A high temperature apparatus for measurement of the Seebeck coefficient

A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a hig...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Review of scientific instruments 2011-06, Vol.82 (6), p.063905-063905-6
Hauptverfasser: Iwanaga, Shiho, Toberer, Eric S., LaLonde, Aaron, Snyder, G. Jeffrey
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 063905-6
container_issue 6
container_start_page 063905
container_title Review of scientific instruments
container_volume 82
creator Iwanaga, Shiho
Toberer, Eric S.
LaLonde, Aaron
Snyder, G. Jeffrey
description A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.
doi_str_mv 10.1063/1.3601358
format Article
fullrecord <record><control><sourceid>proquest_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_1211297</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>874895119</sourcerecordid><originalsourceid>FETCH-LOGICAL-c467t-dc4ce13070cc9e5c710ee9370cb4c3c3b794408438c544a09dbaba2df30ae41a3</originalsourceid><addsrcrecordid>eNp1kEFLwzAUx4Mobk4PfgEJXsRDZ9JkTXsRxtApDDyo55C-vbrq2tQkPfjtTdkULz4evOTlx5_wI-ScsylnmbjhU5ExLmb5ARlzlheJylJxSMaMCZlkSuYjcuL9O4s14_yYjFKuYjM1Jss53dRvGxqw6dCZ0DukpuvMcPS0so42aHzcNtgGaisaNkifEUuEDwoWq6qGOj6dkqPKbD2e7eeEvN7fvSwektXT8nExXyUgMxWSNUhALphiAAXOQHGGWIh4LSUIEKUqpGS5FDnMpDSsWJemNOm6Esyg5EZMyOUu1_pQaw91QNiAbVuEoHnKeVqoCF3toM7Zzx590E3tAbdb06Ltvc6jkiKaKCJ5vSPBWe8dVrpzdWPcl-ZMD24113u3kb3Yp_Zlg-tf8kdmBG53wPAtE2rb_p8214N2_Ue7NuIbT6SISw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>874895119</pqid></control><display><type>article</type><title>A high temperature apparatus for measurement of the Seebeck coefficient</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><source>Alma/SFX Local Collection</source><creator>Iwanaga, Shiho ; Toberer, Eric S. ; LaLonde, Aaron ; Snyder, G. Jeffrey</creator><creatorcontrib>Iwanaga, Shiho ; Toberer, Eric S. ; LaLonde, Aaron ; Snyder, G. Jeffrey</creatorcontrib><description>A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.3601358</identifier><identifier>PMID: 21721707</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>United States: American Institute of Physics</publisher><ispartof>Review of scientific instruments, 2011-06, Vol.82 (6), p.063905-063905-6</ispartof><rights>2011 American Institute of Physics</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c467t-dc4ce13070cc9e5c710ee9370cb4c3c3b794408438c544a09dbaba2df30ae41a3</citedby><cites>FETCH-LOGICAL-c467t-dc4ce13070cc9e5c710ee9370cb4c3c3b794408438c544a09dbaba2df30ae41a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.3601358$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,314,776,780,790,881,1553,4498,27901,27902,76127,76133</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/21721707$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://www.osti.gov/biblio/1211297$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Iwanaga, Shiho</creatorcontrib><creatorcontrib>Toberer, Eric S.</creatorcontrib><creatorcontrib>LaLonde, Aaron</creatorcontrib><creatorcontrib>Snyder, G. Jeffrey</creatorcontrib><title>A high temperature apparatus for measurement of the Seebeck coefficient</title><title>Review of scientific instruments</title><addtitle>Rev Sci Instrum</addtitle><description>A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.</description><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNp1kEFLwzAUx4Mobk4PfgEJXsRDZ9JkTXsRxtApDDyo55C-vbrq2tQkPfjtTdkULz4evOTlx5_wI-ScsylnmbjhU5ExLmb5ARlzlheJylJxSMaMCZlkSuYjcuL9O4s14_yYjFKuYjM1Jss53dRvGxqw6dCZ0DukpuvMcPS0so42aHzcNtgGaisaNkifEUuEDwoWq6qGOj6dkqPKbD2e7eeEvN7fvSwektXT8nExXyUgMxWSNUhALphiAAXOQHGGWIh4LSUIEKUqpGS5FDnMpDSsWJemNOm6Esyg5EZMyOUu1_pQaw91QNiAbVuEoHnKeVqoCF3toM7Zzx590E3tAbdb06Ltvc6jkiKaKCJ5vSPBWe8dVrpzdWPcl-ZMD24113u3kb3Yp_Zlg-tf8kdmBG53wPAtE2rb_p8214N2_Ue7NuIbT6SISw</recordid><startdate>20110601</startdate><enddate>20110601</enddate><creator>Iwanaga, Shiho</creator><creator>Toberer, Eric S.</creator><creator>LaLonde, Aaron</creator><creator>Snyder, G. Jeffrey</creator><general>American Institute of Physics</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>OTOTI</scope></search><sort><creationdate>20110601</creationdate><title>A high temperature apparatus for measurement of the Seebeck coefficient</title><author>Iwanaga, Shiho ; Toberer, Eric S. ; LaLonde, Aaron ; Snyder, G. Jeffrey</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c467t-dc4ce13070cc9e5c710ee9370cb4c3c3b794408438c544a09dbaba2df30ae41a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Iwanaga, Shiho</creatorcontrib><creatorcontrib>Toberer, Eric S.</creatorcontrib><creatorcontrib>LaLonde, Aaron</creatorcontrib><creatorcontrib>Snyder, G. Jeffrey</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>OSTI.GOV</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Iwanaga, Shiho</au><au>Toberer, Eric S.</au><au>LaLonde, Aaron</au><au>Snyder, G. Jeffrey</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A high temperature apparatus for measurement of the Seebeck coefficient</atitle><jtitle>Review of scientific instruments</jtitle><addtitle>Rev Sci Instrum</addtitle><date>2011-06-01</date><risdate>2011</risdate><volume>82</volume><issue>6</issue><spage>063905</spage><epage>063905-6</epage><pages>063905-063905-6</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.</abstract><cop>United States</cop><pub>American Institute of Physics</pub><pmid>21721707</pmid><doi>10.1063/1.3601358</doi><tpages>1</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 0034-6748
ispartof Review of scientific instruments, 2011-06, Vol.82 (6), p.063905-063905-6
issn 0034-6748
1089-7623
language eng
recordid cdi_osti_scitechconnect_1211297
source AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection
title A high temperature apparatus for measurement of the Seebeck coefficient
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T04%3A16%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20high%20temperature%20apparatus%20for%20measurement%20of%20the%20Seebeck%20coefficient&rft.jtitle=Review%20of%20scientific%20instruments&rft.au=Iwanaga,%20Shiho&rft.date=2011-06-01&rft.volume=82&rft.issue=6&rft.spage=063905&rft.epage=063905-6&rft.pages=063905-063905-6&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/1.3601358&rft_dat=%3Cproquest_osti_%3E874895119%3C/proquest_osti_%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=874895119&rft_id=info:pmid/21721707&rfr_iscdi=true