The deposition angle-dependent density of amorphous solid water films

The index of refraction and thickness of amorphous solid water (ASW) films are determined using laser optical interferometry. From the film thickness, the density of ASW can be calculated directly since the molecular beam flux and the H2O condensation coefficient are both known. From the index of re...

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Veröffentlicht in:The Journal of chemical physics 2003-01, Vol.118 (1), p.364-372
Hauptverfasser: Dohnálek, Z., Kimmel, Greg A., Ayotte, Patrick, Smith, R. Scott, Kay, Bruce D.
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container_issue 1
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container_title The Journal of chemical physics
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creator Dohnálek, Z.
Kimmel, Greg A.
Ayotte, Patrick
Smith, R. Scott
Kay, Bruce D.
description The index of refraction and thickness of amorphous solid water (ASW) films are determined using laser optical interferometry. From the film thickness, the density of ASW can be calculated directly since the molecular beam flux and the H2O condensation coefficient are both known. From the index of refraction the ASW density can also be determined using the Lorentz–Lorenz relationship. The densities determined via both methods agree within experimental uncertainty. For films deposited at 22 K using a collimated molecular beam, the index of refraction and density decrease monotonically as the deposition angle is varied from normal to oblique incidence. At normal incidence the films have an index of refraction of 1.285 and are presumed to be fully dense (0.94 g/cm3). At glancing incidence (86°) the film has a refractive index of 1.05 and a density of 0.16 g/cm3, indicating a porosity exceeding 80%. The angle-dependent film density is in semiquantitative agreement with the results of ballistic deposition simulations of ASW film growth.
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subjects AMORPHOUS STATE
DENSITY
DEPOSITION
Environmental Molecular Sciences Laboratory
ICE
INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY
INTERFEROMETRY
POROSITY
REFRACTIVE INDEX
THICKNESS
title The deposition angle-dependent density of amorphous solid water films
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