X-ray resonance in crystal cavities : Realization of Fabry-Perot resonator for hard X rays
X-ray back diffraction from monolithic two silicon crystal plates of 25-150 microm thickness and a 40-150 microm gap using synchrotron radiation of energy resolution DeltaE = 0.36 meV at 14.4388 keV clearly show resonance fringes inside the energy gap and the total-reflection range for the (12 4 0)...
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| Veröffentlicht in: | Physical review letters 2005-05, Vol.94 (17), p.174801.1-174801.4, Article 174801 |
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| container_end_page | 174801.4 |
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| container_issue | 17 |
| container_start_page | 174801.1 |
| container_title | Physical review letters |
| container_volume | 94 |
| creator | CHANG, S.-L STETSKO, Yu. P TANG, M.-T LEE, Y.-R SUN, W.-H YABASHI, M ISHIKAWA, T |
| description | X-ray back diffraction from monolithic two silicon crystal plates of 25-150 microm thickness and a 40-150 microm gap using synchrotron radiation of energy resolution DeltaE = 0.36 meV at 14.4388 keV clearly show resonance fringes inside the energy gap and the total-reflection range for the (12 4 0) reflection. This cavity resonance results from the coherent interaction between the x-ray wave fields generated by the two plates with a gap smaller than the x-ray coherence length. This finding opens up new opportunities for high-resolution and phase-contrast x-ray studies, and may lead to new developments in x-ray optics. |
| doi_str_mv | 10.1103/PhysRevLett.94.174801 |
| format | Article |
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P</creatorcontrib><creatorcontrib>TANG, M.-T</creatorcontrib><creatorcontrib>LEE, Y.-R</creatorcontrib><creatorcontrib>SUN, W.-H</creatorcontrib><creatorcontrib>YABASHI, M</creatorcontrib><creatorcontrib>ISHIKAWA, T</creatorcontrib><title>X-ray resonance in crystal cavities : Realization of Fabry-Perot resonator for hard X rays</title><title>Physical review letters</title><addtitle>Phys Rev Lett</addtitle><description>X-ray back diffraction from monolithic two silicon crystal plates of 25-150 microm thickness and a 40-150 microm gap using synchrotron radiation of energy resolution DeltaE = 0.36 meV at 14.4388 keV clearly show resonance fringes inside the energy gap and the total-reflection range for the (12 4 0) reflection. This cavity resonance results from the coherent interaction between the x-ray wave fields generated by the two plates with a gap smaller than the x-ray coherence length. 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P</creatorcontrib><creatorcontrib>TANG, M.-T</creatorcontrib><creatorcontrib>LEE, Y.-R</creatorcontrib><creatorcontrib>SUN, W.-H</creatorcontrib><creatorcontrib>YABASHI, M</creatorcontrib><creatorcontrib>ISHIKAWA, T</creatorcontrib><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>OSTI.GOV</collection><jtitle>Physical review letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>CHANG, S.-L</au><au>STETSKO, Yu. P</au><au>TANG, M.-T</au><au>LEE, Y.-R</au><au>SUN, W.-H</au><au>YABASHI, M</au><au>ISHIKAWA, T</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>X-ray resonance in crystal cavities : Realization of Fabry-Perot resonator for hard X rays</atitle><jtitle>Physical review letters</jtitle><addtitle>Phys Rev Lett</addtitle><date>2005-05-06</date><risdate>2005</risdate><volume>94</volume><issue>17</issue><spage>174801.1</spage><epage>174801.4</epage><pages>174801.1-174801.4</pages><artnum>174801</artnum><issn>0031-9007</issn><eissn>1079-7114</eissn><coden>PRLTAO</coden><abstract>X-ray back diffraction from monolithic two silicon crystal plates of 25-150 microm thickness and a 40-150 microm gap using synchrotron radiation of energy resolution DeltaE = 0.36 meV at 14.4388 keV clearly show resonance fringes inside the energy gap and the total-reflection range for the (12 4 0) reflection. This cavity resonance results from the coherent interaction between the x-ray wave fields generated by the two plates with a gap smaller than the x-ray coherence length. This finding opens up new opportunities for high-resolution and phase-contrast x-ray studies, and may lead to new developments in x-ray optics.</abstract><cop>Ridge, NY</cop><pub>American Physical Society</pub><pmid>15904302</pmid><doi>10.1103/PhysRevLett.94.174801</doi><tpages>1</tpages></addata></record> |
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| ispartof | Physical review letters, 2005-05, Vol.94 (17), p.174801.1-174801.4, Article 174801 |
| issn | 0031-9007 1079-7114 |
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| source | American Physical Society Journals |
| subjects | COHERENCE LENGTH CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY CRYSTALS Electromagnetism electron and ion optics ENERGY GAP ENERGY RESOLUTION Exact sciences and technology Fundamental areas of phenomenology (including applications) HARD X RADIATION Instruments, apparatus, components and techniques common to several branches of physics and astronomy KEV RANGE 10-100 KEV RANGE 100-1000 OPTICS Physics PLATES REFLECTION RESONANCE RESONATORS SILICON SYNCHROTRON RADIATION THICKNESS X- and γ-ray instruments and techniques X-ray beams and x-ray optics X-RAY DIFFRACTION |
| title | X-ray resonance in crystal cavities : Realization of Fabry-Perot resonator for hard X rays |
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