Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon
Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use...
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| Veröffentlicht in: | Journal of instrumentation 2020-01, Vol.15 (1), p.P01019-P01019 |
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| creator | Nakarmi, P. Ostrovskiy, I. Soma, A.K. Retière, F. Kharusi, S. Al Alfaris, M. Anton, G. Arnquist, I.J. Badhrees, I. Barbeau, P.S. Beck, D. Belov, V. Bhatta, T. Blatchford, J. Breur, P.A. Brodsky, J.P. Brown, E. Brunner, T. Mamahit, S. Byrne Caden, E. Cao, G.F. Cao, L. Chambers, C. Chana, B. Charlebois, S.A. Chiu, M. Cleveland, B. Coon, M. Craycraft, A. Dalmasson, J. Daniels, T. Darroch, L. Croix, A. De St Mesrobian-Kabakian, A. Der DeVoe, R. Vacri, M.L. Di Dilling, J. Ding, Y.Y. Dolinski, M.J. Doria, L. Dragone, A. Echevers, J. Edaltafar, F. Elbeltagi, M. Fabris, L. Fairbank, D. Fairbank, W. Farine, J. Ferrara, S. Feyzbakhsh, S. Fontaine, R. Fucarino, A. Gallina, G. Gautam, P. Giacomini, G. Goeldi, D. Gornea, R. Gratta, G. Hansen, E.V. Heffner, M. Hoppe, E.W. Hößl, J. House, A. Hughes, M. Iverson, A. Jamil, A. Jewell, M.J. Jiang, X.S. Karelin, A. Kaufman, L.J. Koffas, T. Krücken, R. Kuchenkov, A. Kumar, K.S. Lan, Y. Larson, A. Leach, K.G. Lenardo, B.G. Leonard, D.S. Li, G. Li, S. Li, Z. Licciardi, C. Lv, P. MacLellan, R. Massacret, N. McElroy, T. Medina-Peregrina, M. Michel, T. Mong, B. Moore, D.C. Murray, K. Natzke, C.R. Newby, R.J. Ning, Z. Njoya, O. Nolet, F. Nusair, O. Odgers, K. Odian, A. |
| description | Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE . Little information is currently available about reflectivity and PDE in liquid noble gases, because such measurements are difficult to conduct in a cryogenic environment and at short enough wavelengths. Here we report a measurement of specular reflectivity and relative PDE of Hamamatsu VUV4 silicon photomultipliers (SiPMs) with 50 μm micro-cells conducted with xenon scintillation light (∼175 nm) in liquid xenon. The specular reflectivity at 15ˆ incidence of three samples of VUV4 SiPMs is found to be 30.4±1.4%, 28.6±1.3%, and 28.0±1.3%, respectively. The PDE at normal incidence differs by ±8% (standard deviation) among the three devices. The angular dependence of the reflectivity and PDE was also measured for one of the SiPMs. Both the reflectivity and PDE decrease as the angle of incidence increases. This is the first measurement of an angular dependence of PDE and reflectivity of a SiPM in liquid xenon. |
| doi_str_mv | 10.1088/1748-0221/15/01/P01019 |
| format | Article |
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Al ; Alfaris, M. ; Anton, G. ; Arnquist, I.J. ; Badhrees, I. ; Barbeau, P.S. ; Beck, D. ; Belov, V. ; Bhatta, T. ; Blatchford, J. ; Breur, P.A. ; Brodsky, J.P. ; Brown, E. ; Brunner, T. ; Mamahit, S. Byrne ; Caden, E. ; Cao, G.F. ; Cao, L. ; Chambers, C. ; Chana, B. ; Charlebois, S.A. ; Chiu, M. ; Cleveland, B. ; Coon, M. ; Craycraft, A. ; Dalmasson, J. ; Daniels, T. ; Darroch, L. ; Croix, A. De St ; Mesrobian-Kabakian, A. Der ; DeVoe, R. ; Vacri, M.L. Di ; Dilling, J. ; Ding, Y.Y. ; Dolinski, M.J. ; Doria, L. ; Dragone, A. ; Echevers, J. ; Edaltafar, F. ; Elbeltagi, M. ; Fabris, L. ; Fairbank, D. ; Fairbank, W. ; Farine, J. ; Ferrara, S. ; Feyzbakhsh, S. ; Fontaine, R. ; Fucarino, A. ; Gallina, G. ; Gautam, P. ; Giacomini, G. ; Goeldi, D. ; Gornea, R. ; Gratta, G. ; Hansen, E.V. ; Heffner, M. ; Hoppe, E.W. ; Hößl, J. ; House, A. ; Hughes, M. ; Iverson, A. ; Jamil, A. ; Jewell, M.J. ; Jiang, X.S. ; Karelin, A. ; Kaufman, L.J. ; Koffas, T. ; Krücken, R. ; Kuchenkov, A. ; Kumar, K.S. ; Lan, Y. ; Larson, A. ; Leach, K.G. ; Lenardo, B.G. ; Leonard, D.S. ; Li, G. ; Li, S. ; Li, Z. ; Licciardi, C. ; Lv, P. ; MacLellan, R. ; Massacret, N. ; McElroy, T. ; Medina-Peregrina, M. ; Michel, T. ; Mong, B. ; Moore, D.C. ; Murray, K. ; Natzke, C.R. ; Newby, R.J. ; Ning, Z. ; Njoya, O. ; Nolet, F. ; Nusair, O. ; Odgers, K. ; Odian, A.</creator><creatorcontrib>Nakarmi, P. ; Ostrovskiy, I. ; Soma, A.K. ; Retière, F. ; Kharusi, S. Al ; Alfaris, M. ; Anton, G. ; Arnquist, I.J. ; Badhrees, I. ; Barbeau, P.S. ; Beck, D. ; Belov, V. ; Bhatta, T. ; Blatchford, J. ; Breur, P.A. ; Brodsky, J.P. ; Brown, E. ; Brunner, T. ; Mamahit, S. Byrne ; Caden, E. ; Cao, G.F. ; Cao, L. ; Chambers, C. ; Chana, B. ; Charlebois, S.A. ; Chiu, M. ; Cleveland, B. ; Coon, M. ; Craycraft, A. ; Dalmasson, J. ; Daniels, T. ; Darroch, L. ; Croix, A. De St ; Mesrobian-Kabakian, A. Der ; DeVoe, R. ; Vacri, M.L. Di ; Dilling, J. ; Ding, Y.Y. ; Dolinski, M.J. ; Doria, L. ; Dragone, A. ; Echevers, J. ; Edaltafar, F. ; Elbeltagi, M. ; Fabris, L. ; Fairbank, D. ; Fairbank, W. ; Farine, J. ; Ferrara, S. ; Feyzbakhsh, S. ; Fontaine, R. ; Fucarino, A. ; Gallina, G. ; Gautam, P. ; Giacomini, G. ; Goeldi, D. ; Gornea, R. ; Gratta, G. ; Hansen, E.V. ; Heffner, M. ; Hoppe, E.W. ; Hößl, J. ; House, A. ; Hughes, M. ; Iverson, A. ; Jamil, A. ; Jewell, M.J. ; Jiang, X.S. ; Karelin, A. ; Kaufman, L.J. ; Koffas, T. ; Krücken, R. ; Kuchenkov, A. ; Kumar, K.S. ; Lan, Y. ; Larson, A. ; Leach, K.G. ; Lenardo, B.G. ; Leonard, D.S. ; Li, G. ; Li, S. ; Li, Z. ; Licciardi, C. ; Lv, P. ; MacLellan, R. ; Massacret, N. ; McElroy, T. ; Medina-Peregrina, M. ; Michel, T. ; Mong, B. ; Moore, D.C. ; Murray, K. ; Natzke, C.R. ; Newby, R.J. ; Ning, Z. ; Njoya, O. ; Nolet, F. ; Nusair, O. ; Odgers, K. ; Odian, A. ; Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States) ; SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States) ; Univ. of Alabama, Tuscaloosa, AL (United States) ; Brookhaven National Laboratory (BNL), Upton, NY (United States) ; Stanford Univ., CA (United States)</creatorcontrib><description>Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE . Little information is currently available about reflectivity and PDE in liquid noble gases, because such measurements are difficult to conduct in a cryogenic environment and at short enough wavelengths. Here we report a measurement of specular reflectivity and relative PDE of Hamamatsu VUV4 silicon photomultipliers (SiPMs) with 50 μm micro-cells conducted with xenon scintillation light (∼175 nm) in liquid xenon. The specular reflectivity at 15ˆ incidence of three samples of VUV4 SiPMs is found to be 30.4±1.4%, 28.6±1.3%, and 28.0±1.3%, respectively. The PDE at normal incidence differs by ±8% (standard deviation) among the three devices. The angular dependence of the reflectivity and PDE was also measured for one of the SiPMs. Both the reflectivity and PDE decrease as the angle of incidence increases. This is the first measurement of an angular dependence of PDE and reflectivity of a SiPM in liquid xenon.</description><identifier>ISSN: 1748-0221</identifier><identifier>EISSN: 1748-0221</identifier><identifier>DOI: 10.1088/1748-0221/15/01/P01019</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Beta decay ; Dark matter ; Dependence ; Energy resolution ; engineering ; Incidence angle ; instrumentation related to nuclear science and technology ; Liquefied gases ; Material properties ; Neutrino-less double beta decay ; Neutrinos ; noble liquid detectors ; nuclear physics ; NUCLEAR PHYSICS AND RADIATION PHYSICS ; OTHER INSTRUMENTATION ; Photomultiplier tubes ; photon detectors ; radiation physics ; Rare gases ; Reflectance ; scintillation ; Silicon Photomultipliers ; SiPMs ; Xenon</subject><ispartof>Journal of instrumentation, 2020-01, Vol.15 (1), p.P01019-P01019</ispartof><rights>Copyright IOP Publishing Jan 2020</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c411t-669906b3e12eda3d91429b9a4ce0f62197c79644cde168dafc197307dc713c673</citedby><cites>FETCH-LOGICAL-c411t-669906b3e12eda3d91429b9a4ce0f62197c79644cde168dafc197307dc713c673</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttps://www.osti.gov/servlets/purl/1617159$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Nakarmi, P.</creatorcontrib><creatorcontrib>Ostrovskiy, I.</creatorcontrib><creatorcontrib>Soma, A.K.</creatorcontrib><creatorcontrib>Retière, F.</creatorcontrib><creatorcontrib>Kharusi, S. Al</creatorcontrib><creatorcontrib>Alfaris, M.</creatorcontrib><creatorcontrib>Anton, G.</creatorcontrib><creatorcontrib>Arnquist, I.J.</creatorcontrib><creatorcontrib>Badhrees, I.</creatorcontrib><creatorcontrib>Barbeau, P.S.</creatorcontrib><creatorcontrib>Beck, D.</creatorcontrib><creatorcontrib>Belov, V.</creatorcontrib><creatorcontrib>Bhatta, T.</creatorcontrib><creatorcontrib>Blatchford, J.</creatorcontrib><creatorcontrib>Breur, P.A.</creatorcontrib><creatorcontrib>Brodsky, J.P.</creatorcontrib><creatorcontrib>Brown, E.</creatorcontrib><creatorcontrib>Brunner, T.</creatorcontrib><creatorcontrib>Mamahit, S. Byrne</creatorcontrib><creatorcontrib>Caden, E.</creatorcontrib><creatorcontrib>Cao, G.F.</creatorcontrib><creatorcontrib>Cao, L.</creatorcontrib><creatorcontrib>Chambers, C.</creatorcontrib><creatorcontrib>Chana, B.</creatorcontrib><creatorcontrib>Charlebois, S.A.</creatorcontrib><creatorcontrib>Chiu, M.</creatorcontrib><creatorcontrib>Cleveland, B.</creatorcontrib><creatorcontrib>Coon, M.</creatorcontrib><creatorcontrib>Craycraft, A.</creatorcontrib><creatorcontrib>Dalmasson, J.</creatorcontrib><creatorcontrib>Daniels, T.</creatorcontrib><creatorcontrib>Darroch, L.</creatorcontrib><creatorcontrib>Croix, A. De St</creatorcontrib><creatorcontrib>Mesrobian-Kabakian, A. Der</creatorcontrib><creatorcontrib>DeVoe, R.</creatorcontrib><creatorcontrib>Vacri, M.L. Di</creatorcontrib><creatorcontrib>Dilling, J.</creatorcontrib><creatorcontrib>Ding, Y.Y.</creatorcontrib><creatorcontrib>Dolinski, M.J.</creatorcontrib><creatorcontrib>Doria, L.</creatorcontrib><creatorcontrib>Dragone, A.</creatorcontrib><creatorcontrib>Echevers, J.</creatorcontrib><creatorcontrib>Edaltafar, F.</creatorcontrib><creatorcontrib>Elbeltagi, M.</creatorcontrib><creatorcontrib>Fabris, L.</creatorcontrib><creatorcontrib>Fairbank, D.</creatorcontrib><creatorcontrib>Fairbank, W.</creatorcontrib><creatorcontrib>Farine, J.</creatorcontrib><creatorcontrib>Ferrara, S.</creatorcontrib><creatorcontrib>Feyzbakhsh, S.</creatorcontrib><creatorcontrib>Fontaine, R.</creatorcontrib><creatorcontrib>Fucarino, A.</creatorcontrib><creatorcontrib>Gallina, G.</creatorcontrib><creatorcontrib>Gautam, P.</creatorcontrib><creatorcontrib>Giacomini, G.</creatorcontrib><creatorcontrib>Goeldi, D.</creatorcontrib><creatorcontrib>Gornea, R.</creatorcontrib><creatorcontrib>Gratta, G.</creatorcontrib><creatorcontrib>Hansen, E.V.</creatorcontrib><creatorcontrib>Heffner, M.</creatorcontrib><creatorcontrib>Hoppe, E.W.</creatorcontrib><creatorcontrib>Hößl, J.</creatorcontrib><creatorcontrib>House, A.</creatorcontrib><creatorcontrib>Hughes, M.</creatorcontrib><creatorcontrib>Iverson, A.</creatorcontrib><creatorcontrib>Jamil, A.</creatorcontrib><creatorcontrib>Jewell, M.J.</creatorcontrib><creatorcontrib>Jiang, X.S.</creatorcontrib><creatorcontrib>Karelin, A.</creatorcontrib><creatorcontrib>Kaufman, L.J.</creatorcontrib><creatorcontrib>Koffas, T.</creatorcontrib><creatorcontrib>Krücken, R.</creatorcontrib><creatorcontrib>Kuchenkov, A.</creatorcontrib><creatorcontrib>Kumar, K.S.</creatorcontrib><creatorcontrib>Lan, Y.</creatorcontrib><creatorcontrib>Larson, A.</creatorcontrib><creatorcontrib>Leach, K.G.</creatorcontrib><creatorcontrib>Lenardo, B.G.</creatorcontrib><creatorcontrib>Leonard, D.S.</creatorcontrib><creatorcontrib>Li, G.</creatorcontrib><creatorcontrib>Li, S.</creatorcontrib><creatorcontrib>Li, Z.</creatorcontrib><creatorcontrib>Licciardi, C.</creatorcontrib><creatorcontrib>Lv, P.</creatorcontrib><creatorcontrib>MacLellan, R.</creatorcontrib><creatorcontrib>Massacret, N.</creatorcontrib><creatorcontrib>McElroy, T.</creatorcontrib><creatorcontrib>Medina-Peregrina, M.</creatorcontrib><creatorcontrib>Michel, T.</creatorcontrib><creatorcontrib>Mong, B.</creatorcontrib><creatorcontrib>Moore, D.C.</creatorcontrib><creatorcontrib>Murray, K.</creatorcontrib><creatorcontrib>Natzke, C.R.</creatorcontrib><creatorcontrib>Newby, R.J.</creatorcontrib><creatorcontrib>Ning, Z.</creatorcontrib><creatorcontrib>Njoya, O.</creatorcontrib><creatorcontrib>Nolet, F.</creatorcontrib><creatorcontrib>Nusair, O.</creatorcontrib><creatorcontrib>Odgers, K.</creatorcontrib><creatorcontrib>Odian, A.</creatorcontrib><creatorcontrib>Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)</creatorcontrib><creatorcontrib>SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)</creatorcontrib><creatorcontrib>Univ. of Alabama, Tuscaloosa, AL (United States)</creatorcontrib><creatorcontrib>Brookhaven National Laboratory (BNL), Upton, NY (United States)</creatorcontrib><creatorcontrib>Stanford Univ., CA (United States)</creatorcontrib><title>Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon</title><title>Journal of instrumentation</title><description>Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE . Little information is currently available about reflectivity and PDE in liquid noble gases, because such measurements are difficult to conduct in a cryogenic environment and at short enough wavelengths. Here we report a measurement of specular reflectivity and relative PDE of Hamamatsu VUV4 silicon photomultipliers (SiPMs) with 50 μm micro-cells conducted with xenon scintillation light (∼175 nm) in liquid xenon. The specular reflectivity at 15ˆ incidence of three samples of VUV4 SiPMs is found to be 30.4±1.4%, 28.6±1.3%, and 28.0±1.3%, respectively. The PDE at normal incidence differs by ±8% (standard deviation) among the three devices. The angular dependence of the reflectivity and PDE was also measured for one of the SiPMs. Both the reflectivity and PDE decrease as the angle of incidence increases. This is the first measurement of an angular dependence of PDE and reflectivity of a SiPM in liquid xenon.</description><subject>Beta decay</subject><subject>Dark matter</subject><subject>Dependence</subject><subject>Energy resolution</subject><subject>engineering</subject><subject>Incidence angle</subject><subject>instrumentation related to nuclear science and technology</subject><subject>Liquefied gases</subject><subject>Material properties</subject><subject>Neutrino-less double beta decay</subject><subject>Neutrinos</subject><subject>noble liquid detectors</subject><subject>nuclear physics</subject><subject>NUCLEAR PHYSICS AND RADIATION PHYSICS</subject><subject>OTHER INSTRUMENTATION</subject><subject>Photomultiplier tubes</subject><subject>photon detectors</subject><subject>radiation physics</subject><subject>Rare gases</subject><subject>Reflectance</subject><subject>scintillation</subject><subject>Silicon Photomultipliers</subject><subject>SiPMs</subject><subject>Xenon</subject><issn>1748-0221</issn><issn>1748-0221</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNpNkFFLwzAQx4MoOKdfQYI-1-aaNGnAF9HphIlD3V5DlqaYsTVbk4r79rZURO7hjrsfx58fQpdAboAURQqCFQnJMkghTwmkcwIE5BEa_R2O_82n6CyENSG5zBkZods3W22sie7LxQPWdYnnDxPsK7xcLBme6m1XMbT43c1fAnY13rh960r8bWtfn6OTSm-CvfjtY7R4nHzcT5PZ69Pz_d0sMQwgJpxLSfiKWshsqWkpgWVyJTUzllQ8AymMkJwxU1rgRakr060oEaURQA0XdIyuhr8-RKeCcdGaT-PruguugIOAXHbQ9QDtGr9vbYhq7dum7nKpjOaC005KT_GBMo0PobGV2jVuq5uDAqJ6nao3pXpTCnJFQA066Q_cXGT1</recordid><startdate>20200117</startdate><enddate>20200117</enddate><creator>Nakarmi, P.</creator><creator>Ostrovskiy, I.</creator><creator>Soma, A.K.</creator><creator>Retière, F.</creator><creator>Kharusi, S. 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Al ; Alfaris, M. ; Anton, G. ; Arnquist, I.J. ; Badhrees, I. ; Barbeau, P.S. ; Beck, D. ; Belov, V. ; Bhatta, T. ; Blatchford, J. ; Breur, P.A. ; Brodsky, J.P. ; Brown, E. ; Brunner, T. ; Mamahit, S. Byrne ; Caden, E. ; Cao, G.F. ; Cao, L. ; Chambers, C. ; Chana, B. ; Charlebois, S.A. ; Chiu, M. ; Cleveland, B. ; Coon, M. ; Craycraft, A. ; Dalmasson, J. ; Daniels, T. ; Darroch, L. ; Croix, A. De St ; Mesrobian-Kabakian, A. Der ; DeVoe, R. ; Vacri, M.L. Di ; Dilling, J. ; Ding, Y.Y. ; Dolinski, M.J. ; Doria, L. ; Dragone, A. ; Echevers, J. ; Edaltafar, F. ; Elbeltagi, M. ; Fabris, L. ; Fairbank, D. ; Fairbank, W. ; Farine, J. ; Ferrara, S. ; Feyzbakhsh, S. ; Fontaine, R. ; Fucarino, A. ; Gallina, G. ; Gautam, P. ; Giacomini, G. ; Goeldi, D. ; Gornea, R. ; Gratta, G. ; Hansen, E.V. ; Heffner, M. ; Hoppe, E.W. ; Hößl, J. ; House, A. ; Hughes, M. ; Iverson, A. ; Jamil, A. ; Jewell, M.J. ; Jiang, X.S. ; Karelin, A. ; Kaufman, L.J. ; Koffas, T. ; Krücken, R. ; Kuchenkov, A. ; Kumar, K.S. ; Lan, Y. ; Larson, A. ; Leach, K.G. ; Lenardo, B.G. ; Leonard, D.S. ; Li, G. ; Li, S. ; Li, Z. ; Licciardi, C. ; Lv, P. ; MacLellan, R. ; Massacret, N. ; McElroy, T. ; Medina-Peregrina, M. ; Michel, T. ; Mong, B. ; Moore, D.C. ; Murray, K. ; Natzke, C.R. ; Newby, R.J. ; Ning, Z. ; Njoya, O. ; Nolet, F. ; Nusair, O. ; Odgers, K. ; Odian, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c411t-669906b3e12eda3d91429b9a4ce0f62197c79644cde168dafc197307dc713c673</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Beta decay</topic><topic>Dark matter</topic><topic>Dependence</topic><topic>Energy resolution</topic><topic>engineering</topic><topic>Incidence angle</topic><topic>instrumentation related to nuclear science and technology</topic><topic>Liquefied gases</topic><topic>Material properties</topic><topic>Neutrino-less double beta decay</topic><topic>Neutrinos</topic><topic>noble liquid detectors</topic><topic>nuclear physics</topic><topic>NUCLEAR PHYSICS AND RADIATION PHYSICS</topic><topic>OTHER INSTRUMENTATION</topic><topic>Photomultiplier tubes</topic><topic>photon detectors</topic><topic>radiation physics</topic><topic>Rare gases</topic><topic>Reflectance</topic><topic>scintillation</topic><topic>Silicon Photomultipliers</topic><topic>SiPMs</topic><topic>Xenon</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Nakarmi, P.</creatorcontrib><creatorcontrib>Ostrovskiy, I.</creatorcontrib><creatorcontrib>Soma, A.K.</creatorcontrib><creatorcontrib>Retière, F.</creatorcontrib><creatorcontrib>Kharusi, S. Al</creatorcontrib><creatorcontrib>Alfaris, M.</creatorcontrib><creatorcontrib>Anton, G.</creatorcontrib><creatorcontrib>Arnquist, I.J.</creatorcontrib><creatorcontrib>Badhrees, I.</creatorcontrib><creatorcontrib>Barbeau, P.S.</creatorcontrib><creatorcontrib>Beck, D.</creatorcontrib><creatorcontrib>Belov, V.</creatorcontrib><creatorcontrib>Bhatta, T.</creatorcontrib><creatorcontrib>Blatchford, J.</creatorcontrib><creatorcontrib>Breur, P.A.</creatorcontrib><creatorcontrib>Brodsky, J.P.</creatorcontrib><creatorcontrib>Brown, E.</creatorcontrib><creatorcontrib>Brunner, T.</creatorcontrib><creatorcontrib>Mamahit, S. Byrne</creatorcontrib><creatorcontrib>Caden, E.</creatorcontrib><creatorcontrib>Cao, G.F.</creatorcontrib><creatorcontrib>Cao, L.</creatorcontrib><creatorcontrib>Chambers, C.</creatorcontrib><creatorcontrib>Chana, B.</creatorcontrib><creatorcontrib>Charlebois, S.A.</creatorcontrib><creatorcontrib>Chiu, M.</creatorcontrib><creatorcontrib>Cleveland, B.</creatorcontrib><creatorcontrib>Coon, M.</creatorcontrib><creatorcontrib>Craycraft, A.</creatorcontrib><creatorcontrib>Dalmasson, J.</creatorcontrib><creatorcontrib>Daniels, T.</creatorcontrib><creatorcontrib>Darroch, L.</creatorcontrib><creatorcontrib>Croix, A. De St</creatorcontrib><creatorcontrib>Mesrobian-Kabakian, A. Der</creatorcontrib><creatorcontrib>DeVoe, R.</creatorcontrib><creatorcontrib>Vacri, M.L. Di</creatorcontrib><creatorcontrib>Dilling, J.</creatorcontrib><creatorcontrib>Ding, Y.Y.</creatorcontrib><creatorcontrib>Dolinski, M.J.</creatorcontrib><creatorcontrib>Doria, L.</creatorcontrib><creatorcontrib>Dragone, A.</creatorcontrib><creatorcontrib>Echevers, J.</creatorcontrib><creatorcontrib>Edaltafar, F.</creatorcontrib><creatorcontrib>Elbeltagi, M.</creatorcontrib><creatorcontrib>Fabris, L.</creatorcontrib><creatorcontrib>Fairbank, D.</creatorcontrib><creatorcontrib>Fairbank, W.</creatorcontrib><creatorcontrib>Farine, J.</creatorcontrib><creatorcontrib>Ferrara, S.</creatorcontrib><creatorcontrib>Feyzbakhsh, S.</creatorcontrib><creatorcontrib>Fontaine, R.</creatorcontrib><creatorcontrib>Fucarino, A.</creatorcontrib><creatorcontrib>Gallina, G.</creatorcontrib><creatorcontrib>Gautam, P.</creatorcontrib><creatorcontrib>Giacomini, G.</creatorcontrib><creatorcontrib>Goeldi, D.</creatorcontrib><creatorcontrib>Gornea, R.</creatorcontrib><creatorcontrib>Gratta, G.</creatorcontrib><creatorcontrib>Hansen, E.V.</creatorcontrib><creatorcontrib>Heffner, M.</creatorcontrib><creatorcontrib>Hoppe, E.W.</creatorcontrib><creatorcontrib>Hößl, J.</creatorcontrib><creatorcontrib>House, A.</creatorcontrib><creatorcontrib>Hughes, M.</creatorcontrib><creatorcontrib>Iverson, A.</creatorcontrib><creatorcontrib>Jamil, A.</creatorcontrib><creatorcontrib>Jewell, M.J.</creatorcontrib><creatorcontrib>Jiang, X.S.</creatorcontrib><creatorcontrib>Karelin, A.</creatorcontrib><creatorcontrib>Kaufman, L.J.</creatorcontrib><creatorcontrib>Koffas, T.</creatorcontrib><creatorcontrib>Krücken, R.</creatorcontrib><creatorcontrib>Kuchenkov, A.</creatorcontrib><creatorcontrib>Kumar, K.S.</creatorcontrib><creatorcontrib>Lan, Y.</creatorcontrib><creatorcontrib>Larson, A.</creatorcontrib><creatorcontrib>Leach, K.G.</creatorcontrib><creatorcontrib>Lenardo, B.G.</creatorcontrib><creatorcontrib>Leonard, D.S.</creatorcontrib><creatorcontrib>Li, G.</creatorcontrib><creatorcontrib>Li, S.</creatorcontrib><creatorcontrib>Li, Z.</creatorcontrib><creatorcontrib>Licciardi, C.</creatorcontrib><creatorcontrib>Lv, P.</creatorcontrib><creatorcontrib>MacLellan, R.</creatorcontrib><creatorcontrib>Massacret, N.</creatorcontrib><creatorcontrib>McElroy, T.</creatorcontrib><creatorcontrib>Medina-Peregrina, M.</creatorcontrib><creatorcontrib>Michel, T.</creatorcontrib><creatorcontrib>Mong, B.</creatorcontrib><creatorcontrib>Moore, D.C.</creatorcontrib><creatorcontrib>Murray, K.</creatorcontrib><creatorcontrib>Natzke, C.R.</creatorcontrib><creatorcontrib>Newby, R.J.</creatorcontrib><creatorcontrib>Ning, Z.</creatorcontrib><creatorcontrib>Njoya, O.</creatorcontrib><creatorcontrib>Nolet, F.</creatorcontrib><creatorcontrib>Nusair, O.</creatorcontrib><creatorcontrib>Odgers, K.</creatorcontrib><creatorcontrib>Odian, A.</creatorcontrib><creatorcontrib>Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)</creatorcontrib><creatorcontrib>SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)</creatorcontrib><creatorcontrib>Univ. of Alabama, Tuscaloosa, AL (United States)</creatorcontrib><creatorcontrib>Brookhaven National Laboratory (BNL), Upton, NY (United States)</creatorcontrib><creatorcontrib>Stanford Univ., CA (United States)</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV - Hybrid</collection><collection>OSTI.GOV</collection><jtitle>Journal of instrumentation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Nakarmi, P.</au><au>Ostrovskiy, I.</au><au>Soma, A.K.</au><au>Retière, F.</au><au>Kharusi, S. Al</au><au>Alfaris, M.</au><au>Anton, G.</au><au>Arnquist, I.J.</au><au>Badhrees, I.</au><au>Barbeau, P.S.</au><au>Beck, D.</au><au>Belov, V.</au><au>Bhatta, T.</au><au>Blatchford, J.</au><au>Breur, P.A.</au><au>Brodsky, J.P.</au><au>Brown, E.</au><au>Brunner, T.</au><au>Mamahit, S. Byrne</au><au>Caden, E.</au><au>Cao, G.F.</au><au>Cao, L.</au><au>Chambers, C.</au><au>Chana, B.</au><au>Charlebois, S.A.</au><au>Chiu, M.</au><au>Cleveland, B.</au><au>Coon, M.</au><au>Craycraft, A.</au><au>Dalmasson, J.</au><au>Daniels, T.</au><au>Darroch, L.</au><au>Croix, A. De St</au><au>Mesrobian-Kabakian, A. Der</au><au>DeVoe, R.</au><au>Vacri, M.L. Di</au><au>Dilling, J.</au><au>Ding, Y.Y.</au><au>Dolinski, M.J.</au><au>Doria, L.</au><au>Dragone, A.</au><au>Echevers, J.</au><au>Edaltafar, F.</au><au>Elbeltagi, M.</au><au>Fabris, L.</au><au>Fairbank, D.</au><au>Fairbank, W.</au><au>Farine, J.</au><au>Ferrara, S.</au><au>Feyzbakhsh, S.</au><au>Fontaine, R.</au><au>Fucarino, A.</au><au>Gallina, G.</au><au>Gautam, P.</au><au>Giacomini, G.</au><au>Goeldi, D.</au><au>Gornea, R.</au><au>Gratta, G.</au><au>Hansen, E.V.</au><au>Heffner, M.</au><au>Hoppe, E.W.</au><au>Hößl, J.</au><au>House, A.</au><au>Hughes, M.</au><au>Iverson, A.</au><au>Jamil, A.</au><au>Jewell, M.J.</au><au>Jiang, X.S.</au><au>Karelin, A.</au><au>Kaufman, L.J.</au><au>Koffas, T.</au><au>Krücken, R.</au><au>Kuchenkov, A.</au><au>Kumar, K.S.</au><au>Lan, Y.</au><au>Larson, A.</au><au>Leach, K.G.</au><au>Lenardo, B.G.</au><au>Leonard, D.S.</au><au>Li, G.</au><au>Li, S.</au><au>Li, Z.</au><au>Licciardi, C.</au><au>Lv, P.</au><au>MacLellan, R.</au><au>Massacret, N.</au><au>McElroy, T.</au><au>Medina-Peregrina, M.</au><au>Michel, T.</au><au>Mong, B.</au><au>Moore, D.C.</au><au>Murray, K.</au><au>Natzke, C.R.</au><au>Newby, R.J.</au><au>Ning, Z.</au><au>Njoya, O.</au><au>Nolet, F.</au><au>Nusair, O.</au><au>Odgers, K.</au><au>Odian, A.</au><aucorp>Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)</aucorp><aucorp>SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)</aucorp><aucorp>Univ. of Alabama, Tuscaloosa, AL (United States)</aucorp><aucorp>Brookhaven National Laboratory (BNL), Upton, NY (United States)</aucorp><aucorp>Stanford Univ., CA (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon</atitle><jtitle>Journal of instrumentation</jtitle><date>2020-01-17</date><risdate>2020</risdate><volume>15</volume><issue>1</issue><spage>P01019</spage><epage>P01019</epage><pages>P01019-P01019</pages><issn>1748-0221</issn><eissn>1748-0221</eissn><abstract>Understanding reflective properties of materials and photodetection efficiency (PDE) of photodetectors is important for optimizing energy resolution and sensitivity of the next generation neutrinoless double beta decay, direct detection dark matter, and neutrino oscillation experiments that will use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE . Little information is currently available about reflectivity and PDE in liquid noble gases, because such measurements are difficult to conduct in a cryogenic environment and at short enough wavelengths. Here we report a measurement of specular reflectivity and relative PDE of Hamamatsu VUV4 silicon photomultipliers (SiPMs) with 50 μm micro-cells conducted with xenon scintillation light (∼175 nm) in liquid xenon. The specular reflectivity at 15ˆ incidence of three samples of VUV4 SiPMs is found to be 30.4±1.4%, 28.6±1.3%, and 28.0±1.3%, respectively. The PDE at normal incidence differs by ±8% (standard deviation) among the three devices. The angular dependence of the reflectivity and PDE was also measured for one of the SiPMs. Both the reflectivity and PDE decrease as the angle of incidence increases. This is the first measurement of an angular dependence of PDE and reflectivity of a SiPM in liquid xenon.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/1748-0221/15/01/P01019</doi><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1748-0221 |
| ispartof | Journal of instrumentation, 2020-01, Vol.15 (1), p.P01019-P01019 |
| issn | 1748-0221 1748-0221 |
| language | eng |
| recordid | cdi_osti_scitechconnect_1617159 |
| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Beta decay Dark matter Dependence Energy resolution engineering Incidence angle instrumentation related to nuclear science and technology Liquefied gases Material properties Neutrino-less double beta decay Neutrinos noble liquid detectors nuclear physics NUCLEAR PHYSICS AND RADIATION PHYSICS OTHER INSTRUMENTATION Photomultiplier tubes photon detectors radiation physics Rare gases Reflectance scintillation Silicon Photomultipliers SiPMs Xenon |
| title | Reflectivity and PDE of VUV4 Hamamatsu SiPMs in liquid xenon |
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