A Prony-Based Curve-Fitting Method for Characterization of RF Pulses From Optoelectronic Devices

There has been a boost in optoelectronic device technology that can leverage strengths of both optical and electronic worlds to support high-voltage and high-speed operation. It is critical to characterize the RF performance from the measured signals of these devices in order to evaluate their perfo...

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Veröffentlicht in:	IEEE signal processing letters 2022, Vol.29, p.364-368
Hauptverfasser:	Mukherjee, Saptarshi, Dowling, Karen, Dong, Yicong, Li, Kexin, Conway, Adam, Rakheja, Shaloo, Voss, Lars
Format:	Artikel
Sprache:	eng
Schlagworte:	Algorithms Curve fitting Fitting Gaussian distribution optoele- ctronic devices Optoelectronic devices Performance evaluation Physics Prony method Pulse measurements Radio frequency RF signals Semiconductor device measurement signal analysis Time measurement
Online-Zugang:	Volltext
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