Interface and electronic characterization of thin epitaxial Co3O4 films

The interface and electronic structure of thin (20-74 nm) Co3O4(1 1 0) epitaxial films grown by oxygen-assisted molecular beam epitaxy on MgAl2O4(1 1 0) single crystal substrates have been investigated by means of real and reciprocal space techniques. As-grown film surfaces are found to be relativel...

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Veröffentlicht in:	Surface science 2009-01, Vol.603 (2), p.291-297
Hauptverfasser:	VAZ, C. A. F, WANG, H.-Q, ZHU, Y, WANG, J, ALTMAN, E. I, AHN, C. H, HENRICH, V. E, BAYKARA, M. Z, SCHWENDEMANN, T. C, PILET, N, ALBERS, B. J, SCHWARZ, U. D, ZHANG, L. H
Format:	Artikel
Sprache:	eng
Schlagworte:	AIR ANNEALING ATOMIC FORCE MICROSCOPY Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology ELECTRON DIFFRACTION ELECTRONIC STRUCTURE Exact sciences and technology functional nanomaterials MATERIALS SCIENCE MOLECULAR BEAM EPITAXY MONOCRYSTALS nanoscience NANOSCIENCE AND NANOTECHNOLOGY nanotechnology Physics STOICHIOMETRY SUBSTRATES
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