VERY LOW FREQUENCY BREAKDOWN PROPERTIES OF ELECTRICAL INSULATION MATERIALS AT CRYOGENIC TEMPERATURES

For long cables or equipment with large capacitance it is not always possible to conduct high voltage withstand at tests at 60 Hz due to limitations in charging currents of the power supply. Very low frequency (typically at a frequency of 0.1 Hz) has been used for conventional cables as a way of get...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Sauers, Isidor, Tuncer, Enis, Polyzos, Georgios, James, David Randy, Ellis, Alvin R., Pace, Marshall
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Sauers, Isidor
Tuncer, Enis
Polyzos, Georgios
James, David Randy
Ellis, Alvin R.
Pace, Marshall
description For long cables or equipment with large capacitance it is not always possible to conduct high voltage withstand at tests at 60 Hz due to limitations in charging currents of the power supply. Very low frequency (typically at a frequency of 0.1 Hz) has been used for conventional cables as a way of getting around the charging current limitation. For superconducting grid applications the same issues apply. However there is very little data at cryogenic temperatures on how materials perform at low frequency compared to 60 Hz and whether higher voltages should be applied when performing a high voltage acceptability test. Various materials including G10 (fiberglass reinforced plastic or FRP), Cryoflex™ (a tape insulation used in some high temperature superconducting cables), kapton (commonly used polyimide), polycarbonate, and polyetherimide, and in liquid nitrogen alone have been tested using a step method for frequencies of 60 Hz, 0.1 Hz, and dc. The dwell time at each step was chosen so that the aging factor would be the same in both the 60 Hz and 0.1 Hz tests. The data indicated that, while there is a small frequency dependence for liquid nitrogen, there are significant differences for the solid materials studied. Breakdown data for these materials and for model cables will be shown and discussed.
doi_str_mv 10.1063/1.3402335
format Conference Proceeding
fullrecord <record><control><sourceid>osti</sourceid><recordid>TN_cdi_osti_scitechconnect_1052236</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1052236</sourcerecordid><originalsourceid>FETCH-osti_scitechconnect_10522363</originalsourceid><addsrcrecordid>eNqNy7tOwzAUgGELFYkUOvAGR-wpvuRCR2NOwMK1y4nTkqlCIYgi1A7O-wsGHoDpX76fsWvBl4JX6lYsVcGlUuUZy0RZiryuRDVjGeerIpeFer1g85S-OJerur7L2PsWqQcXdtAQvnToTQ_3hPr5Iew8bChskKLFFkID6NBEskY7sL7tnI42eFjriGS1a0FHMNSHR_TWQMT176pjR9hesfOPt-80Lv56yW4ajOYpP6XpsE_DYRqHz-F0PI7DtBe8lFJV6l_oB-fnQdA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>VERY LOW FREQUENCY BREAKDOWN PROPERTIES OF ELECTRICAL INSULATION MATERIALS AT CRYOGENIC TEMPERATURES</title><source>AIP Journals Complete</source><creator>Sauers, Isidor ; Tuncer, Enis ; Polyzos, Georgios ; James, David Randy ; Ellis, Alvin R. ; Pace, Marshall</creator><creatorcontrib>Sauers, Isidor ; Tuncer, Enis ; Polyzos, Georgios ; James, David Randy ; Ellis, Alvin R. ; Pace, Marshall ; Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</creatorcontrib><description>For long cables or equipment with large capacitance it is not always possible to conduct high voltage withstand at tests at 60 Hz due to limitations in charging currents of the power supply. Very low frequency (typically at a frequency of 0.1 Hz) has been used for conventional cables as a way of getting around the charging current limitation. For superconducting grid applications the same issues apply. However there is very little data at cryogenic temperatures on how materials perform at low frequency compared to 60 Hz and whether higher voltages should be applied when performing a high voltage acceptability test. Various materials including G10 (fiberglass reinforced plastic or FRP), Cryoflex™ (a tape insulation used in some high temperature superconducting cables), kapton (commonly used polyimide), polycarbonate, and polyetherimide, and in liquid nitrogen alone have been tested using a step method for frequencies of 60 Hz, 0.1 Hz, and dc. The dwell time at each step was chosen so that the aging factor would be the same in both the 60 Hz and 0.1 Hz tests. The data indicated that, while there is a small frequency dependence for liquid nitrogen, there are significant differences for the solid materials studied. Breakdown data for these materials and for model cables will be shown and discussed.</description><identifier>ISSN: 0094-243X</identifier><identifier>EISSN: 1551-7616</identifier><identifier>DOI: 10.1063/1.3402335</identifier><language>eng</language><publisher>United States</publisher><subject>cryogenic dielectric ; dc ; high voltage breakdown ; liquid nitrogen ; Very low frequency ; VLF</subject><creationdate>2010</creationdate><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><orcidid>0000000214212501</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,309,776,780,785,881,23909,27902</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/1052236$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Sauers, Isidor</creatorcontrib><creatorcontrib>Tuncer, Enis</creatorcontrib><creatorcontrib>Polyzos, Georgios</creatorcontrib><creatorcontrib>James, David Randy</creatorcontrib><creatorcontrib>Ellis, Alvin R.</creatorcontrib><creatorcontrib>Pace, Marshall</creatorcontrib><creatorcontrib>Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</creatorcontrib><title>VERY LOW FREQUENCY BREAKDOWN PROPERTIES OF ELECTRICAL INSULATION MATERIALS AT CRYOGENIC TEMPERATURES</title><description>For long cables or equipment with large capacitance it is not always possible to conduct high voltage withstand at tests at 60 Hz due to limitations in charging currents of the power supply. Very low frequency (typically at a frequency of 0.1 Hz) has been used for conventional cables as a way of getting around the charging current limitation. For superconducting grid applications the same issues apply. However there is very little data at cryogenic temperatures on how materials perform at low frequency compared to 60 Hz and whether higher voltages should be applied when performing a high voltage acceptability test. Various materials including G10 (fiberglass reinforced plastic or FRP), Cryoflex™ (a tape insulation used in some high temperature superconducting cables), kapton (commonly used polyimide), polycarbonate, and polyetherimide, and in liquid nitrogen alone have been tested using a step method for frequencies of 60 Hz, 0.1 Hz, and dc. The dwell time at each step was chosen so that the aging factor would be the same in both the 60 Hz and 0.1 Hz tests. The data indicated that, while there is a small frequency dependence for liquid nitrogen, there are significant differences for the solid materials studied. Breakdown data for these materials and for model cables will be shown and discussed.</description><subject>cryogenic dielectric</subject><subject>dc</subject><subject>high voltage breakdown</subject><subject>liquid nitrogen</subject><subject>Very low frequency</subject><subject>VLF</subject><issn>0094-243X</issn><issn>1551-7616</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNqNy7tOwzAUgGELFYkUOvAGR-wpvuRCR2NOwMK1y4nTkqlCIYgi1A7O-wsGHoDpX76fsWvBl4JX6lYsVcGlUuUZy0RZiryuRDVjGeerIpeFer1g85S-OJerur7L2PsWqQcXdtAQvnToTQ_3hPr5Iew8bChskKLFFkID6NBEskY7sL7tnI42eFjriGS1a0FHMNSHR_TWQMT176pjR9hesfOPt-80Lv56yW4ajOYpP6XpsE_DYRqHz-F0PI7DtBe8lFJV6l_oB-fnQdA</recordid><startdate>20100601</startdate><enddate>20100601</enddate><creator>Sauers, Isidor</creator><creator>Tuncer, Enis</creator><creator>Polyzos, Georgios</creator><creator>James, David Randy</creator><creator>Ellis, Alvin R.</creator><creator>Pace, Marshall</creator><scope>OTOTI</scope><orcidid>https://orcid.org/0000000214212501</orcidid></search><sort><creationdate>20100601</creationdate><title>VERY LOW FREQUENCY BREAKDOWN PROPERTIES OF ELECTRICAL INSULATION MATERIALS AT CRYOGENIC TEMPERATURES</title><author>Sauers, Isidor ; Tuncer, Enis ; Polyzos, Georgios ; James, David Randy ; Ellis, Alvin R. ; Pace, Marshall</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-osti_scitechconnect_10522363</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>cryogenic dielectric</topic><topic>dc</topic><topic>high voltage breakdown</topic><topic>liquid nitrogen</topic><topic>Very low frequency</topic><topic>VLF</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sauers, Isidor</creatorcontrib><creatorcontrib>Tuncer, Enis</creatorcontrib><creatorcontrib>Polyzos, Georgios</creatorcontrib><creatorcontrib>James, David Randy</creatorcontrib><creatorcontrib>Ellis, Alvin R.</creatorcontrib><creatorcontrib>Pace, Marshall</creatorcontrib><creatorcontrib>Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</creatorcontrib><collection>OSTI.GOV</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sauers, Isidor</au><au>Tuncer, Enis</au><au>Polyzos, Georgios</au><au>James, David Randy</au><au>Ellis, Alvin R.</au><au>Pace, Marshall</au><aucorp>Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)</aucorp><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>VERY LOW FREQUENCY BREAKDOWN PROPERTIES OF ELECTRICAL INSULATION MATERIALS AT CRYOGENIC TEMPERATURES</atitle><date>2010-06-01</date><risdate>2010</risdate><issn>0094-243X</issn><eissn>1551-7616</eissn><abstract>For long cables or equipment with large capacitance it is not always possible to conduct high voltage withstand at tests at 60 Hz due to limitations in charging currents of the power supply. Very low frequency (typically at a frequency of 0.1 Hz) has been used for conventional cables as a way of getting around the charging current limitation. For superconducting grid applications the same issues apply. However there is very little data at cryogenic temperatures on how materials perform at low frequency compared to 60 Hz and whether higher voltages should be applied when performing a high voltage acceptability test. Various materials including G10 (fiberglass reinforced plastic or FRP), Cryoflex™ (a tape insulation used in some high temperature superconducting cables), kapton (commonly used polyimide), polycarbonate, and polyetherimide, and in liquid nitrogen alone have been tested using a step method for frequencies of 60 Hz, 0.1 Hz, and dc. The dwell time at each step was chosen so that the aging factor would be the same in both the 60 Hz and 0.1 Hz tests. The data indicated that, while there is a small frequency dependence for liquid nitrogen, there are significant differences for the solid materials studied. Breakdown data for these materials and for model cables will be shown and discussed.</abstract><cop>United States</cop><doi>10.1063/1.3402335</doi><orcidid>https://orcid.org/0000000214212501</orcidid></addata></record>
fulltext fulltext
identifier ISSN: 0094-243X
ispartof
issn 0094-243X
1551-7616
language eng
recordid cdi_osti_scitechconnect_1052236
source AIP Journals Complete
subjects cryogenic dielectric
dc
high voltage breakdown
liquid nitrogen
Very low frequency
VLF
title VERY LOW FREQUENCY BREAKDOWN PROPERTIES OF ELECTRICAL INSULATION MATERIALS AT CRYOGENIC TEMPERATURES
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T00%3A36%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-osti&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=VERY%20LOW%20FREQUENCY%20BREAKDOWN%20PROPERTIES%20OF%20ELECTRICAL%20INSULATION%20MATERIALS%20AT%20CRYOGENIC%20TEMPERATURES&rft.au=Sauers,%20Isidor&rft.aucorp=Oak%20Ridge%20National%20Lab.%20(ORNL),%20Oak%20Ridge,%20TN%20(United%20States)&rft.date=2010-06-01&rft.issn=0094-243X&rft.eissn=1551-7616&rft_id=info:doi/10.1063/1.3402335&rft_dat=%3Costi%3E1052236%3C/osti%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true