Atomic electron tomography in three and four dimensions
Atomic electron tomography (AET) has become a powerful tool for atomic-scale structural characterization in three and four dimensions. It provides the ability to correlate structures and properties of materials at the single-atom level. With recent advances in data acquisition methods, iterative thr...
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| Veröffentlicht in: | MRS bulletin 2020-04, Vol.45 (4), p.290-297 |
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| creator | Zhou, Jihan Yang, Yongsoo Ercius, Peter Miao, Jianwei |
| description | Atomic electron tomography (AET) has become a powerful tool for atomic-scale structural characterization in three and four dimensions. It provides the ability to correlate structures and properties of materials at the single-atom level. With recent advances in data acquisition methods, iterative three-dimensional (3D) reconstruction algorithms, and post-processing methods, AET can now determine 3D atomic coordinates and chemical species with sub-Angstrom precision, and reveal their atomic-scale time evolution during dynamical processes. Here, we review the recent experimental and algorithmic developments of AET and highlight several groundbreaking experiments, which include pinpointing the 3D atom positions and chemical order/disorder in technologically relevant materials and capturing how atoms rearrange during early nucleation at four-dimensional atomic resolution. |
| doi_str_mv | 10.1557/mrs.2020.88 |
| format | Article |
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(LBNL), Berkeley, CA (United States)</creatorcontrib><title>Atomic electron tomography in three and four dimensions</title><title>MRS bulletin</title><addtitle>MRS Bulletin</addtitle><description>Atomic electron tomography (AET) has become a powerful tool for atomic-scale structural characterization in three and four dimensions. It provides the ability to correlate structures and properties of materials at the single-atom level. With recent advances in data acquisition methods, iterative three-dimensional (3D) reconstruction algorithms, and post-processing methods, AET can now determine 3D atomic coordinates and chemical species with sub-Angstrom precision, and reveal their atomic-scale time evolution during dynamical processes. Here, we review the recent experimental and algorithmic developments of AET and highlight several groundbreaking experiments, which include pinpointing the 3D atom positions and chemical order/disorder in technologically relevant materials and capturing how atoms rearrange during early nucleation at four-dimensional atomic resolution.</description><subject>4D atomic resolution</subject><subject>Accuracy</subject><subject>Algorithms</subject><subject>Applied and Technical Physics</subject><subject>atomic electron tomography (AET)</subject><subject>Characterization and Evaluation of Materials</subject><subject>Classification</subject><subject>Crystal defects</subject><subject>Data acquisition</subject><subject>Energy Materials</subject><subject>Grain boundaries</subject><subject>Image reconstruction</subject><subject>Material properties</subject><subject>Materials Engineering</subject><subject>Materials Science</subject><subject>Methods</subject><subject>Nanomaterials</subject><subject>Nanoparticles</subject><subject>Nanoscale Tomography Using X-rays and Electrons</subject><subject>Nanotechnology</subject><subject>Noise</subject><subject>Nucleation</subject><subject>Point defects</subject><subject>Post-processing</subject><subject>scanning transmission electron microscopy (STEM)</subject><subject>Structural analysis</subject><subject>Tomography</subject><subject>tranmission electron microscopy (TEM)</subject><subject>Transmission electron microscopy</subject><issn>0883-7694</issn><issn>1938-1425</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNp9kMtKAzEARYMoOFZX_sCgS52ax-S1LKU-oOBG12Emk3RSOklNpov-vSkjuBFXlwuHy-UAcIvgHFHKn4aY5hhiOBfiDBRIElGhGtNzUEAhSMWZrC_BVUpbCBGFnBaAL8YwOF2andFjDL7MNWxis--Ppcutj8aUje9KGw6x7NxgfHLBp2twYZtdMjc_OQOfz6uP5Wu1fn95Wy7WlSYSjlXd6ca2VOKOwppYWhsLGWyt5bQVmrTIYEqJIK2tibBSN4yYDvGOYt4izC2ZgbtpN6TRqaTdaHSvg_f5rkIMMSlghu4naB_D18GkUW3zW59_KSwJymoY-58iglPBmCCZepgoHUNK0Vi1j25o4lEhqE6SVZasTpJVVjoDjxOdMuU3Jv5u_oV_A2lFfJ0</recordid><startdate>20200401</startdate><enddate>20200401</enddate><creator>Zhou, Jihan</creator><creator>Yang, Yongsoo</creator><creator>Ercius, Peter</creator><creator>Miao, Jianwei</creator><general>Springer International Publishing</general><general>Springer Nature B.V</general><general>Materials Research Society</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7TA</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>S0W</scope><scope>OTOTI</scope></search><sort><creationdate>20200401</creationdate><title>Atomic electron tomography in three and four dimensions</title><author>Zhou, Jihan ; Yang, Yongsoo ; Ercius, Peter ; Miao, Jianwei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c390t-4dcafb592d5043f54ef060bff75b8c3b1e255383bf438f9ca63ed17d527b127f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>4D atomic resolution</topic><topic>Accuracy</topic><topic>Algorithms</topic><topic>Applied and Technical Physics</topic><topic>atomic electron tomography (AET)</topic><topic>Characterization and Evaluation of Materials</topic><topic>Classification</topic><topic>Crystal defects</topic><topic>Data acquisition</topic><topic>Energy Materials</topic><topic>Grain boundaries</topic><topic>Image reconstruction</topic><topic>Material properties</topic><topic>Materials Engineering</topic><topic>Materials Science</topic><topic>Methods</topic><topic>Nanomaterials</topic><topic>Nanoparticles</topic><topic>Nanoscale Tomography Using X-rays and Electrons</topic><topic>Nanotechnology</topic><topic>Noise</topic><topic>Nucleation</topic><topic>Point defects</topic><topic>Post-processing</topic><topic>scanning transmission electron microscopy (STEM)</topic><topic>Structural analysis</topic><topic>Tomography</topic><topic>tranmission electron microscopy (TEM)</topic><topic>Transmission electron microscopy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhou, Jihan</creatorcontrib><creatorcontrib>Yang, Yongsoo</creatorcontrib><creatorcontrib>Ercius, Peter</creatorcontrib><creatorcontrib>Miao, Jianwei</creatorcontrib><creatorcontrib>Lawrence Berkeley National Lab. 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(LBNL), Berkeley, CA (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Atomic electron tomography in three and four dimensions</atitle><jtitle>MRS bulletin</jtitle><stitle>MRS Bulletin</stitle><date>2020-04-01</date><risdate>2020</risdate><volume>45</volume><issue>4</issue><spage>290</spage><epage>297</epage><pages>290-297</pages><issn>0883-7694</issn><eissn>1938-1425</eissn><abstract>Atomic electron tomography (AET) has become a powerful tool for atomic-scale structural characterization in three and four dimensions. It provides the ability to correlate structures and properties of materials at the single-atom level. With recent advances in data acquisition methods, iterative three-dimensional (3D) reconstruction algorithms, and post-processing methods, AET can now determine 3D atomic coordinates and chemical species with sub-Angstrom precision, and reveal their atomic-scale time evolution during dynamical processes. 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| subjects | 4D atomic resolution Accuracy Algorithms Applied and Technical Physics atomic electron tomography (AET) Characterization and Evaluation of Materials Classification Crystal defects Data acquisition Energy Materials Grain boundaries Image reconstruction Material properties Materials Engineering Materials Science Methods Nanomaterials Nanoparticles Nanoscale Tomography Using X-rays and Electrons Nanotechnology Noise Nucleation Point defects Post-processing scanning transmission electron microscopy (STEM) Structural analysis Tomography tranmission electron microscopy (TEM) Transmission electron microscopy |
| title | Atomic electron tomography in three and four dimensions |
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