Local atomic structure and Ni nanophase segregation in Zn1-xNixS thin films

Here, the local atomic structure of Zn1-xNixS thin films was investigated using X-ray absorption spectroscopy. The films were grown using RF-sputtering at atomic concentrations x = 0.00, x = 0.04, x = 0.08 and x = 0.14. X-ray diffraction shows that the lattice parameter contracts with increasing Ni...

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Veröffentlicht in:	Journal of alloys and compounds 2020-09, Vol.854
Hauptverfasser:	Colina-Ruiz, Roberto A., Hoy-Benítez, Juan A., Lezama-Pacheco, Juan S., Mustre de León, José, Espinosa-Faller, Francisco J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Crystal structure EXAFS MATERIALS SCIENCE Thin films XANES Zn1-xNixS
Online-Zugang:	Volltext
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