On the thermal stability of physical vapor deposited oxide-hardened nanocrystalline gold thin films

We describe a correlation between electrical resistivity and grain size for PVD synthesized polycrystalline oxide-hardened metal-matrix thin films in oxide-dilute (

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Bibliographische Detailangaben
Veröffentlicht in:	Journal of applied physics 2015-04, Vol.117 (14)
Hauptverfasser:	Argibay, N., Mogonye, J. E., Michael, J. R., Goeke, R. S., Kotula, P. G., Scharf, T. W., Dugger, M. T., Prasad, S. V.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Au Composition Correlation Dilution e-beam EBSD Electrical resistivity Electron diffraction electron scattering Gold Grain boundaries Grain refinement Grain size Hall-Petch hardness MATERIALS SCIENCE Mayadas-Shatzkes metallic thin films nanocomposites ODS Percolation Physical vapor deposition SEM Size determination Size reduction TEM Thermal stability Thick films Thin films TKD Transmission electron microscopy Zinc oxide zinc oxide films ZnO
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Beschreibung
Zusammenfassung:	We describe a correlation between electrical resistivity and grain size for PVD synthesized polycrystalline oxide-hardened metal-matrix thin films in oxide-dilute (
ISSN:	0021-8979 1089-7550
DOI:	10.1063/1.4915922