Development of an ADC radiation tolerance characterization system for the upgrade of the ATLAS LAr calorimeter

ATLAS LAr calorimeter will undergo its Phase-I upgrade during the long shutdown(LS2) in 2018, and a new LAr Trigger Digitizer Board(LTDB) will be designed and installed. Several commercial-off-the-shelf(COTS)multi-channel high-speed ADCs have been selected as possible backups of the radiation tolera...

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Veröffentlicht in:Chinese physics C 2017-02, Vol.41 (2), p.151-158
1. Verfasser: 刘洪斌 陈虎成 陈凯 James Kierstead Francesco Lanni Helio Takai 金革
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description ATLAS LAr calorimeter will undergo its Phase-I upgrade during the long shutdown(LS2) in 2018, and a new LAr Trigger Digitizer Board(LTDB) will be designed and installed. Several commercial-off-the-shelf(COTS)multi-channel high-speed ADCs have been selected as possible backups of the radiation tolerant ADC ASICs for the LTDB. To evaluate the radiation tolerance of these backup commercial ADCs, we developed an ADC radiation tolerance characterization system, which includes the ADC boards, data acquisition(DAQ) board, signal generator,external power supplies and a host computer. The ADC board is custom designed for different ADCs, with ADC drivers and clock distribution circuits integrated on board. The Xilinx ZC706 FPGA development board is used as a DAQ board. The data from the ADC are routed to the FPGA through the FMC(FPGA Mezzanine Card)connector, de-serialized and monitored by the FPGA, and then transmitted to the host computer through the Gigabit Ethernet. A software program has been developed with Python, and all the commands are sent to the DAQ board through Gigabit Ethernet by this program. Two ADC boards have been designed for the ADC, ADS52J90 from Texas Instruments and AD9249 from Analog Devices respectively. TID tests for both ADCs have been performed at BNL, and an SEE test for the ADS52J90 has been performed at Massachusetts General Hospital(MGH). Test results have been analyzed and presented. The test results demonstrate that this test system is very versatile, and works well for the radiation tolerance characterization of commercial multi-channel high-speed ADCs for the upgrade of the ATLAS LAr calorimeter. It is applicable to other collider physics experiments where radiation tolerance is required as well.
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fullrecord <record><control><sourceid>crossref_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_1376188</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cqvip_id>671377451</cqvip_id><sourcerecordid>10_1088_1674_1137_41_2_026101</sourcerecordid><originalsourceid>FETCH-LOGICAL-c343t-855e7121a2eb0c1edde01eedaaafeff6043e8dd7aab81a25a62123352ca7d7f53</originalsourceid><addsrcrecordid>eNpFkE1LAzEQhoMoWKs_QQje180km929Lq1fUPBgPYdpdrZdaZOaRKH-enep1NMwzPO-DA9jtyDuQdR1DmVVZACqygvIZS5kCQLO2ERIXWRKaHnOJifmkl3F-CFEWQzRCXNz-qat3-_IJe47jo438xkP2PaYeu948lsK6Cxxu8GANlHof46neIiJdrzzgacN8a_9eojR2DKuzXLRvPFFE7jFrQ_9joboNbvocBvp5m9O2fvjw3L2nC1en15mzSKzqlApq7WmCiSgpJWwQG1LAohaROyo60pRKKrbtkJc1QOksZQgldLSYtVWnVZTdnfs9TH1Jto-kd1Y7xzZZAYLJdT1AOkjZIOPMVBn9sObGA4GhBnNmtGaGa2ZAow0R7P_5Xbj3fqzd-tTsKwGuCo0qF_TyHiz</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Development of an ADC radiation tolerance characterization system for the upgrade of the ATLAS LAr calorimeter</title><source>IOP Publishing Journals</source><source>EZB-FREE-00999 freely available EZB journals</source><source>IOPscience extra</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><source>Alma/SFX Local Collection</source><creator>刘洪斌 陈虎成 陈凯 James Kierstead Francesco Lanni Helio Takai 金革</creator><creatorcontrib>刘洪斌 陈虎成 陈凯 James Kierstead Francesco Lanni Helio Takai 金革 ; Brookhaven National Laboratory (BNL), Upton, NY (United States)</creatorcontrib><description>ATLAS LAr calorimeter will undergo its Phase-I upgrade during the long shutdown(LS2) in 2018, and a new LAr Trigger Digitizer Board(LTDB) will be designed and installed. Several commercial-off-the-shelf(COTS)multi-channel high-speed ADCs have been selected as possible backups of the radiation tolerant ADC ASICs for the LTDB. To evaluate the radiation tolerance of these backup commercial ADCs, we developed an ADC radiation tolerance characterization system, which includes the ADC boards, data acquisition(DAQ) board, signal generator,external power supplies and a host computer. The ADC board is custom designed for different ADCs, with ADC drivers and clock distribution circuits integrated on board. The Xilinx ZC706 FPGA development board is used as a DAQ board. The data from the ADC are routed to the FPGA through the FMC(FPGA Mezzanine Card)connector, de-serialized and monitored by the FPGA, and then transmitted to the host computer through the Gigabit Ethernet. A software program has been developed with Python, and all the commands are sent to the DAQ board through Gigabit Ethernet by this program. Two ADC boards have been designed for the ADC, ADS52J90 from Texas Instruments and AD9249 from Analog Devices respectively. TID tests for both ADCs have been performed at BNL, and an SEE test for the ADS52J90 has been performed at Massachusetts General Hospital(MGH). Test results have been analyzed and presented. The test results demonstrate that this test system is very versatile, and works well for the radiation tolerance characterization of commercial multi-channel high-speed ADCs for the upgrade of the ATLAS LAr calorimeter. It is applicable to other collider physics experiments where radiation tolerance is required as well.</description><identifier>ISSN: 1674-1137</identifier><identifier>EISSN: 0254-3052</identifier><identifier>DOI: 10.1088/1674-1137/41/2/026101</identifier><language>eng</language><publisher>United States: IOP Publishing</publisher><subject>FPGA ; high-speed multi-channel ADC ; PHYSICS OF ELEMENTARY PARTICLES AND FIELDS ; radiation tolerance characterization ; single event effect ; total ionization dose ; 千兆以太网 ; 数据采集板 ; 测试系统 ; 耐辐射 ; 量热仪 ; 阿特拉斯 ; 高速ADC</subject><ispartof>Chinese physics C, 2017-02, Vol.41 (2), p.151-158</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c343t-855e7121a2eb0c1edde01eedaaafeff6043e8dd7aab81a25a62123352ca7d7f53</citedby><cites>FETCH-LOGICAL-c343t-855e7121a2eb0c1edde01eedaaafeff6043e8dd7aab81a25a62123352ca7d7f53</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttp://image.cqvip.com/vip1000/qk/92043A/92043A.jpg</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttps://www.osti.gov/servlets/purl/1376188$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>刘洪斌 陈虎成 陈凯 James Kierstead Francesco Lanni Helio Takai 金革</creatorcontrib><creatorcontrib>Brookhaven National Laboratory (BNL), Upton, NY (United States)</creatorcontrib><title>Development of an ADC radiation tolerance characterization system for the upgrade of the ATLAS LAr calorimeter</title><title>Chinese physics C</title><addtitle>Chinese Physica C</addtitle><description>ATLAS LAr calorimeter will undergo its Phase-I upgrade during the long shutdown(LS2) in 2018, and a new LAr Trigger Digitizer Board(LTDB) will be designed and installed. Several commercial-off-the-shelf(COTS)multi-channel high-speed ADCs have been selected as possible backups of the radiation tolerant ADC ASICs for the LTDB. To evaluate the radiation tolerance of these backup commercial ADCs, we developed an ADC radiation tolerance characterization system, which includes the ADC boards, data acquisition(DAQ) board, signal generator,external power supplies and a host computer. The ADC board is custom designed for different ADCs, with ADC drivers and clock distribution circuits integrated on board. The Xilinx ZC706 FPGA development board is used as a DAQ board. The data from the ADC are routed to the FPGA through the FMC(FPGA Mezzanine Card)connector, de-serialized and monitored by the FPGA, and then transmitted to the host computer through the Gigabit Ethernet. A software program has been developed with Python, and all the commands are sent to the DAQ board through Gigabit Ethernet by this program. Two ADC boards have been designed for the ADC, ADS52J90 from Texas Instruments and AD9249 from Analog Devices respectively. TID tests for both ADCs have been performed at BNL, and an SEE test for the ADS52J90 has been performed at Massachusetts General Hospital(MGH). Test results have been analyzed and presented. The test results demonstrate that this test system is very versatile, and works well for the radiation tolerance characterization of commercial multi-channel high-speed ADCs for the upgrade of the ATLAS LAr calorimeter. It is applicable to other collider physics experiments where radiation tolerance is required as well.</description><subject>FPGA</subject><subject>high-speed multi-channel ADC</subject><subject>PHYSICS OF ELEMENTARY PARTICLES AND FIELDS</subject><subject>radiation tolerance characterization</subject><subject>single event effect</subject><subject>total ionization dose</subject><subject>千兆以太网</subject><subject>数据采集板</subject><subject>测试系统</subject><subject>耐辐射</subject><subject>量热仪</subject><subject>阿特拉斯</subject><subject>高速ADC</subject><issn>1674-1137</issn><issn>0254-3052</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNpFkE1LAzEQhoMoWKs_QQje180km929Lq1fUPBgPYdpdrZdaZOaRKH-enep1NMwzPO-DA9jtyDuQdR1DmVVZACqygvIZS5kCQLO2ERIXWRKaHnOJifmkl3F-CFEWQzRCXNz-qat3-_IJe47jo438xkP2PaYeu948lsK6Cxxu8GANlHof46neIiJdrzzgacN8a_9eojR2DKuzXLRvPFFE7jFrQ_9joboNbvocBvp5m9O2fvjw3L2nC1en15mzSKzqlApq7WmCiSgpJWwQG1LAohaROyo60pRKKrbtkJc1QOksZQgldLSYtVWnVZTdnfs9TH1Jto-kd1Y7xzZZAYLJdT1AOkjZIOPMVBn9sObGA4GhBnNmtGaGa2ZAow0R7P_5Xbj3fqzd-tTsKwGuCo0qF_TyHiz</recordid><startdate>20170201</startdate><enddate>20170201</enddate><creator>刘洪斌 陈虎成 陈凯 James Kierstead Francesco Lanni Helio Takai 金革</creator><general>IOP Publishing</general><scope>2RA</scope><scope>92L</scope><scope>CQIGP</scope><scope>~WA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>OIOZB</scope><scope>OTOTI</scope></search><sort><creationdate>20170201</creationdate><title>Development of an ADC radiation tolerance characterization system for the upgrade of the ATLAS LAr calorimeter</title><author>刘洪斌 陈虎成 陈凯 James Kierstead Francesco Lanni Helio Takai 金革</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c343t-855e7121a2eb0c1edde01eedaaafeff6043e8dd7aab81a25a62123352ca7d7f53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>FPGA</topic><topic>high-speed multi-channel ADC</topic><topic>PHYSICS OF ELEMENTARY PARTICLES AND FIELDS</topic><topic>radiation tolerance characterization</topic><topic>single event effect</topic><topic>total ionization dose</topic><topic>千兆以太网</topic><topic>数据采集板</topic><topic>测试系统</topic><topic>耐辐射</topic><topic>量热仪</topic><topic>阿特拉斯</topic><topic>高速ADC</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>刘洪斌 陈虎成 陈凯 James Kierstead Francesco Lanni Helio Takai 金革</creatorcontrib><creatorcontrib>Brookhaven National Laboratory (BNL), Upton, NY (United States)</creatorcontrib><collection>中文科技期刊数据库</collection><collection>中文科技期刊数据库-CALIS站点</collection><collection>中文科技期刊数据库-7.0平台</collection><collection>中文科技期刊数据库- 镜像站点</collection><collection>CrossRef</collection><collection>OSTI.GOV - Hybrid</collection><collection>OSTI.GOV</collection><jtitle>Chinese physics C</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>刘洪斌 陈虎成 陈凯 James Kierstead Francesco Lanni Helio Takai 金革</au><aucorp>Brookhaven National Laboratory (BNL), Upton, NY (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Development of an ADC radiation tolerance characterization system for the upgrade of the ATLAS LAr calorimeter</atitle><jtitle>Chinese physics C</jtitle><addtitle>Chinese Physica C</addtitle><date>2017-02-01</date><risdate>2017</risdate><volume>41</volume><issue>2</issue><spage>151</spage><epage>158</epage><pages>151-158</pages><issn>1674-1137</issn><eissn>0254-3052</eissn><abstract>ATLAS LAr calorimeter will undergo its Phase-I upgrade during the long shutdown(LS2) in 2018, and a new LAr Trigger Digitizer Board(LTDB) will be designed and installed. Several commercial-off-the-shelf(COTS)multi-channel high-speed ADCs have been selected as possible backups of the radiation tolerant ADC ASICs for the LTDB. To evaluate the radiation tolerance of these backup commercial ADCs, we developed an ADC radiation tolerance characterization system, which includes the ADC boards, data acquisition(DAQ) board, signal generator,external power supplies and a host computer. The ADC board is custom designed for different ADCs, with ADC drivers and clock distribution circuits integrated on board. The Xilinx ZC706 FPGA development board is used as a DAQ board. The data from the ADC are routed to the FPGA through the FMC(FPGA Mezzanine Card)connector, de-serialized and monitored by the FPGA, and then transmitted to the host computer through the Gigabit Ethernet. A software program has been developed with Python, and all the commands are sent to the DAQ board through Gigabit Ethernet by this program. Two ADC boards have been designed for the ADC, ADS52J90 from Texas Instruments and AD9249 from Analog Devices respectively. TID tests for both ADCs have been performed at BNL, and an SEE test for the ADS52J90 has been performed at Massachusetts General Hospital(MGH). Test results have been analyzed and presented. The test results demonstrate that this test system is very versatile, and works well for the radiation tolerance characterization of commercial multi-channel high-speed ADCs for the upgrade of the ATLAS LAr calorimeter. It is applicable to other collider physics experiments where radiation tolerance is required as well.</abstract><cop>United States</cop><pub>IOP Publishing</pub><doi>10.1088/1674-1137/41/2/026101</doi><tpages>8</tpages><oa>free_for_read</oa></addata></record>
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subjects FPGA
high-speed multi-channel ADC
PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
radiation tolerance characterization
single event effect
total ionization dose
千兆以太网
数据采集板
测试系统
耐辐射
量热仪
阿特拉斯
高速ADC
title Development of an ADC radiation tolerance characterization system for the upgrade of the ATLAS LAr calorimeter
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T02%3A53%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Development%20of%20an%20ADC%20radiation%20tolerance%20characterization%20system%20for%20the%20upgrade%20of%20the%20ATLAS%20LAr%20calorimeter&rft.jtitle=Chinese%20physics%20C&rft.au=%E5%88%98%E6%B4%AA%E6%96%8C%20%E9%99%88%E8%99%8E%E6%88%90%20%E9%99%88%E5%87%AF%20James%20Kierstead%20Francesco%20Lanni%20Helio%20Takai%20%E9%87%91%E9%9D%A9&rft.aucorp=Brookhaven%20National%20Laboratory%20(BNL),%20Upton,%20NY%20(United%20States)&rft.date=2017-02-01&rft.volume=41&rft.issue=2&rft.spage=151&rft.epage=158&rft.pages=151-158&rft.issn=1674-1137&rft.eissn=0254-3052&rft_id=info:doi/10.1088/1674-1137/41/2/026101&rft_dat=%3Ccrossref_osti_%3E10_1088_1674_1137_41_2_026101%3C/crossref_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_cqvip_id=671377451&rfr_iscdi=true