Applying shot boundary detection for automated crystal growth analysis during in situ transmission electron microscope experiments
In-situ (scanning) transmission electron microscopy (S/TEM) is being developed for numerous applications in the study of nucleation and growth under electrochemical driving forces. For this type of experiment, one of the key parameters is to identify when nucleation initiates. Typically the process...
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Veröffentlicht in: | Advanced structural and chemical imaging 2017-01, Vol.3 (1) |
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