Diagnosis of Factors Impacting Yield in Multilayer Devices for Superconducting Electronics

The ability to localize defects in order to understand failure mechanisms in complex superconducting electronics circuits, while operating at low temperature, does not yet exist. This work applies thermally-induced voltage alteration (TIVA), to a biased superconducting electronics (SCE) circuit at a...

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Veröffentlicht in:	IEEE transactions on applied superconductivity 2019-08, Vol.29 (5), p.1-4
Hauptverfasser:	Missert, Nancy, Jenkins, Mark W., Tangyunyong, Pai, Mook, William, Vernik, Igor V., Kirichenko, Alex F., Mukhanov, Oleg A., Wynn, Alex, Day, Alexandra L., Bolkhovsky, Vladimir, Johnson, Leonard M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Ambient temperature Circuits Defects Electronic devices Electronics ENGINEERING Failure analysis Failure mechanisms Induced voltage Inductors Ion beams Josephson junctions Junctions Laser applications Laser transitions MATERIALS SCIENCE Measurement by laser beam Morphology Multilayers niobium Scanning electron microscopy Seams Signal processing superconducting integrated circuits Superconductivity Temperature measurement Wiring
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