How TEM Projection Artifacts Distort Microstructure Measurements: A Case Study in a 9 pct Cr-Mo-V Steel

Morphological data obtained from two-dimensional (2D) and three-dimensional (3D) transmission electron microscopy (TEM) observations were compared to assess the effects of TEM projection errors for submicron-size precipitates. The microstructure consisted of M 23 C 6 carbides in a 9 pct Cr-Mo-V heat...

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Veröffentlicht in:Metallurgical and materials transactions. A, Physical metallurgy and materials science Physical metallurgy and materials science, 2014-08, Vol.45 (9), p.3708-3713
Hauptverfasser: Monsegue, Niven, Reynolds, William T., Hawk, Jeffrey A., Murayama, Mitsuhiro
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container_issue 9
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container_title Metallurgical and materials transactions. A, Physical metallurgy and materials science
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creator Monsegue, Niven
Reynolds, William T.
Hawk, Jeffrey A.
Murayama, Mitsuhiro
description Morphological data obtained from two-dimensional (2D) and three-dimensional (3D) transmission electron microscopy (TEM) observations were compared to assess the effects of TEM projection errors for submicron-size precipitates. The microstructure consisted of M 23 C 6 carbides in a 9 pct Cr-Mo-V heat resistant steel before and after exposure to creep conditions. Measurements obtained from about 800 carbides demonstrate that particle size and spacing estimates made from 2D observations overestimate the more accurate values obtained from 3D reconstructions. The 3D analysis also revealed the M 23 C 6 precipitates lengthen anisotropically along lath boundary planes, suggesting that coarsening during the early stage of creep in this alloy system is governed by grain boundary diffusion.
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subjects Applied sciences
Carbides
Characterization and Evaluation of Materials
Chemistry and Materials Science
Chromium
Communication
Creep (materials)
Exact sciences and technology
Materials Science
Metallic Materials
Metallurgy
Metals. Metallurgy
Microstructure
Nanotechnology
Precipitates
Projection
Steel alloys
Structural Materials
Surfaces and Interfaces
Thin Films
Three dimensional
Transmission electron microscopy
Two dimensional
title How TEM Projection Artifacts Distort Microstructure Measurements: A Case Study in a 9 pct Cr-Mo-V Steel
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