Nanoscale measurements of local junction breakdown in epitaxial film silicon solar cells

In this contribution, the authors report on near-field scanning optical microscopy measurements of the luminescence emitted from localized junction breakdown in epitaxial silicon solar cells. Our measurements suggest that the observed local reduction in breakdown voltage results from avalanche multi...

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Veröffentlicht in:	Applied physics letters 2010-08, Vol.97 (9), p.092107-092107-3
Hauptverfasser:	Romero, M. J., Alberi, K., Martin, I. T., Jones, K. M., Young, D. L., Yan, Y., Teplin, C., Al-Jassim, M. M., Stradins, P., Branz, H. M.
Format:	Artikel
Sprache:	eng
Schlagworte:	cell efficiency device performance MATERIALS SCIENCE solar cells SOLAR ENERGY
Online-Zugang:	Volltext
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