Effect of Yttria Content on the Zirconia Unit Cell Parameters
The relationship between yttria concentration and the unit cell parameters in partially and fully stabilized zirconia has been reassessed, motivated by the need to improve the accuracy of phase analysis upon decomposition of t′‐based thermal barrier coatings. Compositions ranging from 6 to 18 mol% Y...
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| Veröffentlicht in: | Journal of the American Ceramic Society 2011-12, Vol.94 (12), p.4548-4555 |
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| creator | Krogstad, Jessica A. Lepple, Maren Gao, Yan Lipkin, Don M. Levi, Carlos G. |
| description | The relationship between yttria concentration and the unit cell parameters in partially and fully stabilized zirconia has been reassessed, motivated by the need to improve the accuracy of phase analysis upon decomposition of t′‐based thermal barrier coatings. Compositions ranging from 6 to 18 mol% YO1.5 were synthesized and examined by means of high‐resolution X‐ray diffraction. Lattice parameters were determined using the Rietveld refinement method, a whole‐pattern fitting procedure. The revised empirical relationships fall within the range of those published previously. However, efforts to achieve superior homogeneity of the materials, as well as accuracy of the composition and lattice parameters, provide increased confidence in the reliability of these correlations for use in future studies. Additional insight into the potential sources for scatter previously reported for the transition region (~12–14 mol% YO1.5), where tetragonal and cubic phases have been observed to coexist, is also provided. Implications on the current understanding of stabilization mechanisms in zirconia are discussed. |
| doi_str_mv | 10.1111/j.1551-2916.2011.04862.x |
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J. ; Green, D. J.</contributor><creatorcontrib>Krogstad, Jessica A. ; Lepple, Maren ; Gao, Yan ; Lipkin, Don M. ; Levi, Carlos G. ; Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS) ; Green, D. J. ; Green, D. J.</creatorcontrib><description>The relationship between yttria concentration and the unit cell parameters in partially and fully stabilized zirconia has been reassessed, motivated by the need to improve the accuracy of phase analysis upon decomposition of t′‐based thermal barrier coatings. Compositions ranging from 6 to 18 mol% YO1.5 were synthesized and examined by means of high‐resolution X‐ray diffraction. Lattice parameters were determined using the Rietveld refinement method, a whole‐pattern fitting procedure. The revised empirical relationships fall within the range of those published previously. However, efforts to achieve superior homogeneity of the materials, as well as accuracy of the composition and lattice parameters, provide increased confidence in the reliability of these correlations for use in future studies. Additional insight into the potential sources for scatter previously reported for the transition region (~12–14 mol% YO1.5), where tetragonal and cubic phases have been observed to coexist, is also provided. Implications on the current understanding of stabilization mechanisms in zirconia are discussed.</description><identifier>ISSN: 0002-7820</identifier><identifier>EISSN: 1551-2916</identifier><identifier>DOI: 10.1111/j.1551-2916.2011.04862.x</identifier><identifier>CODEN: JACTAW</identifier><language>eng</language><publisher>Columbus: Blackwell Publishing Ltd</publisher><subject>ACCURACY ; Ceramics ; COATINGS ; Confidence ; Confidence intervals ; Crystals ; Diffraction ; Fittings ; Homogeneity ; LATTICE PARAMETERS ; MATERIALS SCIENCE ; Phase transitions ; Protective coatings ; RELIABILITY ; STABILIZATION ; THERMAL BARRIERS ; Unit cell ; X-RAY DIFFRACTION ; Yttrium oxide ; Zirconium dioxide</subject><ispartof>Journal of the American Ceramic Society, 2011-12, Vol.94 (12), p.4548-4555</ispartof><rights>2011 The American Ceramic Society</rights><rights>Copyright American Ceramic Society Dec 2011</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c5712-9b04490ef1b370b5da2412e8e3898cff24bd5098f05ed970bf1042c0ccffcab83</citedby><cites>FETCH-LOGICAL-c5712-9b04490ef1b370b5da2412e8e3898cff24bd5098f05ed970bf1042c0ccffcab83</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1111%2Fj.1551-2916.2011.04862.x$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1111%2Fj.1551-2916.2011.04862.x$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>230,314,780,784,885,1417,27924,27925,45574,45575</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/1030835$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><contributor>Green, D. J.</contributor><contributor>Green, D. J.</contributor><creatorcontrib>Krogstad, Jessica A.</creatorcontrib><creatorcontrib>Lepple, Maren</creatorcontrib><creatorcontrib>Gao, Yan</creatorcontrib><creatorcontrib>Lipkin, Don M.</creatorcontrib><creatorcontrib>Levi, Carlos G.</creatorcontrib><creatorcontrib>Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)</creatorcontrib><title>Effect of Yttria Content on the Zirconia Unit Cell Parameters</title><title>Journal of the American Ceramic Society</title><addtitle>J. Am. Ceram. Soc</addtitle><description>The relationship between yttria concentration and the unit cell parameters in partially and fully stabilized zirconia has been reassessed, motivated by the need to improve the accuracy of phase analysis upon decomposition of t′‐based thermal barrier coatings. Compositions ranging from 6 to 18 mol% YO1.5 were synthesized and examined by means of high‐resolution X‐ray diffraction. Lattice parameters were determined using the Rietveld refinement method, a whole‐pattern fitting procedure. The revised empirical relationships fall within the range of those published previously. However, efforts to achieve superior homogeneity of the materials, as well as accuracy of the composition and lattice parameters, provide increased confidence in the reliability of these correlations for use in future studies. Additional insight into the potential sources for scatter previously reported for the transition region (~12–14 mol% YO1.5), where tetragonal and cubic phases have been observed to coexist, is also provided. Implications on the current understanding of stabilization mechanisms in zirconia are discussed.</description><subject>ACCURACY</subject><subject>Ceramics</subject><subject>COATINGS</subject><subject>Confidence</subject><subject>Confidence intervals</subject><subject>Crystals</subject><subject>Diffraction</subject><subject>Fittings</subject><subject>Homogeneity</subject><subject>LATTICE PARAMETERS</subject><subject>MATERIALS SCIENCE</subject><subject>Phase transitions</subject><subject>Protective coatings</subject><subject>RELIABILITY</subject><subject>STABILIZATION</subject><subject>THERMAL BARRIERS</subject><subject>Unit cell</subject><subject>X-RAY DIFFRACTION</subject><subject>Yttrium oxide</subject><subject>Zirconium dioxide</subject><issn>0002-7820</issn><issn>1551-2916</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNqNUU1v1DAUtBCVWFr-Q8SJS4KfHSf2AaQqWvqhVUGCqoLLk-O1VS-7SbG9YvvvcRq04kZ9sf3ezHj8hpACaAV5vd9UIASUTEFTMQpQ0Vo2rDq8IItj4yVZUEpZ2UpGX5HXMW7yFZSsF-TD0jlrUjG64ntKweuiG4dkh1wZinRvix8-mHHI9dvBp6Kz223xRQe9s8mGeEZOnN5G--bvfkpuPy2_dZfl6vPFVXe-Ko1ogZWqp3WtqHXQ85b2Yq1ZDcxKy6WSxjlW92tBlXRU2LXKCAe0Zoaa3DO6l_yUvJ11x5g8RuOTNffZ1pCtI1BOJRcZ9G4GPYTx197GhDsfTTasBzvuI0KjGAfBa_5_aJ5OI1ij2udAqWwZNP-4PEI34z4MeTCo8u84KD49LWeQCWOMwTp8CH6nw2NWwilR3OAUHE7B4ZQoPiWKh0z9OFN_-619fDYPr8-75XTMAuUs4GOyh6OADj-xaXkr8O7mAsXdV3XZ1YAr_gcXtLJ1</recordid><startdate>201112</startdate><enddate>201112</enddate><creator>Krogstad, Jessica A.</creator><creator>Lepple, Maren</creator><creator>Gao, Yan</creator><creator>Lipkin, Don M.</creator><creator>Levi, Carlos G.</creator><general>Blackwell Publishing Ltd</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>7SR</scope><scope>8FD</scope><scope>JG9</scope><scope>OTOTI</scope></search><sort><creationdate>201112</creationdate><title>Effect of Yttria Content on the Zirconia Unit Cell Parameters</title><author>Krogstad, Jessica A. ; Lepple, Maren ; Gao, Yan ; Lipkin, Don M. ; Levi, Carlos G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c5712-9b04490ef1b370b5da2412e8e3898cff24bd5098f05ed970bf1042c0ccffcab83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>ACCURACY</topic><topic>Ceramics</topic><topic>COATINGS</topic><topic>Confidence</topic><topic>Confidence intervals</topic><topic>Crystals</topic><topic>Diffraction</topic><topic>Fittings</topic><topic>Homogeneity</topic><topic>LATTICE PARAMETERS</topic><topic>MATERIALS SCIENCE</topic><topic>Phase transitions</topic><topic>Protective coatings</topic><topic>RELIABILITY</topic><topic>STABILIZATION</topic><topic>THERMAL BARRIERS</topic><topic>Unit cell</topic><topic>X-RAY DIFFRACTION</topic><topic>Yttrium oxide</topic><topic>Zirconium dioxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Krogstad, Jessica A.</creatorcontrib><creatorcontrib>Lepple, Maren</creatorcontrib><creatorcontrib>Gao, Yan</creatorcontrib><creatorcontrib>Lipkin, Don M.</creatorcontrib><creatorcontrib>Levi, Carlos G.</creatorcontrib><creatorcontrib>Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>OSTI.GOV</collection><jtitle>Journal of the American Ceramic Society</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Krogstad, Jessica A.</au><au>Lepple, Maren</au><au>Gao, Yan</au><au>Lipkin, Don M.</au><au>Levi, Carlos G.</au><au>Green, D. J.</au><au>Green, D. J.</au><aucorp>Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of Yttria Content on the Zirconia Unit Cell Parameters</atitle><jtitle>Journal of the American Ceramic Society</jtitle><addtitle>J. Am. Ceram. Soc</addtitle><date>2011-12</date><risdate>2011</risdate><volume>94</volume><issue>12</issue><spage>4548</spage><epage>4555</epage><pages>4548-4555</pages><issn>0002-7820</issn><eissn>1551-2916</eissn><coden>JACTAW</coden><abstract>The relationship between yttria concentration and the unit cell parameters in partially and fully stabilized zirconia has been reassessed, motivated by the need to improve the accuracy of phase analysis upon decomposition of t′‐based thermal barrier coatings. Compositions ranging from 6 to 18 mol% YO1.5 were synthesized and examined by means of high‐resolution X‐ray diffraction. Lattice parameters were determined using the Rietveld refinement method, a whole‐pattern fitting procedure. The revised empirical relationships fall within the range of those published previously. However, efforts to achieve superior homogeneity of the materials, as well as accuracy of the composition and lattice parameters, provide increased confidence in the reliability of these correlations for use in future studies. Additional insight into the potential sources for scatter previously reported for the transition region (~12–14 mol% YO1.5), where tetragonal and cubic phases have been observed to coexist, is also provided. Implications on the current understanding of stabilization mechanisms in zirconia are discussed.</abstract><cop>Columbus</cop><pub>Blackwell Publishing Ltd</pub><doi>10.1111/j.1551-2916.2011.04862.x</doi><tpages>8</tpages></addata></record> |
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| subjects | ACCURACY Ceramics COATINGS Confidence Confidence intervals Crystals Diffraction Fittings Homogeneity LATTICE PARAMETERS MATERIALS SCIENCE Phase transitions Protective coatings RELIABILITY STABILIZATION THERMAL BARRIERS Unit cell X-RAY DIFFRACTION Yttrium oxide Zirconium dioxide |
| title | Effect of Yttria Content on the Zirconia Unit Cell Parameters |
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