Structure and stability of solid Xe(H2)n
Mixtures of xenon and molecular hydrogen form a series of hexagonal, van der Waals compounds at high pressures and at 300 K. Synchrotron, x-ray, single crystal diffraction studies reveal that below 7.5 GPa, Xe(H2)8 crystallizes in a P3̄m1 structure that displays pressure-induced occupancy changes of...
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Veröffentlicht in: | The Journal of chemical physics 2015-03, Vol.142 (10), p.104503-104503 |
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creator | Somayazulu, Maddury Dera, Przemyslaw Smith, Jesse Hemley, Russell J |
description | Mixtures of xenon and molecular hydrogen form a series of hexagonal, van der Waals compounds at high pressures and at 300 K. Synchrotron, x-ray, single crystal diffraction studies reveal that below 7.5 GPa, Xe(H2)8 crystallizes in a P3̄m1 structure that displays pressure-induced occupancy changes of two pairs of xenon atoms located on the 2c and 2d sites (while the third pair on yet another 2c site remains fully occupied). The occupancy becomes 1 at the P3̄m1 to R3 transition and all the xenon atoms occupy the 3d sites in the high-pressure structure. These pressure-induced changes in occupancy coincide with volume changes that maintain the average Xe:H2 stoichiometry fixed at 1:8. The synchrotron x-ray diffraction and Raman measurements show that this unique hydrogen-bearing compound that can be synthesized at 4.2 GPa and 300 K, quenched at low temperatures to atmospheric pressure, and retained up to 90 K on subsequent warming. |
doi_str_mv | 10.1063/1.4908265 |
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(United States)</creatorcontrib><description>Mixtures of xenon and molecular hydrogen form a series of hexagonal, van der Waals compounds at high pressures and at 300 K. Synchrotron, x-ray, single crystal diffraction studies reveal that below 7.5 GPa, Xe(H2)8 crystallizes in a P3̄m1 structure that displays pressure-induced occupancy changes of two pairs of xenon atoms located on the 2c and 2d sites (while the third pair on yet another 2c site remains fully occupied). The occupancy becomes 1 at the P3̄m1 to R3 transition and all the xenon atoms occupy the 3d sites in the high-pressure structure. These pressure-induced changes in occupancy coincide with volume changes that maintain the average Xe:H2 stoichiometry fixed at 1:8. The synchrotron x-ray diffraction and Raman measurements show that this unique hydrogen-bearing compound that can be synthesized at 4.2 GPa and 300 K, quenched at low temperatures to atmospheric pressure, and retained up to 90 K on subsequent warming.</description><identifier>ISSN: 0021-9606</identifier><identifier>EISSN: 1089-7690</identifier><identifier>DOI: 10.1063/1.4908265</identifier><identifier>PMID: 25770547</identifier><language>eng</language><publisher>United States: American Institute of Physics</publisher><subject>Diffraction ; INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY ; Single crystals ; Stoichiometry ; Structural stability ; Synchrotron radiation ; X-ray diffraction ; Xenon</subject><ispartof>The Journal of chemical physics, 2015-03, Vol.142 (10), p.104503-104503</ispartof><rights>2015 AIP Publishing LLC.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3565-bd20a06a4ae15fa8f52f8369fcb1b13a9859bf32068caee0d021e9bbaa19bd5e3</citedby><cites>FETCH-LOGICAL-c3565-bd20a06a4ae15fa8f52f8369fcb1b13a9859bf32068caee0d021e9bbaa19bd5e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,776,780,881,27901,27902</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/25770547$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/servlets/purl/1335840$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Somayazulu, Maddury</creatorcontrib><creatorcontrib>Dera, Przemyslaw</creatorcontrib><creatorcontrib>Smith, Jesse</creatorcontrib><creatorcontrib>Hemley, Russell J</creatorcontrib><creatorcontrib>Carnegie Institution of Washington, Washington, D.C. (United States)</creatorcontrib><title>Structure and stability of solid Xe(H2)n</title><title>The Journal of chemical physics</title><addtitle>J Chem Phys</addtitle><description>Mixtures of xenon and molecular hydrogen form a series of hexagonal, van der Waals compounds at high pressures and at 300 K. Synchrotron, x-ray, single crystal diffraction studies reveal that below 7.5 GPa, Xe(H2)8 crystallizes in a P3̄m1 structure that displays pressure-induced occupancy changes of two pairs of xenon atoms located on the 2c and 2d sites (while the third pair on yet another 2c site remains fully occupied). The occupancy becomes 1 at the P3̄m1 to R3 transition and all the xenon atoms occupy the 3d sites in the high-pressure structure. These pressure-induced changes in occupancy coincide with volume changes that maintain the average Xe:H2 stoichiometry fixed at 1:8. The synchrotron x-ray diffraction and Raman measurements show that this unique hydrogen-bearing compound that can be synthesized at 4.2 GPa and 300 K, quenched at low temperatures to atmospheric pressure, and retained up to 90 K on subsequent warming.</description><subject>Diffraction</subject><subject>INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY</subject><subject>Single crystals</subject><subject>Stoichiometry</subject><subject>Structural stability</subject><subject>Synchrotron radiation</subject><subject>X-ray diffraction</subject><subject>Xenon</subject><issn>0021-9606</issn><issn>1089-7690</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNpd0DFPwzAQBWALgWgpDPwBFMHSDil3duzEI6qAIlViACQ2y3ZskSpNip0M_fcEWhiYbvn09O4RcokwRxDsFueZhIIKfkTGCIVMcyHhmIwBKKZSgBiRsxjXAIA5zU7JiPI8B57lYzJ96UJvuz64RDdlEjttqrrqdknrk9jWVZm8u-mSzppzcuJ1Hd3F4U7I28P962KZrp4fnxZ3q9QyLnhqSgoahM60Q-514Tn1BRPSW4MGmZYFl8YzCqKw2jkoh4pOGqM1SlNyxybkep_bxq5S0Vadsx-2bRpnO4WM8SKDAU33aBvaz97FTm2qaF1d68a1fVQoRIaSc8wGevOPrts-NMMLiiJluRT4o2Z7ZUMbY3BebUO10WGnENT3xgrVYePBXh0Se7Nx5Z_8HZV9Adz3cpQ</recordid><startdate>20150314</startdate><enddate>20150314</enddate><creator>Somayazulu, Maddury</creator><creator>Dera, Przemyslaw</creator><creator>Smith, Jesse</creator><creator>Hemley, Russell J</creator><general>American Institute of Physics</general><general>American Institute of Physics (AIP)</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope><scope>OIOZB</scope><scope>OTOTI</scope></search><sort><creationdate>20150314</creationdate><title>Structure and stability of solid Xe(H2)n</title><author>Somayazulu, Maddury ; Dera, Przemyslaw ; Smith, Jesse ; Hemley, Russell J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3565-bd20a06a4ae15fa8f52f8369fcb1b13a9859bf32068caee0d021e9bbaa19bd5e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Diffraction</topic><topic>INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY</topic><topic>Single crystals</topic><topic>Stoichiometry</topic><topic>Structural stability</topic><topic>Synchrotron radiation</topic><topic>X-ray diffraction</topic><topic>Xenon</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Somayazulu, Maddury</creatorcontrib><creatorcontrib>Dera, Przemyslaw</creatorcontrib><creatorcontrib>Smith, Jesse</creatorcontrib><creatorcontrib>Hemley, Russell J</creatorcontrib><creatorcontrib>Carnegie Institution of Washington, Washington, D.C. 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These pressure-induced changes in occupancy coincide with volume changes that maintain the average Xe:H2 stoichiometry fixed at 1:8. The synchrotron x-ray diffraction and Raman measurements show that this unique hydrogen-bearing compound that can be synthesized at 4.2 GPa and 300 K, quenched at low temperatures to atmospheric pressure, and retained up to 90 K on subsequent warming.</abstract><cop>United States</cop><pub>American Institute of Physics</pub><pmid>25770547</pmid><doi>10.1063/1.4908265</doi><tpages>1</tpages><oa>free_for_read</oa></addata></record> |
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subjects | Diffraction INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY Single crystals Stoichiometry Structural stability Synchrotron radiation X-ray diffraction Xenon |
title | Structure and stability of solid Xe(H2)n |
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