Event‐based processing of neutron scattering data at the Spallation Neutron Source

The Spallation Neutron Source at Oak Ridge National Laboratory, USA, ushered in a new era of neutron scattering experiments through the use of event‐based data. Tagging each neutron event allows pump–probe experiments, measurements with a parameter asynchronous to the source, measurements with conti...

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Veröffentlicht in:Journal of applied crystallography 2018-06, Vol.51 (3), p.616-629
Hauptverfasser: Granroth, Garrett E., An, Ke, Smith, Hillary L., Whitfield, Pamela, Neuefeind, Joerg C., Lee, Jooseop, Zhou, Wenduo, Sedov, Vladislav N., Peterson, Peter F., Parizzi, Andre, Skorpenske, Harley, Hartman, Steven M., Huq, Ashfia, Abernathy, Douglas L.
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Sprache:eng
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Zusammenfassung:The Spallation Neutron Source at Oak Ridge National Laboratory, USA, ushered in a new era of neutron scattering experiments through the use of event‐based data. Tagging each neutron event allows pump–probe experiments, measurements with a parameter asynchronous to the source, measurements with continuously varying parameters and novel ways of testing instrument components. This contribution will focus on a few examples. A pulsed magnet has been used to study diffraction under extreme fields. Continuous ramping of temperature is becoming standard on the POWGEN diffractometer. Battery degradation and phase transformations under heat and stress are often studied on the VULCAN diffractometer. Supercooled Al2O3 was studied on NOMAD. A study of a metallic glass through its glass transition was performed on the ARCS spectrometer, and the effect of source variation on chopper stability was studied for the SEQUOIA spectrometer. Besides a summary of these examples, an overview is provided of the hardware and software advances to enable these and many other event‐based measurements. This article describes event‐based acquisition at the Spallation Neutron Source; including both a description of methodology and a wide variety of examples.
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S1600576718004727