Surface trace element characterization of synthetic single crystal Al2O3 at the SSRL

Detailed surface trace impurity element analyses (Ti, Cr, Fe, Co, Ni, Cu, and Zn) have been performed on synthetic sapphire grown by the HEMTM technique. Both bulk and surface measurements, yielding information on the spatial distribution of the elements are needed as part of our effort to obtain co...

Ausführliche Beschreibung