Multimodal Characterization of Crystal Structure and Formation in Rubrene Thin Films Reveals Erasure of Orientational Discontinuities

Multimodal multiscale characterization provide opportunities to study organic semiconducting thin films with multiple length scales, across multiple platforms, to elucidate crystallization mechanisms of the various microstructures that impact functionality. With polarized scanning transmission X‐ray...

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Veröffentlicht in:	Advanced functional materials 2023-03, Vol.33 (13), p.n/a
Hauptverfasser:	Tan, Jenna A., Dull, Jordan T., Zeltmann, Steven E., Tulyagankhodjaev, Jakhangirkhodja A., Johnson, Holly M., Liebman‐Peláez, Alex, Folie, Brendan D., Dönges, Sven A., Khatib, Omar, Raybin, Jonathan G., Roberts, Trevor D., Hamerlynck, Leo M., Tanner, Christian P. N., Lee, Jina, Ophus, Colin, Bustillo, Karen C., Raschke, Markus B., Ohldag, Hendrik, Minor, Andrew M., Rand, Barry P., Ginsberg, Naomi S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Crystal structure Crystallization Discontinuity Dynamic structural analysis Hybrid structures Materials science Microscopy microstructures Morphology multiscale/multimodal imaging Optical microscopy Scanning transmission electron microscopy Temperature dependence Thin films
Online-Zugang:	Volltext
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