NASA Goddard Space Flight Center's Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

Total ionizing dose, displacement damage dose, and single-event effect testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, bipolar devices, and FPGAs.

Bibliographische Detailangaben

Hauptverfasser:	Topper, Alyson D., O'Bryan, Martha V., Casey, Megan C., Lauenstein, Jean-Marie, Stansberry, Scott D., Campola, Michael J., Wilcox, Edward P., Ladbury, Ray L., Berg, Melanie D., Wyrwas, Edward J., Ryder, Kaitlyn L., LaBel, Kenneth A., Pellish, Jonathan A., Majewicz, Peter J., Cochran, Donna J.
Format:	Bild
Sprache:	eng
Schlagworte:	Electronics And Electrical Engineering
Online-Zugang:	Volltext bestellen
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