Application of TOFD Technique to Thin Sections Using ESIT and PSCT

It is difficult to accurately size the defects that are oriented at an angle (that is not normal to the wave) using conventional amplitude based ultrasonic techniques. Since Time of Flight Diffraction (TOFD) is based on the diffraction of ultrasound at defect edges, defect sizing using this techniqu...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Baskaran, G., Krishnamurthy, C.V., Lakshmana Rao, C., Swamy, G., Balasubramaniam, K.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue 1
container_start_page
container_title
container_volume 760
creator Baskaran, G.
Krishnamurthy, C.V.
Lakshmana Rao, C.
Swamy, G.
Balasubramaniam, K.
description It is difficult to accurately size the defects that are oriented at an angle (that is not normal to the wave) using conventional amplitude based ultrasonic techniques. Since Time of Flight Diffraction (TOFD) is based on the diffraction of ultrasound at defect edges, defect sizing using this technique is amplitude independent. However, most of the TOFD based assessment relies on manual sizing, whose accuracy depends on quality of image and the operator's experience. Also, the utilization of TOFD for sections less than 15 mm has reportedly several difficulties. In this paper, we report our attempts to size the vertical and inclined defects using an in-house TOFD system built to inspect thin sections (6-10 mm). To improve sizing, automated defect sizing techniques termed Embedded Signal Identification Technique (ESIT) and Point Source Correlation Technique (PSCT) were developed. A ray tracing based model was also developed for a) optimizing the experimental parameters for thin sections, b) interpreting the received signals. Experiments were conducted on 10 mm thick samples with EDM defects and 6-7 mm welded maraging steel samples. The results obtained using manual and automated techniques were compared. Our comparisons lead us to believe that the automated defect sizing techniques can provide accurate and reliable results for thin sections.
doi_str_mv 10.1063/1.1916758
format Conference Proceeding
fullrecord <record><control><sourceid>osti</sourceid><recordid>TN_cdi_osti_scitechconnect_20655392</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>20655392</sourcerecordid><originalsourceid>FETCH-LOGICAL-c223t-62d7987912dd3cb0ff35f1506f48b590edd8032d775dd28cd7be5d45899b5a5a3</originalsourceid><addsrcrecordid>eNotjstKAzEUQIMoOFYX_kHA9dSbZG4ey1pbLRQqTAruykweNlIylYz_74iuzuZwOITcM5gzkOKRzZlhUqG-IBVDZLWSTF6SCsA0NW_E-zW5KeUTgBuldEWeFufzKbluTEOmQ6R2t36mNrhjTl_fgY4DtceUaRvcr1HovqT8QVftxtIue_rWLu0tuYrdqYS7f87Ifr2yy9d6u3vZLBfb2nEuxlpyr4xWhnHvheshRoGRIcjY6B4NBO81iElS6D3Xzqs-oG9QG9Njh52YkYe_7lDGdCgujdOmG3Ke3g4cJKIwXPwA1otIxw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Application of TOFD Technique to Thin Sections Using ESIT and PSCT</title><source>AIP Journals Complete</source><creator>Baskaran, G. ; Krishnamurthy, C.V. ; Lakshmana Rao, C. ; Swamy, G. ; Balasubramaniam, K.</creator><creatorcontrib>Baskaran, G. ; Krishnamurthy, C.V. ; Lakshmana Rao, C. ; Swamy, G. ; Balasubramaniam, K.</creatorcontrib><description>It is difficult to accurately size the defects that are oriented at an angle (that is not normal to the wave) using conventional amplitude based ultrasonic techniques. Since Time of Flight Diffraction (TOFD) is based on the diffraction of ultrasound at defect edges, defect sizing using this technique is amplitude independent. However, most of the TOFD based assessment relies on manual sizing, whose accuracy depends on quality of image and the operator's experience. Also, the utilization of TOFD for sections less than 15 mm has reportedly several difficulties. In this paper, we report our attempts to size the vertical and inclined defects using an in-house TOFD system built to inspect thin sections (6-10 mm). To improve sizing, automated defect sizing techniques termed Embedded Signal Identification Technique (ESIT) and Point Source Correlation Technique (PSCT) were developed. A ray tracing based model was also developed for a) optimizing the experimental parameters for thin sections, b) interpreting the received signals. Experiments were conducted on 10 mm thick samples with EDM defects and 6-7 mm welded maraging steel samples. The results obtained using manual and automated techniques were compared. Our comparisons lead us to believe that the automated defect sizing techniques can provide accurate and reliable results for thin sections.</description><identifier>ISSN: 0094-243X</identifier><identifier>EISSN: 1551-7616</identifier><identifier>DOI: 10.1063/1.1916758</identifier><language>eng</language><publisher>United States</publisher><subject>AMPLITUDES ; COMPARATIVE EVALUATIONS ; CORRELATIONS ; DEFECTS ; DETECTION ; DIFFRACTION ; ENGINEERING ; MARAGING STEELS ; POINT SOURCES ; SIGNALS ; TIME-OF-FLIGHT METHOD ; ULTRASONIC TESTING</subject><ispartof>AIP conference proceedings, 2005, Vol.760 (1)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c223t-62d7987912dd3cb0ff35f1506f48b590edd8032d775dd28cd7be5d45899b5a5a3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,776,780,881,27901,27902</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/20655392$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Baskaran, G.</creatorcontrib><creatorcontrib>Krishnamurthy, C.V.</creatorcontrib><creatorcontrib>Lakshmana Rao, C.</creatorcontrib><creatorcontrib>Swamy, G.</creatorcontrib><creatorcontrib>Balasubramaniam, K.</creatorcontrib><title>Application of TOFD Technique to Thin Sections Using ESIT and PSCT</title><title>AIP conference proceedings</title><description>It is difficult to accurately size the defects that are oriented at an angle (that is not normal to the wave) using conventional amplitude based ultrasonic techniques. Since Time of Flight Diffraction (TOFD) is based on the diffraction of ultrasound at defect edges, defect sizing using this technique is amplitude independent. However, most of the TOFD based assessment relies on manual sizing, whose accuracy depends on quality of image and the operator's experience. Also, the utilization of TOFD for sections less than 15 mm has reportedly several difficulties. In this paper, we report our attempts to size the vertical and inclined defects using an in-house TOFD system built to inspect thin sections (6-10 mm). To improve sizing, automated defect sizing techniques termed Embedded Signal Identification Technique (ESIT) and Point Source Correlation Technique (PSCT) were developed. A ray tracing based model was also developed for a) optimizing the experimental parameters for thin sections, b) interpreting the received signals. Experiments were conducted on 10 mm thick samples with EDM defects and 6-7 mm welded maraging steel samples. The results obtained using manual and automated techniques were compared. Our comparisons lead us to believe that the automated defect sizing techniques can provide accurate and reliable results for thin sections.</description><subject>AMPLITUDES</subject><subject>COMPARATIVE EVALUATIONS</subject><subject>CORRELATIONS</subject><subject>DEFECTS</subject><subject>DETECTION</subject><subject>DIFFRACTION</subject><subject>ENGINEERING</subject><subject>MARAGING STEELS</subject><subject>POINT SOURCES</subject><subject>SIGNALS</subject><subject>TIME-OF-FLIGHT METHOD</subject><subject>ULTRASONIC TESTING</subject><issn>0094-243X</issn><issn>1551-7616</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2005</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNotjstKAzEUQIMoOFYX_kHA9dSbZG4ey1pbLRQqTAruykweNlIylYz_74iuzuZwOITcM5gzkOKRzZlhUqG-IBVDZLWSTF6SCsA0NW_E-zW5KeUTgBuldEWeFufzKbluTEOmQ6R2t36mNrhjTl_fgY4DtceUaRvcr1HovqT8QVftxtIue_rWLu0tuYrdqYS7f87Ifr2yy9d6u3vZLBfb2nEuxlpyr4xWhnHvheshRoGRIcjY6B4NBO81iElS6D3Xzqs-oG9QG9Njh52YkYe_7lDGdCgujdOmG3Ke3g4cJKIwXPwA1otIxw</recordid><startdate>20050409</startdate><enddate>20050409</enddate><creator>Baskaran, G.</creator><creator>Krishnamurthy, C.V.</creator><creator>Lakshmana Rao, C.</creator><creator>Swamy, G.</creator><creator>Balasubramaniam, K.</creator><scope>OTOTI</scope></search><sort><creationdate>20050409</creationdate><title>Application of TOFD Technique to Thin Sections Using ESIT and PSCT</title><author>Baskaran, G. ; Krishnamurthy, C.V. ; Lakshmana Rao, C. ; Swamy, G. ; Balasubramaniam, K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c223t-62d7987912dd3cb0ff35f1506f48b590edd8032d775dd28cd7be5d45899b5a5a3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2005</creationdate><topic>AMPLITUDES</topic><topic>COMPARATIVE EVALUATIONS</topic><topic>CORRELATIONS</topic><topic>DEFECTS</topic><topic>DETECTION</topic><topic>DIFFRACTION</topic><topic>ENGINEERING</topic><topic>MARAGING STEELS</topic><topic>POINT SOURCES</topic><topic>SIGNALS</topic><topic>TIME-OF-FLIGHT METHOD</topic><topic>ULTRASONIC TESTING</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Baskaran, G.</creatorcontrib><creatorcontrib>Krishnamurthy, C.V.</creatorcontrib><creatorcontrib>Lakshmana Rao, C.</creatorcontrib><creatorcontrib>Swamy, G.</creatorcontrib><creatorcontrib>Balasubramaniam, K.</creatorcontrib><collection>OSTI.GOV</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Baskaran, G.</au><au>Krishnamurthy, C.V.</au><au>Lakshmana Rao, C.</au><au>Swamy, G.</au><au>Balasubramaniam, K.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Application of TOFD Technique to Thin Sections Using ESIT and PSCT</atitle><btitle>AIP conference proceedings</btitle><date>2005-04-09</date><risdate>2005</risdate><volume>760</volume><issue>1</issue><issn>0094-243X</issn><eissn>1551-7616</eissn><abstract>It is difficult to accurately size the defects that are oriented at an angle (that is not normal to the wave) using conventional amplitude based ultrasonic techniques. Since Time of Flight Diffraction (TOFD) is based on the diffraction of ultrasound at defect edges, defect sizing using this technique is amplitude independent. However, most of the TOFD based assessment relies on manual sizing, whose accuracy depends on quality of image and the operator's experience. Also, the utilization of TOFD for sections less than 15 mm has reportedly several difficulties. In this paper, we report our attempts to size the vertical and inclined defects using an in-house TOFD system built to inspect thin sections (6-10 mm). To improve sizing, automated defect sizing techniques termed Embedded Signal Identification Technique (ESIT) and Point Source Correlation Technique (PSCT) were developed. A ray tracing based model was also developed for a) optimizing the experimental parameters for thin sections, b) interpreting the received signals. Experiments were conducted on 10 mm thick samples with EDM defects and 6-7 mm welded maraging steel samples. The results obtained using manual and automated techniques were compared. Our comparisons lead us to believe that the automated defect sizing techniques can provide accurate and reliable results for thin sections.</abstract><cop>United States</cop><doi>10.1063/1.1916758</doi></addata></record>
fulltext fulltext
identifier ISSN: 0094-243X
ispartof AIP conference proceedings, 2005, Vol.760 (1)
issn 0094-243X
1551-7616
language eng
recordid cdi_osti_scitechconnect_20655392
source AIP Journals Complete
subjects AMPLITUDES
COMPARATIVE EVALUATIONS
CORRELATIONS
DEFECTS
DETECTION
DIFFRACTION
ENGINEERING
MARAGING STEELS
POINT SOURCES
SIGNALS
TIME-OF-FLIGHT METHOD
ULTRASONIC TESTING
title Application of TOFD Technique to Thin Sections Using ESIT and PSCT
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T15%3A37%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-osti&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Application%20of%20TOFD%20Technique%20to%20Thin%20Sections%20Using%20ESIT%20and%20PSCT&rft.btitle=AIP%20conference%20proceedings&rft.au=Baskaran,%20G.&rft.date=2005-04-09&rft.volume=760&rft.issue=1&rft.issn=0094-243X&rft.eissn=1551-7616&rft_id=info:doi/10.1063/1.1916758&rft_dat=%3Costi%3E20655392%3C/osti%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true