Dedicated High-Resolution Powder Diffraction Beamline at the Advanced Photon Source
A high-resolution x-ray powder diffraction beamline that exploits the high flux, high energy resolution, and precise energy tuning of the third-generation synchrotron source will be built at the Advanced Photon Source (APS). The goal is to establish a high-resolution high-throughput dedicated powder...
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| creator | Lee, Peter L Beno, Mark A Shu, Deming Ramanathan, Mohan Mitchell, John F Jorgensen, James D Von Dreele, Robert B |
| description | A high-resolution x-ray powder diffraction beamline that exploits the high flux, high energy resolution, and precise energy tuning of the third-generation synchrotron source will be built at the Advanced Photon Source (APS). The goal is to establish a high-resolution high-throughput dedicated powder instrument at the APS to serve the powder community. We describe design of the instrument that is able to measure a complete high-resolution powder pattern in one hour or less, uses automation to optimize throughput, has the ability to readily tune over a wide range of x-ray energies quickly and easily covering important absorption edges for resonant data measurements, and has the ability to accommodate various environmental devices for high-temperature, low-temperature or time-resolved data collection. |
| doi_str_mv | 10.1063/1.1757815 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_20652961</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>29180497</sourcerecordid><originalsourceid>FETCH-LOGICAL-o214t-30f1ee6aba6a957776feb5758349c8a2f18cfe95beb92061ac615530cd16032a3</originalsourceid><addsrcrecordid>eNotUFtLwzAYDV7AbfrgPygIvnXmS5qkeZybOmHgcAq-lTT9aiNdo02qf9_ifDpwbnAOIZdA50Alv4E5KKFyEEdkAkJAqiTIYzKliouMQk7ZCZlQqrOUZfztjExD-KCUaaXyCdmtsHLWRKyStXtv0mcMvh2i812y9T8V9snK1XVv7B91i2bfug4TE5PYYLKovk1nx-y28XHUd37oLZ6T09q0AS_-cUZe7-9elut08_TwuFxsUs8giymnNSBKUxpptFBKyRpLoUTOM21zw2rIbY1alFhqRiUYK8d5nNoKJOXM8Bm5OvT6EF0RrItoG-u7Dm0sxoRgWsLouj64Pnv_NWCIxd4Fi21rOvRDKJgeL8q04r-Mq1_o</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype><pqid>29180497</pqid></control><display><type>conference_proceeding</type><title>Dedicated High-Resolution Powder Diffraction Beamline at the Advanced Photon Source</title><source>AIP Journals Complete</source><creator>Lee, Peter L ; Beno, Mark A ; Shu, Deming ; Ramanathan, Mohan ; Mitchell, John F ; Jorgensen, James D ; Von Dreele, Robert B</creator><creatorcontrib>Lee, Peter L ; Beno, Mark A ; Shu, Deming ; Ramanathan, Mohan ; Mitchell, John F ; Jorgensen, James D ; Von Dreele, Robert B</creatorcontrib><description>A high-resolution x-ray powder diffraction beamline that exploits the high flux, high energy resolution, and precise energy tuning of the third-generation synchrotron source will be built at the Advanced Photon Source (APS). The goal is to establish a high-resolution high-throughput dedicated powder instrument at the APS to serve the powder community. We describe design of the instrument that is able to measure a complete high-resolution powder pattern in one hour or less, uses automation to optimize throughput, has the ability to readily tune over a wide range of x-ray energies quickly and easily covering important absorption edges for resonant data measurements, and has the ability to accommodate various environmental devices for high-temperature, low-temperature or time-resolved data collection.</description><identifier>ISSN: 0094-243X</identifier><identifier>ISBN: 0735401802</identifier><identifier>ISBN: 9780735401808</identifier><identifier>EISSN: 1551-7616</identifier><identifier>DOI: 10.1063/1.1757815</identifier><language>eng</language><publisher>United States</publisher><subject>ABSORPTION ; ADVANCED PHOTON SOURCE ; AUTOMATION ; BEAM OPTICS ; DATA ACQUISITION ; DESIGN ; DIFFRACTOMETERS ; ENERGY RESOLUTION ; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY ; SYNCHROTRON RADIATION ; TIME RESOLUTION ; TUNING ; X RADIATION ; X-RAY DIFFRACTION</subject><ispartof>AIP conference proceedings, 2004, Vol.705 (1), p.388-391</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,776,780,881,27901,27902</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/20652961$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Lee, Peter L</creatorcontrib><creatorcontrib>Beno, Mark A</creatorcontrib><creatorcontrib>Shu, Deming</creatorcontrib><creatorcontrib>Ramanathan, Mohan</creatorcontrib><creatorcontrib>Mitchell, John F</creatorcontrib><creatorcontrib>Jorgensen, James D</creatorcontrib><creatorcontrib>Von Dreele, Robert B</creatorcontrib><title>Dedicated High-Resolution Powder Diffraction Beamline at the Advanced Photon Source</title><title>AIP conference proceedings</title><description>A high-resolution x-ray powder diffraction beamline that exploits the high flux, high energy resolution, and precise energy tuning of the third-generation synchrotron source will be built at the Advanced Photon Source (APS). The goal is to establish a high-resolution high-throughput dedicated powder instrument at the APS to serve the powder community. We describe design of the instrument that is able to measure a complete high-resolution powder pattern in one hour or less, uses automation to optimize throughput, has the ability to readily tune over a wide range of x-ray energies quickly and easily covering important absorption edges for resonant data measurements, and has the ability to accommodate various environmental devices for high-temperature, low-temperature or time-resolved data collection.</description><subject>ABSORPTION</subject><subject>ADVANCED PHOTON SOURCE</subject><subject>AUTOMATION</subject><subject>BEAM OPTICS</subject><subject>DATA ACQUISITION</subject><subject>DESIGN</subject><subject>DIFFRACTOMETERS</subject><subject>ENERGY RESOLUTION</subject><subject>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</subject><subject>SYNCHROTRON RADIATION</subject><subject>TIME RESOLUTION</subject><subject>TUNING</subject><subject>X RADIATION</subject><subject>X-RAY DIFFRACTION</subject><issn>0094-243X</issn><issn>1551-7616</issn><isbn>0735401802</isbn><isbn>9780735401808</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2004</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNotUFtLwzAYDV7AbfrgPygIvnXmS5qkeZybOmHgcAq-lTT9aiNdo02qf9_ifDpwbnAOIZdA50Alv4E5KKFyEEdkAkJAqiTIYzKliouMQk7ZCZlQqrOUZfztjExD-KCUaaXyCdmtsHLWRKyStXtv0mcMvh2i812y9T8V9snK1XVv7B91i2bfug4TE5PYYLKovk1nx-y28XHUd37oLZ6T09q0AS_-cUZe7-9elut08_TwuFxsUs8giymnNSBKUxpptFBKyRpLoUTOM21zw2rIbY1alFhqRiUYK8d5nNoKJOXM8Bm5OvT6EF0RrItoG-u7Dm0sxoRgWsLouj64Pnv_NWCIxd4Fi21rOvRDKJgeL8q04r-Mq1_o</recordid><startdate>20040512</startdate><enddate>20040512</enddate><creator>Lee, Peter L</creator><creator>Beno, Mark A</creator><creator>Shu, Deming</creator><creator>Ramanathan, Mohan</creator><creator>Mitchell, John F</creator><creator>Jorgensen, James D</creator><creator>Von Dreele, Robert B</creator><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>OTOTI</scope></search><sort><creationdate>20040512</creationdate><title>Dedicated High-Resolution Powder Diffraction Beamline at the Advanced Photon Source</title><author>Lee, Peter L ; Beno, Mark A ; Shu, Deming ; Ramanathan, Mohan ; Mitchell, John F ; Jorgensen, James D ; Von Dreele, Robert B</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-o214t-30f1ee6aba6a957776feb5758349c8a2f18cfe95beb92061ac615530cd16032a3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2004</creationdate><topic>ABSORPTION</topic><topic>ADVANCED PHOTON SOURCE</topic><topic>AUTOMATION</topic><topic>BEAM OPTICS</topic><topic>DATA ACQUISITION</topic><topic>DESIGN</topic><topic>DIFFRACTOMETERS</topic><topic>ENERGY RESOLUTION</topic><topic>INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY</topic><topic>SYNCHROTRON RADIATION</topic><topic>TIME RESOLUTION</topic><topic>TUNING</topic><topic>X RADIATION</topic><topic>X-RAY DIFFRACTION</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lee, Peter L</creatorcontrib><creatorcontrib>Beno, Mark A</creatorcontrib><creatorcontrib>Shu, Deming</creatorcontrib><creatorcontrib>Ramanathan, Mohan</creatorcontrib><creatorcontrib>Mitchell, John F</creatorcontrib><creatorcontrib>Jorgensen, James D</creatorcontrib><creatorcontrib>Von Dreele, Robert B</creatorcontrib><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lee, Peter L</au><au>Beno, Mark A</au><au>Shu, Deming</au><au>Ramanathan, Mohan</au><au>Mitchell, John F</au><au>Jorgensen, James D</au><au>Von Dreele, Robert B</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Dedicated High-Resolution Powder Diffraction Beamline at the Advanced Photon Source</atitle><btitle>AIP conference proceedings</btitle><date>2004-05-12</date><risdate>2004</risdate><volume>705</volume><issue>1</issue><spage>388</spage><epage>391</epage><pages>388-391</pages><issn>0094-243X</issn><eissn>1551-7616</eissn><isbn>0735401802</isbn><isbn>9780735401808</isbn><abstract>A high-resolution x-ray powder diffraction beamline that exploits the high flux, high energy resolution, and precise energy tuning of the third-generation synchrotron source will be built at the Advanced Photon Source (APS). The goal is to establish a high-resolution high-throughput dedicated powder instrument at the APS to serve the powder community. We describe design of the instrument that is able to measure a complete high-resolution powder pattern in one hour or less, uses automation to optimize throughput, has the ability to readily tune over a wide range of x-ray energies quickly and easily covering important absorption edges for resonant data measurements, and has the ability to accommodate various environmental devices for high-temperature, low-temperature or time-resolved data collection.</abstract><cop>United States</cop><doi>10.1063/1.1757815</doi><tpages>4</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0094-243X |
| ispartof | AIP conference proceedings, 2004, Vol.705 (1), p.388-391 |
| issn | 0094-243X 1551-7616 |
| language | eng |
| recordid | cdi_osti_scitechconnect_20652961 |
| source | AIP Journals Complete |
| subjects | ABSORPTION ADVANCED PHOTON SOURCE AUTOMATION BEAM OPTICS DATA ACQUISITION DESIGN DIFFRACTOMETERS ENERGY RESOLUTION INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY SYNCHROTRON RADIATION TIME RESOLUTION TUNING X RADIATION X-RAY DIFFRACTION |
| title | Dedicated High-Resolution Powder Diffraction Beamline at the Advanced Photon Source |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-06T00%3A22%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Dedicated%20High-Resolution%20Powder%20Diffraction%20Beamline%20at%20the%20Advanced%20Photon%20Source&rft.btitle=AIP%20conference%20proceedings&rft.au=Lee,%20Peter%20L&rft.date=2004-05-12&rft.volume=705&rft.issue=1&rft.spage=388&rft.epage=391&rft.pages=388-391&rft.issn=0094-243X&rft.eissn=1551-7616&rft.isbn=0735401802&rft.isbn_list=9780735401808&rft_id=info:doi/10.1063/1.1757815&rft_dat=%3Cproquest_osti_%3E29180497%3C/proquest_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=29180497&rft_id=info:pmid/&rfr_iscdi=true |