Stuck-at Fault Tolerance in RRAM Computing Systems

Emerging metal-oxide resistive switching random-access memory (RRAM) devices and RRAM crossbars have demonstrated their potential in boosting the speed and energy-efficiency of analog matrix-vector multiplication. However, due to the immature fabrication technology, commonly occurring Stuck-At-Fault...

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Veröffentlicht in:	IEEE journal on emerging and selected topics in circuits and systems 2018-03, Vol.8 (1), p.102-115
Hauptverfasser:	Xia, Lixue, Huangfu, Wenqin, Tang, Tianqi, Yin, Xiling, Chakrabarty, Krishnendu, Xie, Yuan, Wang, Yu, Yang, Huazhong
Format:	Artikel
Sprache:	eng
Schlagworte:	Accuracy artificial neural networks Circuit faults Computation Computer memory Computer simulation Energy conversion efficiency Engineering Fabrication Fault tolerance Fault tolerant systems Mapping Mathematical analysis Matrix algebra Matrix methods Memory devices Metal oxides Neural network hardware Neural networks nonvolatile memory Recognition Redundancy resistive RAM Sensors
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