Argon metastable and resonant level densities in Ar and Ar/Cl2 discharges used for the processing of bulk niobium

A comparative analysis of two popular spectroscopy techniques is conducted in a coaxial cylindrical capacitively coupled discharge designed for the plasma processing of superconducting radio frequency (SRF) cavities. The density of the metastable and resonant levels in Ar is measured in both Ar and...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of applied physics 2019-09, Vol.126 (10)
Hauptverfasser: Peshl, Jeremy, McNeill, Roderick, Sukenik, Charles I., Nikolić, Milka, Popović, Svetozar, Vŭsković, Leposava
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue 10
container_start_page
container_title Journal of applied physics
container_volume 126
creator Peshl, Jeremy
McNeill, Roderick
Sukenik, Charles I.
Nikolić, Milka
Popović, Svetozar
Vŭsković, Leposava
description A comparative analysis of two popular spectroscopy techniques is conducted in a coaxial cylindrical capacitively coupled discharge designed for the plasma processing of superconducting radio frequency (SRF) cavities. The density of the metastable and resonant levels in Ar is measured in both Ar and Ar/Cl 2 discharges to properly characterize the unique discharge system and aid in the development of a cavity etching routine. The first method, deemed the “branching fraction method,” utilizes the sensitivity of photon reabsorption of radiative decay to measure the lower state (metastable and resonant) densities by taking ratios of spectral lines with a common upper level. This method has been gaining popularity as it does not require any a priori knowledge about the electron energy distribution. The second method is a tunable diode laser absorption spectroscopy technique that measures the thermal Doppler broadening of spectral lines, from which the neutral gas temperature and lower state density of the transition can be evaluated. The two methods were conducted in tandem, while external parameters that were empirically determined to be important to the etching mechanism of SRF cavities are varied. Relationships between the excited state densities and the external parameters are presented for both spectroscopy methods and conclusions about the effects of these parameters on the discharge are stated when appropriate.
doi_str_mv 10.1063/1.5115043
format Article
fullrecord <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_1612167</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2287143848</sourcerecordid><originalsourceid>FETCH-LOGICAL-c3043-b2885acfda1fa3d98d7fe101dde9d19256e74eafec8e5674caa540a8fdc1203d3</originalsourceid><addsrcrecordid>eNqd0E1LAzEQBuAgCtbqwX8Q9KSwNrPZj-yxFL9A8KLnkCaTNnWb1CQr-O9dreDd0xzmYeblJeQc2A2whs_gpgaoWcUPyASY6Iq2rtkhmTBWQiG6tjsmJyltGAMQvJuQ93lcBU-3mFXKatkjVd7QiCl45TPt8QN7atAnlx0m6jydxx8yj7NFX1Ljkl6ruBp3Q0JDbYg0r5HuYtCYkvMrGixdDv0b9S4s3bA9JUdW9QnPfueUvN7dviweiqfn-8fF_KnQfIxfLEshaqWtUWAVN50wrUVgYAx2BrqybrCtUFnUAuumrbRSdcWUsEZDybjhU3KxvxtSdjJpl1GvdfAedZbQQAlNO6LLPRrzvg-YstyEIfoxlyxL0ULFRSVGdbVXOoaUIlq5i26r4qcEJr9rlyB_ax_t9d5-f1TZBf8__BHiH5Q7Y_kXipeQ7w</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2287143848</pqid></control><display><type>article</type><title>Argon metastable and resonant level densities in Ar and Ar/Cl2 discharges used for the processing of bulk niobium</title><source>AIP Journals Complete</source><source>Alma/SFX Local Collection</source><creator>Peshl, Jeremy ; McNeill, Roderick ; Sukenik, Charles I. ; Nikolić, Milka ; Popović, Svetozar ; Vŭsković, Leposava</creator><creatorcontrib>Peshl, Jeremy ; McNeill, Roderick ; Sukenik, Charles I. ; Nikolić, Milka ; Popović, Svetozar ; Vŭsković, Leposava ; Old Dominion Univ., Norfolk, VA (United States)</creatorcontrib><description>A comparative analysis of two popular spectroscopy techniques is conducted in a coaxial cylindrical capacitively coupled discharge designed for the plasma processing of superconducting radio frequency (SRF) cavities. The density of the metastable and resonant levels in Ar is measured in both Ar and Ar/Cl 2 discharges to properly characterize the unique discharge system and aid in the development of a cavity etching routine. The first method, deemed the “branching fraction method,” utilizes the sensitivity of photon reabsorption of radiative decay to measure the lower state (metastable and resonant) densities by taking ratios of spectral lines with a common upper level. This method has been gaining popularity as it does not require any a priori knowledge about the electron energy distribution. The second method is a tunable diode laser absorption spectroscopy technique that measures the thermal Doppler broadening of spectral lines, from which the neutral gas temperature and lower state density of the transition can be evaluated. The two methods were conducted in tandem, while external parameters that were empirically determined to be important to the etching mechanism of SRF cavities are varied. Relationships between the excited state densities and the external parameters are presented for both spectroscopy methods and conclusions about the effects of these parameters on the discharge are stated when appropriate.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.5115043</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Absorption spectroscopy ; Applied physics ; Argon ; Atomic and molecular collisions ; CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ; Density ; Discharge ; Electron energy distribution ; Etching ; Gas temperature ; Holes ; Lasers ; Line spectra ; Neutral gases ; Niobium ; Optical emission spectroscopy ; Parameters ; Physics ; Plasma diagnostics ; Plasma processing ; Plasma properties and parameters ; Semiconductor lasers ; Spectroscopy ; Spectrum analysis ; Superconductivity ; Tunable lasers</subject><ispartof>Journal of applied physics, 2019-09, Vol.126 (10)</ispartof><rights>Author(s)</rights><rights>2019 Author(s). Published under license by AIP Publishing.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3043-b2885acfda1fa3d98d7fe101dde9d19256e74eafec8e5674caa540a8fdc1203d3</citedby><cites>FETCH-LOGICAL-c3043-b2885acfda1fa3d98d7fe101dde9d19256e74eafec8e5674caa540a8fdc1203d3</cites><orcidid>0000-0001-5025-2546 ; 0000-0002-5355-9364 ; 0000-0002-4364-2789 ; 0000-0002-3668-4841 ; 0000-0003-4974-2059 ; 0000000243642789 ; 0000000349742059 ; 0000000236684841 ; 0000000150252546 ; 0000000253559364</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/jap/article-lookup/doi/10.1063/1.5115043$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,315,781,785,795,886,4513,27929,27930,76389</link.rule.ids><backlink>$$Uhttps://www.osti.gov/servlets/purl/1612167$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Peshl, Jeremy</creatorcontrib><creatorcontrib>McNeill, Roderick</creatorcontrib><creatorcontrib>Sukenik, Charles I.</creatorcontrib><creatorcontrib>Nikolić, Milka</creatorcontrib><creatorcontrib>Popović, Svetozar</creatorcontrib><creatorcontrib>Vŭsković, Leposava</creatorcontrib><creatorcontrib>Old Dominion Univ., Norfolk, VA (United States)</creatorcontrib><title>Argon metastable and resonant level densities in Ar and Ar/Cl2 discharges used for the processing of bulk niobium</title><title>Journal of applied physics</title><description>A comparative analysis of two popular spectroscopy techniques is conducted in a coaxial cylindrical capacitively coupled discharge designed for the plasma processing of superconducting radio frequency (SRF) cavities. The density of the metastable and resonant levels in Ar is measured in both Ar and Ar/Cl 2 discharges to properly characterize the unique discharge system and aid in the development of a cavity etching routine. The first method, deemed the “branching fraction method,” utilizes the sensitivity of photon reabsorption of radiative decay to measure the lower state (metastable and resonant) densities by taking ratios of spectral lines with a common upper level. This method has been gaining popularity as it does not require any a priori knowledge about the electron energy distribution. The second method is a tunable diode laser absorption spectroscopy technique that measures the thermal Doppler broadening of spectral lines, from which the neutral gas temperature and lower state density of the transition can be evaluated. The two methods were conducted in tandem, while external parameters that were empirically determined to be important to the etching mechanism of SRF cavities are varied. Relationships between the excited state densities and the external parameters are presented for both spectroscopy methods and conclusions about the effects of these parameters on the discharge are stated when appropriate.</description><subject>Absorption spectroscopy</subject><subject>Applied physics</subject><subject>Argon</subject><subject>Atomic and molecular collisions</subject><subject>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</subject><subject>Density</subject><subject>Discharge</subject><subject>Electron energy distribution</subject><subject>Etching</subject><subject>Gas temperature</subject><subject>Holes</subject><subject>Lasers</subject><subject>Line spectra</subject><subject>Neutral gases</subject><subject>Niobium</subject><subject>Optical emission spectroscopy</subject><subject>Parameters</subject><subject>Physics</subject><subject>Plasma diagnostics</subject><subject>Plasma processing</subject><subject>Plasma properties and parameters</subject><subject>Semiconductor lasers</subject><subject>Spectroscopy</subject><subject>Spectrum analysis</subject><subject>Superconductivity</subject><subject>Tunable lasers</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNqd0E1LAzEQBuAgCtbqwX8Q9KSwNrPZj-yxFL9A8KLnkCaTNnWb1CQr-O9dreDd0xzmYeblJeQc2A2whs_gpgaoWcUPyASY6Iq2rtkhmTBWQiG6tjsmJyltGAMQvJuQ93lcBU-3mFXKatkjVd7QiCl45TPt8QN7atAnlx0m6jydxx8yj7NFX1Ljkl6ruBp3Q0JDbYg0r5HuYtCYkvMrGixdDv0b9S4s3bA9JUdW9QnPfueUvN7dviweiqfn-8fF_KnQfIxfLEshaqWtUWAVN50wrUVgYAx2BrqybrCtUFnUAuumrbRSdcWUsEZDybjhU3KxvxtSdjJpl1GvdfAedZbQQAlNO6LLPRrzvg-YstyEIfoxlyxL0ULFRSVGdbVXOoaUIlq5i26r4qcEJr9rlyB_ax_t9d5-f1TZBf8__BHiH5Q7Y_kXipeQ7w</recordid><startdate>20190914</startdate><enddate>20190914</enddate><creator>Peshl, Jeremy</creator><creator>McNeill, Roderick</creator><creator>Sukenik, Charles I.</creator><creator>Nikolić, Milka</creator><creator>Popović, Svetozar</creator><creator>Vŭsković, Leposava</creator><general>American Institute of Physics</general><general>American Institute of Physics (AIP)</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>OIOZB</scope><scope>OTOTI</scope><orcidid>https://orcid.org/0000-0001-5025-2546</orcidid><orcidid>https://orcid.org/0000-0002-5355-9364</orcidid><orcidid>https://orcid.org/0000-0002-4364-2789</orcidid><orcidid>https://orcid.org/0000-0002-3668-4841</orcidid><orcidid>https://orcid.org/0000-0003-4974-2059</orcidid><orcidid>https://orcid.org/0000000243642789</orcidid><orcidid>https://orcid.org/0000000349742059</orcidid><orcidid>https://orcid.org/0000000236684841</orcidid><orcidid>https://orcid.org/0000000150252546</orcidid><orcidid>https://orcid.org/0000000253559364</orcidid></search><sort><creationdate>20190914</creationdate><title>Argon metastable and resonant level densities in Ar and Ar/Cl2 discharges used for the processing of bulk niobium</title><author>Peshl, Jeremy ; McNeill, Roderick ; Sukenik, Charles I. ; Nikolić, Milka ; Popović, Svetozar ; Vŭsković, Leposava</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3043-b2885acfda1fa3d98d7fe101dde9d19256e74eafec8e5674caa540a8fdc1203d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Absorption spectroscopy</topic><topic>Applied physics</topic><topic>Argon</topic><topic>Atomic and molecular collisions</topic><topic>CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS</topic><topic>Density</topic><topic>Discharge</topic><topic>Electron energy distribution</topic><topic>Etching</topic><topic>Gas temperature</topic><topic>Holes</topic><topic>Lasers</topic><topic>Line spectra</topic><topic>Neutral gases</topic><topic>Niobium</topic><topic>Optical emission spectroscopy</topic><topic>Parameters</topic><topic>Physics</topic><topic>Plasma diagnostics</topic><topic>Plasma processing</topic><topic>Plasma properties and parameters</topic><topic>Semiconductor lasers</topic><topic>Spectroscopy</topic><topic>Spectrum analysis</topic><topic>Superconductivity</topic><topic>Tunable lasers</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Peshl, Jeremy</creatorcontrib><creatorcontrib>McNeill, Roderick</creatorcontrib><creatorcontrib>Sukenik, Charles I.</creatorcontrib><creatorcontrib>Nikolić, Milka</creatorcontrib><creatorcontrib>Popović, Svetozar</creatorcontrib><creatorcontrib>Vŭsković, Leposava</creatorcontrib><creatorcontrib>Old Dominion Univ., Norfolk, VA (United States)</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>OSTI.GOV - Hybrid</collection><collection>OSTI.GOV</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Peshl, Jeremy</au><au>McNeill, Roderick</au><au>Sukenik, Charles I.</au><au>Nikolić, Milka</au><au>Popović, Svetozar</au><au>Vŭsković, Leposava</au><aucorp>Old Dominion Univ., Norfolk, VA (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Argon metastable and resonant level densities in Ar and Ar/Cl2 discharges used for the processing of bulk niobium</atitle><jtitle>Journal of applied physics</jtitle><date>2019-09-14</date><risdate>2019</risdate><volume>126</volume><issue>10</issue><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>A comparative analysis of two popular spectroscopy techniques is conducted in a coaxial cylindrical capacitively coupled discharge designed for the plasma processing of superconducting radio frequency (SRF) cavities. The density of the metastable and resonant levels in Ar is measured in both Ar and Ar/Cl 2 discharges to properly characterize the unique discharge system and aid in the development of a cavity etching routine. The first method, deemed the “branching fraction method,” utilizes the sensitivity of photon reabsorption of radiative decay to measure the lower state (metastable and resonant) densities by taking ratios of spectral lines with a common upper level. This method has been gaining popularity as it does not require any a priori knowledge about the electron energy distribution. The second method is a tunable diode laser absorption spectroscopy technique that measures the thermal Doppler broadening of spectral lines, from which the neutral gas temperature and lower state density of the transition can be evaluated. The two methods were conducted in tandem, while external parameters that were empirically determined to be important to the etching mechanism of SRF cavities are varied. Relationships between the excited state densities and the external parameters are presented for both spectroscopy methods and conclusions about the effects of these parameters on the discharge are stated when appropriate.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.5115043</doi><tpages>15</tpages><orcidid>https://orcid.org/0000-0001-5025-2546</orcidid><orcidid>https://orcid.org/0000-0002-5355-9364</orcidid><orcidid>https://orcid.org/0000-0002-4364-2789</orcidid><orcidid>https://orcid.org/0000-0002-3668-4841</orcidid><orcidid>https://orcid.org/0000-0003-4974-2059</orcidid><orcidid>https://orcid.org/0000000243642789</orcidid><orcidid>https://orcid.org/0000000349742059</orcidid><orcidid>https://orcid.org/0000000236684841</orcidid><orcidid>https://orcid.org/0000000150252546</orcidid><orcidid>https://orcid.org/0000000253559364</orcidid><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 0021-8979
ispartof Journal of applied physics, 2019-09, Vol.126 (10)
issn 0021-8979
1089-7550
language eng
recordid cdi_osti_scitechconnect_1612167
source AIP Journals Complete; Alma/SFX Local Collection
subjects Absorption spectroscopy
Applied physics
Argon
Atomic and molecular collisions
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
Density
Discharge
Electron energy distribution
Etching
Gas temperature
Holes
Lasers
Line spectra
Neutral gases
Niobium
Optical emission spectroscopy
Parameters
Physics
Plasma diagnostics
Plasma processing
Plasma properties and parameters
Semiconductor lasers
Spectroscopy
Spectrum analysis
Superconductivity
Tunable lasers
title Argon metastable and resonant level densities in Ar and Ar/Cl2 discharges used for the processing of bulk niobium
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-15T22%3A52%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Argon%20metastable%20and%20resonant%20level%20densities%20in%20Ar%20and%20Ar/Cl2%20discharges%20used%20for%20the%20processing%20of%20bulk%20niobium&rft.jtitle=Journal%20of%20applied%20physics&rft.au=Peshl,%20Jeremy&rft.aucorp=Old%20Dominion%20Univ.,%20Norfolk,%20VA%20(United%20States)&rft.date=2019-09-14&rft.volume=126&rft.issue=10&rft.issn=0021-8979&rft.eissn=1089-7550&rft.coden=JAPIAU&rft_id=info:doi/10.1063/1.5115043&rft_dat=%3Cproquest_osti_%3E2287143848%3C/proquest_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2287143848&rft_id=info:pmid/&rfr_iscdi=true