Nanostructure of pseudomonocrystalline graphite studied by nanoimaging of electrical properties in combination with other techniques
A complex approach, which includes simultaneous data acquisition and processing, to analyze various physical parameters characteristics of the same sample cross-section at high resolution allows to extract information of much better quality and, thus, is a basis of modern studies at nanolevel. A con...
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Veröffentlicht in: | Carbon (New York) 2017-04, Vol.114, p.724-730 |
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creator | Shumilova, T.G. Golubev, Ye.A. Mayer, J. Shevchuk, S.S. Radaev, V.A. Isaenko, S.I. Tkachev, S.N. |
description | A complex approach, which includes simultaneous data acquisition and processing, to analyze various physical parameters characteristics of the same sample cross-section at high resolution allows to extract information of much better quality and, thus, is a basis of modern studies at nanolevel. A concomitant investigation of surface topography and local electrical features of presumably defect-laden pseudomonocrystalline graphite is presented as an example. The structural state of graphite is monitored “in situ” using the microdiffraction unit of scanning electron microscope VEGA3 TESCAN and additionally tested by high resolution Raman spectroscopy measurements. The study reveals a previously undetectable by standard nanotopographic and X-ray diffraction observations nanostructure of pseudomonocrystalline graphite. A novel graphite-carbyne intergrowth model based on the energetically stable attachment of carbyne-like CC bonded chains to sp2 graphitic fragments is presented.
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doi_str_mv | 10.1016/j.carbon.2016.12.032 |
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[Display omitted]</description><subject>Attachment</subject><subject>Carbyne</subject><subject>Cross-sections</subject><subject>Electrical properties</subject><subject>Electron microscopes</subject><subject>Fragmentation</subject><subject>Fragments</subject><subject>Graphite</subject><subject>High resolution</subject><subject>Nanostructure</subject><subject>Physical properties</subject><subject>Raman spectroscopy</subject><subject>Scanning electron microscopy</subject><subject>Spectroscopic analysis</subject><subject>Topography</subject><subject>X-ray diffraction</subject><issn>0008-6223</issn><issn>1873-3891</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNp9kU9v1DAQxS0EEkvLN-Bg0XNS_0s2uSBVVQuVKriUs-VMxrteZe1gO6C988FxlJ45WSO_N_ObeYR84qzmjLe3pxpMHIKvRalqLmomxRuy491eVrLr-VuyY4x1VSuEfE8-pHQqpeq42pG_340PKccF8hKRBkvnhMsYzsEHiJeUzTQ5j_QQzXx0GWnKy-hwpMOF-mJ1Z3Nw_rAacULI0YGZ6BzDjDE7TNR5CuE8OG-yC57-cflIQz5ipBnh6N2vBdM1eWfNlPDj63tFfj4-vNx_q55_fH26v3uuQLF9rpQQjRmk7dE2fN-2QkkEiR3u-SDKH6gGOtsy2zNlrW15bxqwIxND0zbAB3lFPm99y8ZOJ3ArAgTvC7jmsgzhsohuNlFZYoXL-hSW6AuX5n0Z2ysuVpXaVBBDShGtnmO5RbxozvQaij7pLRS9hqK50CWUYvuy2bCs-dthXCnQA44urhBjcP9v8A8uHJrB</recordid><startdate>201704</startdate><enddate>201704</enddate><creator>Shumilova, T.G.</creator><creator>Golubev, Ye.A.</creator><creator>Mayer, J.</creator><creator>Shevchuk, S.S.</creator><creator>Radaev, V.A.</creator><creator>Isaenko, S.I.</creator><creator>Tkachev, S.N.</creator><general>Elsevier Ltd</general><general>Elsevier BV</general><general>Elsevier</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8FD</scope><scope>JG9</scope><scope>OTOTI</scope></search><sort><creationdate>201704</creationdate><title>Nanostructure of pseudomonocrystalline graphite studied by nanoimaging of electrical properties in combination with other techniques</title><author>Shumilova, T.G. ; Golubev, Ye.A. ; Mayer, J. ; Shevchuk, S.S. ; Radaev, V.A. ; Isaenko, S.I. ; Tkachev, S.N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c407t-4225ab3f9ef51766243ec3e8e71b2225c45c8f60f904fff619a5cfd02b565c1b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Attachment</topic><topic>Carbyne</topic><topic>Cross-sections</topic><topic>Electrical properties</topic><topic>Electron microscopes</topic><topic>Fragmentation</topic><topic>Fragments</topic><topic>Graphite</topic><topic>High resolution</topic><topic>Nanostructure</topic><topic>Physical properties</topic><topic>Raman spectroscopy</topic><topic>Scanning electron microscopy</topic><topic>Spectroscopic analysis</topic><topic>Topography</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shumilova, T.G.</creatorcontrib><creatorcontrib>Golubev, Ye.A.</creatorcontrib><creatorcontrib>Mayer, J.</creatorcontrib><creatorcontrib>Shevchuk, S.S.</creatorcontrib><creatorcontrib>Radaev, V.A.</creatorcontrib><creatorcontrib>Isaenko, S.I.</creatorcontrib><creatorcontrib>Tkachev, S.N.</creatorcontrib><creatorcontrib>Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>OSTI.GOV</collection><jtitle>Carbon (New York)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shumilova, T.G.</au><au>Golubev, Ye.A.</au><au>Mayer, J.</au><au>Shevchuk, S.S.</au><au>Radaev, V.A.</au><au>Isaenko, S.I.</au><au>Tkachev, S.N.</au><aucorp>Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Nanostructure of pseudomonocrystalline graphite studied by nanoimaging of electrical properties in combination with other techniques</atitle><jtitle>Carbon (New York)</jtitle><date>2017-04</date><risdate>2017</risdate><volume>114</volume><spage>724</spage><epage>730</epage><pages>724-730</pages><issn>0008-6223</issn><eissn>1873-3891</eissn><abstract>A complex approach, which includes simultaneous data acquisition and processing, to analyze various physical parameters characteristics of the same sample cross-section at high resolution allows to extract information of much better quality and, thus, is a basis of modern studies at nanolevel. A concomitant investigation of surface topography and local electrical features of presumably defect-laden pseudomonocrystalline graphite is presented as an example. The structural state of graphite is monitored “in situ” using the microdiffraction unit of scanning electron microscope VEGA3 TESCAN and additionally tested by high resolution Raman spectroscopy measurements. The study reveals a previously undetectable by standard nanotopographic and X-ray diffraction observations nanostructure of pseudomonocrystalline graphite. A novel graphite-carbyne intergrowth model based on the energetically stable attachment of carbyne-like CC bonded chains to sp2 graphitic fragments is presented.
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subjects | Attachment Carbyne Cross-sections Electrical properties Electron microscopes Fragmentation Fragments Graphite High resolution Nanostructure Physical properties Raman spectroscopy Scanning electron microscopy Spectroscopic analysis Topography X-ray diffraction |
title | Nanostructure of pseudomonocrystalline graphite studied by nanoimaging of electrical properties in combination with other techniques |
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