Comparative operando XPS studies of quasi-Fermi level splitting and open-circuit voltage in CZTSe/CdS and CIGS/CdS junctions and device structures
This contribution describes operando x-ray photoelectron spectroscopy (opXPS) studies of Cu(In,Ga)Se2 (CIGS) and Cu2ZnSnSe4 (CZTSe) absorber layers and device structures. X-ray-excited valence-band and core-level spectra were acquired on bare absorber surfaces and after CdS and ZnO:Al depositions in...
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Veröffentlicht in: | Journal of vacuum science & technology. A, Vacuum, surfaces, and films Vacuum, surfaces, and films, 2019-05, Vol.37 (3) |
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Format: | Artikel |
Sprache: | eng |
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