Electron-beam introduction of heteroatomic Pt–Si structures in graphene

Electron-beam (e-beam) manipulation of single dopant atoms in an aberration-corrected scanning transmission electron microscope is emerging as a method for directed atomic motion and atom-by-atom assembly. Until now, the dopant species have been limited to atoms closely matched to carbon in terms of...

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Veröffentlicht in:Carbon (New York) 2020-01, Vol.161 (None)
Hauptverfasser: Dyck, Ondrej, Zhang, Cheng, Rack, Philip D., Fowlkes, Jason Davidson, Sumpter, Bobby, Lupini, Andrew, Kalinin, Sergei V., Jesse, Stephen
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container_start_page
container_title Carbon (New York)
container_volume 161
creator Dyck, Ondrej
Zhang, Cheng
Rack, Philip D.
Fowlkes, Jason Davidson
Sumpter, Bobby
Lupini, Andrew
Kalinin, Sergei V.
Jesse, Stephen
description Electron-beam (e-beam) manipulation of single dopant atoms in an aberration-corrected scanning transmission electron microscope is emerging as a method for directed atomic motion and atom-by-atom assembly. Until now, the dopant species have been limited to atoms closely matched to carbon in terms of ionic radius and capable of strong covalent bonding with carbon atoms in the graphene lattice. In situ dopant insertion into a graphene lattice has thus far been demonstrated only for Si, which is ubiquitously present as a contaminant in this material. Here, we achieve in situ manipulation of Pt atoms and their insertion into the graphene host matrix using the e-beam deposited Pt on graphene as a host system. Additionally, we further demonstrate a mechanism for stabilization of the Pt atom, enabled through the formation of Si-stabilized Pt heteroatomic clusters attached to the graphene surface. This study provides evidence toward the universality of the e-beam assembly approach, opening a pathway for exploring cluster chemistry through direct assembly.
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source Access via ScienceDirect (Elsevier)
subjects atomic manipulation
Dopant cluster assembly
dopant insertion
graphene
MATERIALS SCIENCE
scanning transmission electron microscopy
title Electron-beam introduction of heteroatomic Pt–Si structures in graphene
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