Accurate determination of atomic structure of multiwalled carbon nanotubes by nondestructive nanobeam electron diffraction

We report a method that allows direct, systematic, and accurate determination of the atomic structure of multiwalled carbon nanotubes by analyzing the scattering intensities on the nonequatorial layer lines in the electron diffraction pattern. Complete structure determination of a quadruple-walled c...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied physics letters 2005-05, Vol.86 (19), p.191903-191903-3
Hauptverfasser: Liu, Zejian, Zhang, Qi, Qin, Lu-Chang
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 191903-3
container_issue 19
container_start_page 191903
container_title Applied physics letters
container_volume 86
creator Liu, Zejian
Zhang, Qi
Qin, Lu-Chang
description We report a method that allows direct, systematic, and accurate determination of the atomic structure of multiwalled carbon nanotubes by analyzing the scattering intensities on the nonequatorial layer lines in the electron diffraction pattern. Complete structure determination of a quadruple-walled carbon nanotube is described as an example, and it was found that the intertubular distance varied from 0.36 nm to 0.5 nm with a mean value of 0.42 nm .
doi_str_mv 10.1063/1.1923170
format Article
fullrecord <record><control><sourceid>scitation_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_20702333</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>apl</sourcerecordid><originalsourceid>FETCH-LOGICAL-c347t-b6035e70fbd93e9cd5a808f58ed4649e3f614801cac5dc2d8aacc78d22c96d893</originalsourceid><addsrcrecordid>eNp1kEtLxDAQgIMouK4e_AcBTx66Jk2fF2FZfMGCFz2HdDLBSNtIkirrr7fdruDF0zAz3zz4CLnkbMVZIW74itep4CU7IgvOyjIRnFfHZMEYE0lR5_yUnIXwPqZ5KsSCfK8BBq8iUo0RfWd7Fa3rqTNURddZoCH6AeLgcap1Qxvtl2pb1BSUb0ayV72LQ4OBNjvau17jPGE_cd9rUHUUW4ToR1pbY7yC6cY5OTGqDXhxiEvyen_3snlMts8PT5v1NgGRlTFpCiZyLJlpdC2wBp2rilUmr1BnRVajMAXPKsZBQa4h1ZVSAGWl0xTqQle1WJKrea8L0coANiK8gev78SWZspKNIsRIXc8UeBeCRyM_vO2U30nO5KRWcnlQO7K3Mzst2_v6H_71K__4FT-9PoRW</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Accurate determination of atomic structure of multiwalled carbon nanotubes by nondestructive nanobeam electron diffraction</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><creator>Liu, Zejian ; Zhang, Qi ; Qin, Lu-Chang</creator><creatorcontrib>Liu, Zejian ; Zhang, Qi ; Qin, Lu-Chang</creatorcontrib><description>We report a method that allows direct, systematic, and accurate determination of the atomic structure of multiwalled carbon nanotubes by analyzing the scattering intensities on the nonequatorial layer lines in the electron diffraction pattern. Complete structure determination of a quadruple-walled carbon nanotube is described as an example, and it was found that the intertubular distance varied from 0.36 nm to 0.5 nm with a mean value of 0.42 nm .</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.1923170</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>United States: American Institute of Physics</publisher><subject>BRAGG REFLECTION ; CARBON ; CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ; DIFFRACTION GRATINGS ; ELECTRON DIFFRACTION ; NANOTUBES ; NONDESTRUCTIVE TESTING</subject><ispartof>Applied physics letters, 2005-05, Vol.86 (19), p.191903-191903-3</ispartof><rights>2005 American Institute of Physics</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c347t-b6035e70fbd93e9cd5a808f58ed4649e3f614801cac5dc2d8aacc78d22c96d893</citedby><cites>FETCH-LOGICAL-c347t-b6035e70fbd93e9cd5a808f58ed4649e3f614801cac5dc2d8aacc78d22c96d893</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.1923170$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,314,778,782,792,883,1556,4500,27911,27912,76141,76147</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/20702333$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Liu, Zejian</creatorcontrib><creatorcontrib>Zhang, Qi</creatorcontrib><creatorcontrib>Qin, Lu-Chang</creatorcontrib><title>Accurate determination of atomic structure of multiwalled carbon nanotubes by nondestructive nanobeam electron diffraction</title><title>Applied physics letters</title><description>We report a method that allows direct, systematic, and accurate determination of the atomic structure of multiwalled carbon nanotubes by analyzing the scattering intensities on the nonequatorial layer lines in the electron diffraction pattern. Complete structure determination of a quadruple-walled carbon nanotube is described as an example, and it was found that the intertubular distance varied from 0.36 nm to 0.5 nm with a mean value of 0.42 nm .</description><subject>BRAGG REFLECTION</subject><subject>CARBON</subject><subject>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</subject><subject>DIFFRACTION GRATINGS</subject><subject>ELECTRON DIFFRACTION</subject><subject>NANOTUBES</subject><subject>NONDESTRUCTIVE TESTING</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNp1kEtLxDAQgIMouK4e_AcBTx66Jk2fF2FZfMGCFz2HdDLBSNtIkirrr7fdruDF0zAz3zz4CLnkbMVZIW74itep4CU7IgvOyjIRnFfHZMEYE0lR5_yUnIXwPqZ5KsSCfK8BBq8iUo0RfWd7Fa3rqTNURddZoCH6AeLgcap1Qxvtl2pb1BSUb0ayV72LQ4OBNjvau17jPGE_cd9rUHUUW4ToR1pbY7yC6cY5OTGqDXhxiEvyen_3snlMts8PT5v1NgGRlTFpCiZyLJlpdC2wBp2rilUmr1BnRVajMAXPKsZBQa4h1ZVSAGWl0xTqQle1WJKrea8L0coANiK8gev78SWZspKNIsRIXc8UeBeCRyM_vO2U30nO5KRWcnlQO7K3Mzst2_v6H_71K__4FT-9PoRW</recordid><startdate>20050509</startdate><enddate>20050509</enddate><creator>Liu, Zejian</creator><creator>Zhang, Qi</creator><creator>Qin, Lu-Chang</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>20050509</creationdate><title>Accurate determination of atomic structure of multiwalled carbon nanotubes by nondestructive nanobeam electron diffraction</title><author>Liu, Zejian ; Zhang, Qi ; Qin, Lu-Chang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c347t-b6035e70fbd93e9cd5a808f58ed4649e3f614801cac5dc2d8aacc78d22c96d893</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>BRAGG REFLECTION</topic><topic>CARBON</topic><topic>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</topic><topic>DIFFRACTION GRATINGS</topic><topic>ELECTRON DIFFRACTION</topic><topic>NANOTUBES</topic><topic>NONDESTRUCTIVE TESTING</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Liu, Zejian</creatorcontrib><creatorcontrib>Zhang, Qi</creatorcontrib><creatorcontrib>Qin, Lu-Chang</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Liu, Zejian</au><au>Zhang, Qi</au><au>Qin, Lu-Chang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Accurate determination of atomic structure of multiwalled carbon nanotubes by nondestructive nanobeam electron diffraction</atitle><jtitle>Applied physics letters</jtitle><date>2005-05-09</date><risdate>2005</risdate><volume>86</volume><issue>19</issue><spage>191903</spage><epage>191903-3</epage><pages>191903-191903-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>We report a method that allows direct, systematic, and accurate determination of the atomic structure of multiwalled carbon nanotubes by analyzing the scattering intensities on the nonequatorial layer lines in the electron diffraction pattern. Complete structure determination of a quadruple-walled carbon nanotube is described as an example, and it was found that the intertubular distance varied from 0.36 nm to 0.5 nm with a mean value of 0.42 nm .</abstract><cop>United States</cop><pub>American Institute of Physics</pub><doi>10.1063/1.1923170</doi><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 0003-6951
ispartof Applied physics letters, 2005-05, Vol.86 (19), p.191903-191903-3
issn 0003-6951
1077-3118
language eng
recordid cdi_osti_scitechconnect_20702333
source AIP Journals Complete; AIP Digital Archive
subjects BRAGG REFLECTION
CARBON
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
DIFFRACTION GRATINGS
ELECTRON DIFFRACTION
NANOTUBES
NONDESTRUCTIVE TESTING
title Accurate determination of atomic structure of multiwalled carbon nanotubes by nondestructive nanobeam electron diffraction
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T10%3A24%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Accurate%20determination%20of%20atomic%20structure%20of%20multiwalled%20carbon%20nanotubes%20by%20nondestructive%20nanobeam%20electron%20diffraction&rft.jtitle=Applied%20physics%20letters&rft.au=Liu,%20Zejian&rft.date=2005-05-09&rft.volume=86&rft.issue=19&rft.spage=191903&rft.epage=191903-3&rft.pages=191903-191903-3&rft.issn=0003-6951&rft.eissn=1077-3118&rft.coden=APPLAB&rft_id=info:doi/10.1063/1.1923170&rft_dat=%3Cscitation_osti_%3Eapl%3C/scitation_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true