Flash electropolishing of BCC Fe and Fe-based alloys

The preparation of transmission electron microscopy (TEM) samples is a critical step in the characterization of materials, and the focused ion beam (FIB) technique is a commonly used method. However, a significant limitation of this technique is the FIB-induced damages on the foil surfaces, which ca...

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Veröffentlicht in:	Journal of nuclear materials 2023-08, Vol.586
Hauptverfasser:	Li, Yao, Song, Miao, Zhu, Pengcheng, Lin, Yan-Ru, Qi, Zehui, Zhao, Yajie, Levine, Samara, Zinkle, Steven J.
Format:	Artikel
Sprache:	eng
Schlagworte:	electrochemistry FIB induced damages flash electropolishing flash polishing ion irradiation MATERIALS SCIENCE TEM
Online-Zugang:	Volltext
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