In Situ Transmission Electron Microsopy of Oxide Shell-Induced Pore Formation in (De)lithiated Silicon Nanowires

Silicon (Si) nanowires with a silicon oxide (SiO x ) shell undergoing lithiation and delithiation were examined by in situ transmission electron microscopy (TEM). Large pores formed in the nanowires during the delithiation cycle. We found that the oxide shell constrains the expansion of the Si nanow...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:ACS energy letters 2018-11, Vol.3 (11), p.2829-2834
Hauptverfasser: Adkins, Emily R, Jiang, Taizhi, Luo, Langli, Wang, Chong-Min, Korgel, Brian A
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!