Interfacial Thermal Conductance between Mechanically Exfoliated Black Phosphorus and SiOx: Effect of Thickness and Temperature

Black phosphorus (BP) is one of new 2D materials that have attracted wide attention. This work reports the interfacial thermal conductance between BP flake and SiOx using Raman spectroscopy. From 293 K down to the 223 K, eight BP flakes in a thickness range of 16.6–113.7 nm are characterized. At 293...

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Veröffentlicht in:	Advanced materials interfaces 2017-08, Vol.4 (16), p.n/a
Hauptverfasser:	Wang, Tianyu, Wang, Ridong, Yuan, Pengyu, Xu, Shen, Liu, Jing, Wang, Xinwei
Format:	Artikel
Sprache:	eng
Schlagworte:	black phosphorus Cooling Dissipation Flakes Heat transfer interfacial thermal conductance Phosphorus Raman spectroscopy Resistance Thermal conductivity thermal expansion
Online-Zugang:	Volltext
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