Flash electropolishing of BCC Fe and Fe-based alloys

The preparation of transmission electron microscopy (TEM) samples is a critical step in the characterization of materials, and the focused ion beam (FIB) technique is a commonly used method. However, a significant limitation of this technique is the FIB-induced damages on the foil surfaces, which ca...

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Veröffentlicht in:Journal of nuclear materials 2023-08, Vol.586
Hauptverfasser: Li, Yao, Song, Miao, Zhu, Pengcheng, Lin, Yan-Ru, Qi, Zehui, Zhao, Yajie, Levine, Samara, Zinkle, Steven J.
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container_title Journal of nuclear materials
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creator Li, Yao
Song, Miao
Zhu, Pengcheng
Lin, Yan-Ru
Qi, Zehui
Zhao, Yajie
Levine, Samara
Zinkle, Steven J.
description The preparation of transmission electron microscopy (TEM) samples is a critical step in the characterization of materials, and the focused ion beam (FIB) technique is a commonly used method. However, a significant limitation of this technique is the FIB-induced damages on the foil surfaces, which can obscure the real features of interest, particularly in radiation effects studies. To overcome this limitation, this study presents a detailed description of the flash electropolishing technique, which can be used to remove the FIB damage from samples. The flash electropolishing technique has been successfully applied to a range of materials, including Fe, Fe-based model alloys, commercial Fe-Cr alloys, and advanced Fe-Cr alloys, both in their as-received and ion-irradiated states. Furthermore, the parameters used for Fe-Cr model alloys can be adjusted for commercial and advanced alloys with minimal modifications. Further, the study also examined the effects of electropolishing variables, such as perchloric acid concentration, electropolishing temperature, Cr concentration, and voltage. Qualitatively, a general trend and scoping test strategy is explored in our experiments. Overall, the flash electropolishing technique offers a promising solution to the challenges posed by FIB-induced damages in the preparation of TEM samples.
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subjects electrochemistry
FIB induced damages
flash electropolishing
flash polishing
ion irradiation
MATERIALS SCIENCE
TEM
title Flash electropolishing of BCC Fe and Fe-based alloys
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