The deposition angle-dependent density of amorphous solid water films

The index of refraction and thickness of amorphous solid water (ASW) films are determined using laser optical interferometry. From the film thickness, the density of ASW can be calculated directly since the molecular beam flux and the H2O condensation coefficient are both known. From the index of re...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	The Journal of chemical physics 2003-01, Vol.118 (1), p.364-372
Hauptverfasser:	Dohnálek, Z., Kimmel, Greg A., Ayotte, Patrick, Smith, R. Scott, Kay, Bruce D.
Format:	Artikel
Sprache:	eng
Schlagworte:	AMORPHOUS STATE DENSITY DEPOSITION Environmental Molecular Sciences Laboratory ICE INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY INTERFEROMETRY POROSITY REFRACTIVE INDEX THICKNESS
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!