Terahertz-Driven Stark Spectroscopy of CdSe and CdSe–CdS Core–Shell Quantum Dots

The effects of large external fields on semiconductor nanostructures could reveal much about field-induced shifting of electronic states and their dynamical responses and could enable electro-optic device applications that require large and rapid changes in optical properties. Studies of quasi-dc el...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Nano letters 2019-11, Vol.19 (11), p.8125-8131
Hauptverfasser: Pein, Brandt C, Lee, Chee Kong, Shi, Liang, Shi, JiaoJian, Chang, Wendi, Hwang, Harold Y, Scherer, Jennifer, Coropceanu, Igor, Zhao, Xiaoguang, Zhang, Xin, Bulović, Vladimir, Bawendi, Moungi G, Willard, Adam P, Nelson, Keith A
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The effects of large external fields on semiconductor nanostructures could reveal much about field-induced shifting of electronic states and their dynamical responses and could enable electro-optic device applications that require large and rapid changes in optical properties. Studies of quasi-dc electric field modulation of quantum dot (QD) properties have been limited by electrostatic breakdown processes observed under high externally applied field levels. To circumvent this, here we apply ultrafast terahertz (THz) electric fields with switching times on the order of 1 ps. We show that a pulsed THz electric field, enhanced by a microslit field enhancement structure (FES), can strongly manipulate the optical absorption properties of a thin film of CdSe and CdSe–CdS core–shell QDs on the subpicosecond time scale with spectral shifts that span the visible to near-IR range. Numerical simulations using a semiempirical tight binding model show that the band gap of the QD film can be shifted by as much a 79 meV during these time scales. The results allow a basic understanding of the field-induced shifting of electronic levels and suggest electro-optic device applications.
ISSN:1530-6984
1530-6992
DOI:10.1021/acs.nanolett.9b03342