Investigation of the orientation relationship between nano-sized G-phase precipitates and austenite with scanning nano-beam electron diffraction using a pixelated detector

[Display omitted] Scanning nano-beam electron diffraction with a pixelated detector was employed to investigate the orientation relationship of nanometer sized, irradiation induced G-phase (M6Ni16Si7) precipitates in an austenite matrix. Using this detector, the faint diffraction spots originating f...

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Veröffentlicht in:Scripta materialia 2021-08, Vol.201 (C), p.113930, Article 113930
Hauptverfasser: Cautaerts, Niels, Rauch, Edgar F., Jeong, Jiwon, Dehm, Gerhard, Liebscher, Christian H.
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Sprache:eng
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