Accurate determination of atomic structure of multiwalled carbon nanotubes by nondestructive nanobeam electron diffraction
We report a method that allows direct, systematic, and accurate determination of the atomic structure of multiwalled carbon nanotubes by analyzing the scattering intensities on the nonequatorial layer lines in the electron diffraction pattern. Complete structure determination of a quadruple-walled c...
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Veröffentlicht in: | Applied physics letters 2005-05, Vol.86 (19), p.191903-191903-3 |
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container_end_page | 191903-3 |
---|---|
container_issue | 19 |
container_start_page | 191903 |
container_title | Applied physics letters |
container_volume | 86 |
creator | Liu, Zejian Zhang, Qi Qin, Lu-Chang |
description | We report a method that allows direct, systematic, and accurate determination of the atomic structure of multiwalled carbon nanotubes by analyzing the scattering intensities on the nonequatorial layer lines in the electron diffraction pattern. Complete structure determination of a quadruple-walled carbon nanotube is described as an example, and it was found that the intertubular distance varied from
0.36
nm
to
0.5
nm
with a mean value of
0.42
nm
. |
doi_str_mv | 10.1063/1.1923170 |
format | Article |
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0.36
nm
to
0.5
nm
with a mean value of
0.42
nm
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0.36
nm
to
0.5
nm
with a mean value of
0.42
nm
.</description><subject>BRAGG REFLECTION</subject><subject>CARBON</subject><subject>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</subject><subject>DIFFRACTION GRATINGS</subject><subject>ELECTRON DIFFRACTION</subject><subject>NANOTUBES</subject><subject>NONDESTRUCTIVE TESTING</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNp1kEtLxDAQgIMouK4e_AcBTx66Jk2fF2FZfMGCFz2HdDLBSNtIkirrr7fdruDF0zAz3zz4CLnkbMVZIW74itep4CU7IgvOyjIRnFfHZMEYE0lR5_yUnIXwPqZ5KsSCfK8BBq8iUo0RfWd7Fa3rqTNURddZoCH6AeLgcap1Qxvtl2pb1BSUb0ayV72LQ4OBNjvau17jPGE_cd9rUHUUW4ToR1pbY7yC6cY5OTGqDXhxiEvyen_3snlMts8PT5v1NgGRlTFpCiZyLJlpdC2wBp2rilUmr1BnRVajMAXPKsZBQa4h1ZVSAGWl0xTqQle1WJKrea8L0coANiK8gev78SWZspKNIsRIXc8UeBeCRyM_vO2U30nO5KRWcnlQO7K3Mzst2_v6H_71K__4FT-9PoRW</recordid><startdate>20050509</startdate><enddate>20050509</enddate><creator>Liu, Zejian</creator><creator>Zhang, Qi</creator><creator>Qin, Lu-Chang</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>20050509</creationdate><title>Accurate determination of atomic structure of multiwalled carbon nanotubes by nondestructive nanobeam electron diffraction</title><author>Liu, Zejian ; Zhang, Qi ; Qin, Lu-Chang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c347t-b6035e70fbd93e9cd5a808f58ed4649e3f614801cac5dc2d8aacc78d22c96d893</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>BRAGG REFLECTION</topic><topic>CARBON</topic><topic>CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY</topic><topic>DIFFRACTION GRATINGS</topic><topic>ELECTRON DIFFRACTION</topic><topic>NANOTUBES</topic><topic>NONDESTRUCTIVE TESTING</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Liu, Zejian</creatorcontrib><creatorcontrib>Zhang, Qi</creatorcontrib><creatorcontrib>Qin, Lu-Chang</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Liu, Zejian</au><au>Zhang, Qi</au><au>Qin, Lu-Chang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Accurate determination of atomic structure of multiwalled carbon nanotubes by nondestructive nanobeam electron diffraction</atitle><jtitle>Applied physics letters</jtitle><date>2005-05-09</date><risdate>2005</risdate><volume>86</volume><issue>19</issue><spage>191903</spage><epage>191903-3</epage><pages>191903-191903-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>We report a method that allows direct, systematic, and accurate determination of the atomic structure of multiwalled carbon nanotubes by analyzing the scattering intensities on the nonequatorial layer lines in the electron diffraction pattern. Complete structure determination of a quadruple-walled carbon nanotube is described as an example, and it was found that the intertubular distance varied from
0.36
nm
to
0.5
nm
with a mean value of
0.42
nm
.</abstract><cop>United States</cop><pub>American Institute of Physics</pub><doi>10.1063/1.1923170</doi><oa>free_for_read</oa></addata></record> |
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language | eng |
recordid | cdi_osti_scitechconnect_20702333 |
source | AIP Journals Complete; AIP Digital Archive |
subjects | BRAGG REFLECTION CARBON CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY DIFFRACTION GRATINGS ELECTRON DIFFRACTION NANOTUBES NONDESTRUCTIVE TESTING |
title | Accurate determination of atomic structure of multiwalled carbon nanotubes by nondestructive nanobeam electron diffraction |
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