Following the Electrons: Simulation for High-Resolution STEM and CBED

Following the Electrons: Simulation for High-Resolution STEM and CBED

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Veröffentlicht in:Microscopy and microanalysis 2019-08, Vol.25 (S2), p.2680-2681
1. Verfasser: Oxley, Mark P.
Format: Artikel
Sprache:eng
Schlagworte:
Experiments
Following the Electrons: Simulation for High-Resolution STEM and CBEDs
Laboratories
Materials science
Microscopy
Public access
Sensors
Simulation
Spectrum analysis
Technologist Forum, Tutorials, and Outreach Symposia
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container_title Microscopy and microanalysis
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description
doi_str_mv 10.1017/S1431927619014132
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subjects Experiments
Following the Electrons: Simulation for High-Resolution STEM and CBEDs
Laboratories
Materials science
Microscopy
Public access
Sensors
Simulation
Spectrum analysis
Technologist Forum, Tutorials, and Outreach Symposia
title Following the Electrons: Simulation for High-Resolution STEM and CBED
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