In-situ TEM Study of Optical and Mechanical Effects on Electrical Properties of CuO Nanowires
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
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Veröffentlicht in: | Microscopy and microanalysis 2013-08, Vol.19 (S2) |
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container_title | Microscopy and microanalysis |
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creator | Kim, S. J. Jokisaari, J. R. Kargar, A. Wang, D. Pan, X. |
description | Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013. |
doi_str_mv | 10.1017/S1431927613009471 |
format | Article |
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issn | 1431-9276 1435-8115 |
language | eng |
recordid | cdi_osti_scitechconnect_1383543 |
source | Alma/SFX Local Collection |
subjects | solar (photovoltaic), solar (thermal), phonons, thermal conductivity, thermoelectric, electrodes - solar, defects, charge transport, materials and chemistry by design, optics, synthesis (novel materials), synthesis (self-assembly) |
title | In-situ TEM Study of Optical and Mechanical Effects on Electrical Properties of CuO Nanowires |
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