Microdosimetry code simulation of charge-deposition spectra, single-event upsets and multiple-bit upsets

An ion microdosimetry extension to the Monte Carlo High Energy Transport Code (HETC) has been developed to allow tracking of all the reaction products and has been applied to model charge-deposition spectra in pin diodes caused by atmospheric neutron spectra, as well as upsets in DRAMs from ground a...

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Veröffentlicht in:	IEEE transactions on nuclear science 1999-12, Vol.46 (6), p.1486-1493
Hauptverfasser:	Dyer, C.S., Comber, C., Truscott, P.R., Sanderson, C., Underwood, C., Oldfield, M., Campbell, A., Buchner, S., Meehan, T.
Format:	Artikel
Sprache:	eng
Schlagworte:	Aerospace electronics Computer simulation Energy (nuclear) ENERGY LOSSES FAILURES INSTRUMENTATION JUNCTION DIODES Laboratories MICRODOSIMETRY MONTE CARLO METHOD Monte Carlo methods Neutron spectra Neutrons PHYSICAL RADIATION EFFECTS PIN diodes PROTONS Radiation effects Random access memory Reaction products SEMICONDUCTOR STORAGE DEVICES Single event upset Space charge Space technology Spectra Testing Tracking
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