Structure and stability of solid Xe(H2)n

Mixtures of xenon and molecular hydrogen form a series of hexagonal, van der Waals compounds at high pressures and at 300 K. Synchrotron, x-ray, single crystal diffraction studies reveal that below 7.5 GPa, Xe(H2)8 crystallizes in a P3̄m1 structure that displays pressure-induced occupancy changes of...

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Veröffentlicht in:The Journal of chemical physics 2015-03, Vol.142 (10), p.104503-104503
Hauptverfasser: Somayazulu, Maddury, Dera, Przemyslaw, Smith, Jesse, Hemley, Russell J
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container_end_page 104503
container_issue 10
container_start_page 104503
container_title The Journal of chemical physics
container_volume 142
creator Somayazulu, Maddury
Dera, Przemyslaw
Smith, Jesse
Hemley, Russell J
description Mixtures of xenon and molecular hydrogen form a series of hexagonal, van der Waals compounds at high pressures and at 300 K. Synchrotron, x-ray, single crystal diffraction studies reveal that below 7.5 GPa, Xe(H2)8 crystallizes in a P3̄m1 structure that displays pressure-induced occupancy changes of two pairs of xenon atoms located on the 2c and 2d sites (while the third pair on yet another 2c site remains fully occupied). The occupancy becomes 1 at the P3̄m1 to R3 transition and all the xenon atoms occupy the 3d sites in the high-pressure structure. These pressure-induced changes in occupancy coincide with volume changes that maintain the average Xe:H2 stoichiometry fixed at 1:8. The synchrotron x-ray diffraction and Raman measurements show that this unique hydrogen-bearing compound that can be synthesized at 4.2 GPa and 300 K, quenched at low temperatures to atmospheric pressure, and retained up to 90 K on subsequent warming.
doi_str_mv 10.1063/1.4908265
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source AIP Journals Complete; Alma/SFX Local Collection
subjects Diffraction
INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
Single crystals
Stoichiometry
Structural stability
Synchrotron radiation
X-ray diffraction
Xenon
title Structure and stability of solid Xe(H2)n
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