Layer relaxation and intermixing in Fe/Cu(001) studied by surface x-ray diffraction
The structure of Fe films thermally deposited on Cu(001) was analyzed using surface x-ray diffraction in the coverage range between 6 and 8 monolayers. Based on the analysis of crystal truncation rod data measured at 120 and 300 K, i.e., below and above transition temperatures reported for ferro- an...
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Veröffentlicht in: | Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2005-01, Vol.71 (3), p.035409.1-035409.8, Article 035409 |
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Sprache: | eng |
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Zusammenfassung: | The structure of Fe films thermally deposited on Cu(001) was analyzed using surface x-ray diffraction in the coverage range between 6 and 8 monolayers. Based on the analysis of crystal truncation rod data measured at 120 and 300 K, i.e., below and above transition temperatures reported for ferro- and antiferromagnetic ordering, no changes of the interlayer spacings larger than about {+-}0.015 A are found. Within the Fe film these correspond to fcc Fe (1.78 A), while the top-layer spacing is expanded by 3-5 % in agreement with previous low-energy electron diffraction studies. Lateral disorder of surface atoms as described by the Debye parameter indicates displacements of the top-layer positions up to 0.23 A corresponding to zigzag displacements observed in the p2mg (2x1) superstructure. The inherent large penetration depth of the x rays also allowed the study of the structure and composition of the buried Fe/Cu interface. The data indicate Fe-Cu intermixing, where nearly 50% of a Fe (Cu) monolayer are exchanged. Four layers across the interface are significantly affected. About 30% of the first Fe (Cu) and up to 15% of the second Fe (Cu) layer is alloyed by Cu (Fe) |
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ISSN: | 1098-0121 1550-235X |
DOI: | 10.1103/PhysRevB.71.035409 |