A novel approach to characterizing the surface topography of niobium superconducting radio frequency (SRF) accelerator cavities

▶ Nb for SRF accelerator cavities etched by buffered chemical polish or electropolish. ▶ Topography measured by atomic force microscopy and stylus profilometry. ▶ Data analyzed by power spectral density methods used in optics, a first. ▶ Changes in the PSD reveal details of surface smoothening durin...

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Veröffentlicht in:	Applied surface science 2011-03, Vol.257 (11), p.4781-4786
Hauptverfasser:	Tian, Hui, Ribeill, Guilhem, Xu, Chen, Reece, Charles E., Kelley, Michael J.
Format:	Artikel
Sprache:	eng
Schlagworte:	ACCELERATORS ATOMIC FORCE MICROSCOPY CHEMICAL POLISHING Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology DAMAGE Density ELECTROPOLISHING Exact sciences and technology FOURIER ANALYSIS FUNCTIONS Holes LAYERS MAGNETIC FIELDS Nanostructure NIOBIUM PARTICLE ACCELERATORS Physics Power spectral density QUENCHING RF SYSTEMS ROUGHNESS Spectra SPECTRAL DENSITY SPECTROSCOPY SRF cavities SUPERCONDUCTING CAVITY RESONATORS SUPERCONDUCTIVITY Surface topography SURFACE TREATMENTS SURFACES TOPOGRAPHY
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