Atomic Defects in Monolayer Titanium Carbide (Ti3C2T x ) MXene
The 2D transition metal carbides or nitrides, or MXenes, are emerging as a group of materials showing great promise in lithium ion batteries and supercapacitors. Until now, characterization and properties of single-layer MXenes have been scarcely reported. Here, using scanning transmission electron...
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| Veröffentlicht in: | ACS nano 2016-10, Vol.10 (10), p.9193-9200 |
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| creator | Sang, Xiahan Xie, Yu Lin, Ming-Wei Alhabeb, Mohamed Van Aken, Katherine L Gogotsi, Yury Kent, Paul R. C Xiao, Kai Unocic, Raymond R |
| description | The 2D transition metal carbides or nitrides, or MXenes, are emerging as a group of materials showing great promise in lithium ion batteries and supercapacitors. Until now, characterization and properties of single-layer MXenes have been scarcely reported. Here, using scanning transmission electron microscopy, we determined the atomic structure of freestanding monolayer Ti3C2T x flakes prepared via the minimally intensive layer delamination method and characterized different point defects that are prevalent in the monolayer flakes. We determine that the Ti vacancy concentration can be controlled by the etchant concentration during preparation. Density function theory-based calculations confirm the defect structures and predict that the defects can influence the surface morphology and termination groups, but do not strongly influence the metallic conductivity. Using devices fabricated from single- and few-layer Ti3C2T x MXene flakes, the effect of the number of layers in the flake on conductivity has been demonstrated. |
| doi_str_mv | 10.1021/acsnano.6b05240 |
| format | Article |
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C ; Xiao, Kai ; Unocic, Raymond R</creator><creatorcontrib>Sang, Xiahan ; Xie, Yu ; Lin, Ming-Wei ; Alhabeb, Mohamed ; Van Aken, Katherine L ; Gogotsi, Yury ; Kent, Paul R. C ; Xiao, Kai ; Unocic, Raymond R ; Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States) ; Energy Frontier Research Centers (EFRC) (United States). Fluid Interface Reactions, Structures and Transport Center (FIRST)</creatorcontrib><description>The 2D transition metal carbides or nitrides, or MXenes, are emerging as a group of materials showing great promise in lithium ion batteries and supercapacitors. Until now, characterization and properties of single-layer MXenes have been scarcely reported. Here, using scanning transmission electron microscopy, we determined the atomic structure of freestanding monolayer Ti3C2T x flakes prepared via the minimally intensive layer delamination method and characterized different point defects that are prevalent in the monolayer flakes. We determine that the Ti vacancy concentration can be controlled by the etchant concentration during preparation. Density function theory-based calculations confirm the defect structures and predict that the defects can influence the surface morphology and termination groups, but do not strongly influence the metallic conductivity. Using devices fabricated from single- and few-layer Ti3C2T x MXene flakes, the effect of the number of layers in the flake on conductivity has been demonstrated.</description><identifier>ISSN: 1936-0851</identifier><identifier>EISSN: 1936-086X</identifier><identifier>DOI: 10.1021/acsnano.6b05240</identifier><identifier>PMID: 27598326</identifier><language>eng</language><publisher>United States: American Chemical Society</publisher><subject>conductivity ; defect ; INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY ; MATERIALS SCIENCE ; minimally intensive layer delamination (MILD) ; MXene ; vacancy</subject><ispartof>ACS nano, 2016-10, Vol.10 (10), p.9193-9200</ispartof><rights>Copyright © 2016 American Chemical Society</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a537t-2cc7c6cf86e1156748145a44160bc0eb90572138a70f60054b1540219488ed803</citedby><cites>FETCH-LOGICAL-a537t-2cc7c6cf86e1156748145a44160bc0eb90572138a70f60054b1540219488ed803</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://pubs.acs.org/doi/pdf/10.1021/acsnano.6b05240$$EPDF$$P50$$Gacs$$H</linktopdf><linktohtml>$$Uhttps://pubs.acs.org/doi/10.1021/acsnano.6b05240$$EHTML$$P50$$Gacs$$H</linktohtml><link.rule.ids>230,314,776,780,881,2751,27055,27903,27904,56717,56767</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/27598326$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/servlets/purl/1334485$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Sang, Xiahan</creatorcontrib><creatorcontrib>Xie, Yu</creatorcontrib><creatorcontrib>Lin, Ming-Wei</creatorcontrib><creatorcontrib>Alhabeb, Mohamed</creatorcontrib><creatorcontrib>Van Aken, Katherine L</creatorcontrib><creatorcontrib>Gogotsi, Yury</creatorcontrib><creatorcontrib>Kent, Paul R. 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Here, using scanning transmission electron microscopy, we determined the atomic structure of freestanding monolayer Ti3C2T x flakes prepared via the minimally intensive layer delamination method and characterized different point defects that are prevalent in the monolayer flakes. We determine that the Ti vacancy concentration can be controlled by the etchant concentration during preparation. Density function theory-based calculations confirm the defect structures and predict that the defects can influence the surface morphology and termination groups, but do not strongly influence the metallic conductivity. Using devices fabricated from single- and few-layer Ti3C2T x MXene flakes, the effect of the number of layers in the flake on conductivity has been demonstrated.</description><subject>conductivity</subject><subject>defect</subject><subject>INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY</subject><subject>MATERIALS SCIENCE</subject><subject>minimally intensive layer delamination (MILD)</subject><subject>MXene</subject><subject>vacancy</subject><issn>1936-0851</issn><issn>1936-086X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNp1kDtrwzAURkVpadLH3K2ITinFiWRLsrwUgvuEhC4uZBOyIlOFWEotG5p_XwW72TrdO5z78d0DwA1GU4xiPJPKW2ndlJWIxgSdgDHOEhYhzlanx53iEbjwfoMQTXnKzsEoTmnGk5iNweO8dbVR8ElXWrUeGguXzrqt3OsGFqaV1nQ1zGVTmrWGk8IkeVzAH3gPlytt9RU4q-TW6-thXoLPl-cif4sWH6_v-XwRSZqkbRQrlSqmKs40xpSlhGNCJSGYoVIhXWahWYwTLlNUsVCTlJiS8F9GONdrjpJLcNfnOt8a4ZVptfpSztpQWuAkIYTTAE16aNe47077VtTGK73dSqtd5wXmNEvjDKND3qxHVeO8b3Qldo2pZbMXGImDWTGYFYPZcHE7hHdlrddH_k9lAB56IFyKjesaG4T8G_cLlHB_cQ</recordid><startdate>20161025</startdate><enddate>20161025</enddate><creator>Sang, Xiahan</creator><creator>Xie, Yu</creator><creator>Lin, Ming-Wei</creator><creator>Alhabeb, Mohamed</creator><creator>Van Aken, Katherine L</creator><creator>Gogotsi, Yury</creator><creator>Kent, Paul R. 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C</creatorcontrib><creatorcontrib>Xiao, Kai</creatorcontrib><creatorcontrib>Unocic, Raymond R</creatorcontrib><creatorcontrib>Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</creatorcontrib><creatorcontrib>Energy Frontier Research Centers (EFRC) (United States). Fluid Interface Reactions, Structures and Transport Center (FIRST)</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>OSTI.GOV - Hybrid</collection><collection>OSTI.GOV</collection><jtitle>ACS nano</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sang, Xiahan</au><au>Xie, Yu</au><au>Lin, Ming-Wei</au><au>Alhabeb, Mohamed</au><au>Van Aken, Katherine L</au><au>Gogotsi, Yury</au><au>Kent, Paul R. C</au><au>Xiao, Kai</au><au>Unocic, Raymond R</au><aucorp>Oak Ridge National Lab. 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| subjects | conductivity defect INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY MATERIALS SCIENCE minimally intensive layer delamination (MILD) MXene vacancy |
| title | Atomic Defects in Monolayer Titanium Carbide (Ti3C2T x ) MXene |
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