A high temperature apparatus for measurement of the Seebeck coefficient
A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a hig...
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Veröffentlicht in: | Review of scientific instruments 2011-06, Vol.82 (6), p.063905-063905-6 |
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container_title | Review of scientific instruments |
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creator | Iwanaga, Shiho Toberer, Eric S. LaLonde, Aaron Snyder, G. Jeffrey |
description | A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes. |
doi_str_mv | 10.1063/1.3601358 |
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fullrecord | <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_1211297</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>874895119</sourcerecordid><originalsourceid>FETCH-LOGICAL-c467t-dc4ce13070cc9e5c710ee9370cb4c3c3b794408438c544a09dbaba2df30ae41a3</originalsourceid><addsrcrecordid>eNp1kEFLwzAUx4Mobk4PfgEJXsRDZ9JkTXsRxtApDDyo55C-vbrq2tQkPfjtTdkULz4evOTlx5_wI-ScsylnmbjhU5ExLmb5ARlzlheJylJxSMaMCZlkSuYjcuL9O4s14_yYjFKuYjM1Jss53dRvGxqw6dCZ0DukpuvMcPS0so42aHzcNtgGaisaNkifEUuEDwoWq6qGOj6dkqPKbD2e7eeEvN7fvSwektXT8nExXyUgMxWSNUhALphiAAXOQHGGWIh4LSUIEKUqpGS5FDnMpDSsWJemNOm6Esyg5EZMyOUu1_pQaw91QNiAbVuEoHnKeVqoCF3toM7Zzx590E3tAbdb06Ltvc6jkiKaKCJ5vSPBWe8dVrpzdWPcl-ZMD24113u3kb3Yp_Zlg-tf8kdmBG53wPAtE2rb_p8214N2_Ue7NuIbT6SISw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>874895119</pqid></control><display><type>article</type><title>A high temperature apparatus for measurement of the Seebeck coefficient</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><source>Alma/SFX Local Collection</source><creator>Iwanaga, Shiho ; Toberer, Eric S. ; LaLonde, Aaron ; Snyder, G. Jeffrey</creator><creatorcontrib>Iwanaga, Shiho ; Toberer, Eric S. ; LaLonde, Aaron ; Snyder, G. Jeffrey</creatorcontrib><description>A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.3601358</identifier><identifier>PMID: 21721707</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>United States: American Institute of Physics</publisher><ispartof>Review of scientific instruments, 2011-06, Vol.82 (6), p.063905-063905-6</ispartof><rights>2011 American Institute of Physics</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c467t-dc4ce13070cc9e5c710ee9370cb4c3c3b794408438c544a09dbaba2df30ae41a3</citedby><cites>FETCH-LOGICAL-c467t-dc4ce13070cc9e5c710ee9370cb4c3c3b794408438c544a09dbaba2df30ae41a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.3601358$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,314,776,780,790,881,1553,4498,27901,27902,76127,76133</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/21721707$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/1211297$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Iwanaga, Shiho</creatorcontrib><creatorcontrib>Toberer, Eric S.</creatorcontrib><creatorcontrib>LaLonde, Aaron</creatorcontrib><creatorcontrib>Snyder, G. Jeffrey</creatorcontrib><title>A high temperature apparatus for measurement of the Seebeck coefficient</title><title>Review of scientific instruments</title><addtitle>Rev Sci Instrum</addtitle><description>A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.</description><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp1kEFLwzAUx4Mobk4PfgEJXsRDZ9JkTXsRxtApDDyo55C-vbrq2tQkPfjtTdkULz4evOTlx5_wI-ScsylnmbjhU5ExLmb5ARlzlheJylJxSMaMCZlkSuYjcuL9O4s14_yYjFKuYjM1Jss53dRvGxqw6dCZ0DukpuvMcPS0so42aHzcNtgGaisaNkifEUuEDwoWq6qGOj6dkqPKbD2e7eeEvN7fvSwektXT8nExXyUgMxWSNUhALphiAAXOQHGGWIh4LSUIEKUqpGS5FDnMpDSsWJemNOm6Esyg5EZMyOUu1_pQaw91QNiAbVuEoHnKeVqoCF3toM7Zzx590E3tAbdb06Ltvc6jkiKaKCJ5vSPBWe8dVrpzdWPcl-ZMD24113u3kb3Yp_Zlg-tf8kdmBG53wPAtE2rb_p8214N2_Ue7NuIbT6SISw</recordid><startdate>20110601</startdate><enddate>20110601</enddate><creator>Iwanaga, Shiho</creator><creator>Toberer, Eric S.</creator><creator>LaLonde, Aaron</creator><creator>Snyder, G. Jeffrey</creator><general>American Institute of Physics</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>OTOTI</scope></search><sort><creationdate>20110601</creationdate><title>A high temperature apparatus for measurement of the Seebeck coefficient</title><author>Iwanaga, Shiho ; Toberer, Eric S. ; LaLonde, Aaron ; Snyder, G. Jeffrey</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c467t-dc4ce13070cc9e5c710ee9370cb4c3c3b794408438c544a09dbaba2df30ae41a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Iwanaga, Shiho</creatorcontrib><creatorcontrib>Toberer, Eric S.</creatorcontrib><creatorcontrib>LaLonde, Aaron</creatorcontrib><creatorcontrib>Snyder, G. Jeffrey</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>OSTI.GOV</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Iwanaga, Shiho</au><au>Toberer, Eric S.</au><au>LaLonde, Aaron</au><au>Snyder, G. Jeffrey</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A high temperature apparatus for measurement of the Seebeck coefficient</atitle><jtitle>Review of scientific instruments</jtitle><addtitle>Rev Sci Instrum</addtitle><date>2011-06-01</date><risdate>2011</risdate><volume>82</volume><issue>6</issue><spage>063905</spage><epage>063905-6</epage><pages>063905-063905-6</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.</abstract><cop>United States</cop><pub>American Institute of Physics</pub><pmid>21721707</pmid><doi>10.1063/1.3601358</doi><tpages>1</tpages><oa>free_for_read</oa></addata></record> |
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source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
title | A high temperature apparatus for measurement of the Seebeck coefficient |
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