Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay

Total reflection x-ray fluorescence (TXRF) is a widely applicable experimental technique for studying chemical element distributions across finely layered structures at extremely high sensitivity. To promote and facilitate scientific discovery using TXRF, we developed a MATLAB-based software package...

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Veröffentlicht in:	Review of scientific instruments 2017-03, Vol.88 (3)
Hauptverfasser:	Gong, Zhiliang, Kerr, Daniel, Hwang, Hyeondo Luke, Henderson, J. Michael, Suwatthee, Tiffany, Slaw, Benjamin R., Cao, Kathleen D., Lin, Binhua, Bu, Wei, Lee, Ka Yee C.
Format:	Artikel
Sprache:	eng
Schlagworte:	INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Online-Zugang:	Volltext
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