Characterization of chromium compensated GaAs as an X-ray sensor material for charge-integrating pixel array detectors

We studied the properties of chromium compensated GaAs when coupled to charge integrating ASICs as a function of detector temperature, applied bias and X-ray tube energy. The material is a photoresistor and can be biased to collect either electrons or holes by the pixel circuitry. Both are studied h...

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Veröffentlicht in:	Journal of instrumentation 2018-01, Vol.13 (1), p.P01007-P01007
Hauptverfasser:	Becker, J., Tate, M.W., Shanks, K.S., Philipp, H.T., Weiss, J.T., Purohit, P., Chamberlain, D., Gruner, S.M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Bias Charge materials Chromium Circuits Gallium arsenide Instruments & Instrumentation Pixels Point spread functions Sensor arrays Sensors Trapping X ray tubes
Online-Zugang:	Volltext
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