presently limited by the mirror figure errors, while the horizontal focus is limited by the horizontal extension of the x-ray source. With a gain in excess of a few million, this device opens up new possibilities in trace element nanoanalysis and fast projection microscopy.</description><subject>BEAMS</subject><subject>ERRORS</subject><subject>FOCUSING</subject><subject>HARD X RADIATION</subject><subject>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</subject><subject>KEV RANGE 10-100</subject><subject>MICROSCOPY</subject><subject>MIRRORS</subject><subject>MONOCHROMATORS</subject><subject>OPTICS</subject><subject>PHOTONS</subject><subject>X-RAY SOURCES</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNo9kE1LAzEURYMoOFYX_oOAW6e-l49JspRSq1Bwo-uQiYmN2IxMUrD_3ikt3s3dHA7cS8gtwhyh4w84R8M0GjwjDYI2reoYPycNABdtp4S-JFelfMEUidiQ-2WMyaeQKy27niIAzVsaB78rKX_SIdKNGz_oLx3dvlyTi-i-S7g59Yy8Py3fFs_t-nX1snhctwPjvLYqGB-7HhRoFEwIZsA56WPkrlMgdAg9j5oz2QOXGJkHEaR3sWdKcckEn5G7o3coNdniUw1-44ecg6-WgWKTUU2UOVIHwNU0ZPszpq0b9xbBHt6waE9v_K-000qL_A8f3lPN</recordid><startdate>20050615</startdate><enddate>20050615</enddate><creator>Hignette, O.</creator><creator>Cloetens, P.</creator><creator>Rostaing, G.</creator><creator>Bernard, P.</creator><creator>Morawe, C.</creator><general>American Institute of Physics</general><scope>OTOTI</scope></search><sort><creationdate>20050615</creationdate><title>Efficient sub 100 nm focusing of hard x rays</title><author>Hignette, O. ; Cloetens, P. ; Rostaing, G. ; Bernard, P. ; Morawe, C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-o233t-7e9cf6b070814244290aa5cff3a67048eeb3f8325b0351f2c04e5cafb27735243</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>BEAMS</topic><topic>ERRORS</topic><topic>FOCUSING</topic><topic>HARD X RADIATION</topic><topic>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</topic><topic>KEV RANGE 10-100</topic><topic>MICROSCOPY</topic><topic>MIRRORS</topic><topic>MONOCHROMATORS</topic><topic>OPTICS</topic><topic>PHOTONS</topic><topic>X-RAY SOURCES</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hignette, O.</creatorcontrib><creatorcontrib>Cloetens, P.</creatorcontrib><creatorcontrib>Rostaing, G.</creatorcontrib><creatorcontrib>Bernard, P.</creatorcontrib><creatorcontrib>Morawe, C.</creatorcontrib><collection>OSTI.GOV</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hignette, O.</au><au>Cloetens, P.</au><au>Rostaing, G.</au><au>Bernard, P.</au><au>Morawe, C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Efficient sub 100 nm focusing of hard x rays</atitle><jtitle>Review of scientific instruments</jtitle><date>2005-06-15</date><risdate>2005</risdate><volume>76</volume><issue>6</issue><spage>063709</spage><epage>063709-5</epage><pages>063709-063709-5</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>An x-ray beam with energy of
20.5
keV
has been efficiently focused down to a spot size as small as
90
nm
×
90
nm
by a Kirkpatrick-Baez reflecting mirrors device. The first mirror, coated with a graded multilayer, plays both the role of vertical focusing device and monochromator, resulting in a very high flux
(
2
×
10
11
photons
∕
s
)
and medium monochromaticity
(
Δ
E
∕
E
∼
10
−
2
)
. Evaluation of the error contributions shows that the vertical focus is presently limited by the mirror figure errors, while the horizontal focus is limited by the horizontal extension of the x-ray source. With a gain in excess of a few million, this device opens up new possibilities in trace element nanoanalysis and fast projection microscopy.</abstract><cop>United States</cop><pub>American Institute of Physics</pub><doi>10.1063/1.1928191</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0034-6748 |
| ispartof | Review of scientific instruments, 2005-06, Vol.76 (6), p.063709-063709-5 |
| issn | 0034-6748 1089-7623 |
| language | eng |
| recordid | cdi_osti_scitechconnect_20722907 |
| source | AIP Journals Complete; AIP Digital Archive |
| subjects | BEAMS ERRORS FOCUSING HARD X RADIATION INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY KEV RANGE 10-100 MICROSCOPY MIRRORS MONOCHROMATORS OPTICS PHOTONS X-RAY SOURCES |
| title | Efficient sub 100 nm focusing of hard x rays |
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