The design and development of a third generation OSEE instrument
Optically Stimulated Electron Emission (OSEE) has been used to quantify surface contamination in the aerospace community. As advances are made towards the understanding of OSEE, it is desirable to incorporate technological advances with succeeding generations of instrumentation, so that improvements...
Gespeichert in:
| Hauptverfasser: | , , , , , , , , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Perey, D. F. Yost, W. T. Stone, F. D. Welch, C. S. Scales, E. Gasser, E. S. Joe, E. Goodman, T. Pascual, X. Hefner, B. |
| description | Optically Stimulated Electron Emission (OSEE) has been used to quantify surface contamination in the aerospace community. As advances are made towards the understanding of OSEE, it is desirable to incorporate technological advances with succeeding generations of instrumentation, so that improvements in the practical application of OSEE may be disseminated among the user community. Several studies undertaken by Yost, Welch, Abedin and others have expanded the knowledge base related to the underlying principles of OSEE. The conclusions of these studies, together with inputs from the user community were the foundation upon which the development of a third generation OSEE instrument was based. This manuscript describes the significant improvements incorporated into a third generation OSEE instrument as well as the elements unique to its design. |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>nasa_CYI</sourceid><recordid>TN_cdi_nasa_ntrs_19950025379</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>19950025379</sourcerecordid><originalsourceid>FETCH-nasa_ntrs_199500253793</originalsourceid><addsrcrecordid>eNrjZHAIyUhVSEktzkzPU0jMSwEyy1Jz8gtyU_NKFPLTFBIVSjIyi1IU0lPzUosSSzLz8xT8g11dFTLzikuKSkGqeBhY0xJzilN5oTQ3g4yba4izh25eYnFifF5JUXG8oaWlqYGBkamxuaUxAWkAf1EszA</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>The design and development of a third generation OSEE instrument</title><source>NASA Technical Reports Server</source><creator>Perey, D. F. ; Yost, W. T. ; Stone, F. D. ; Welch, C. S. ; Scales, E. ; Gasser, E. S. ; Joe, E. ; Goodman, T. ; Pascual, X. ; Hefner, B.</creator><creatorcontrib>Perey, D. F. ; Yost, W. T. ; Stone, F. D. ; Welch, C. S. ; Scales, E. ; Gasser, E. S. ; Joe, E. ; Goodman, T. ; Pascual, X. ; Hefner, B.</creatorcontrib><description>Optically Stimulated Electron Emission (OSEE) has been used to quantify surface contamination in the aerospace community. As advances are made towards the understanding of OSEE, it is desirable to incorporate technological advances with succeeding generations of instrumentation, so that improvements in the practical application of OSEE may be disseminated among the user community. Several studies undertaken by Yost, Welch, Abedin and others have expanded the knowledge base related to the underlying principles of OSEE. The conclusions of these studies, together with inputs from the user community were the foundation upon which the development of a third generation OSEE instrument was based. This manuscript describes the significant improvements incorporated into a third generation OSEE instrument as well as the elements unique to its design.</description><language>eng</language><publisher>Legacy CDMS</publisher><subject>Optics</subject><creationdate>1995</creationdate><rights>Copyright Determination: GOV_PUBLIC_USE_PERMITTED</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,780,800</link.rule.ids><linktorsrc>$$Uhttps://ntrs.nasa.gov/citations/19950025379$$EView_record_in_NASA$$FView_record_in_$$GNASA$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Perey, D. F.</creatorcontrib><creatorcontrib>Yost, W. T.</creatorcontrib><creatorcontrib>Stone, F. D.</creatorcontrib><creatorcontrib>Welch, C. S.</creatorcontrib><creatorcontrib>Scales, E.</creatorcontrib><creatorcontrib>Gasser, E. S.</creatorcontrib><creatorcontrib>Joe, E.</creatorcontrib><creatorcontrib>Goodman, T.</creatorcontrib><creatorcontrib>Pascual, X.</creatorcontrib><creatorcontrib>Hefner, B.</creatorcontrib><title>The design and development of a third generation OSEE instrument</title><description>Optically Stimulated Electron Emission (OSEE) has been used to quantify surface contamination in the aerospace community. As advances are made towards the understanding of OSEE, it is desirable to incorporate technological advances with succeeding generations of instrumentation, so that improvements in the practical application of OSEE may be disseminated among the user community. Several studies undertaken by Yost, Welch, Abedin and others have expanded the knowledge base related to the underlying principles of OSEE. The conclusions of these studies, together with inputs from the user community were the foundation upon which the development of a third generation OSEE instrument was based. This manuscript describes the significant improvements incorporated into a third generation OSEE instrument as well as the elements unique to its design.</description><subject>Optics</subject><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1995</creationdate><recordtype>conference_proceeding</recordtype><sourceid>CYI</sourceid><recordid>eNrjZHAIyUhVSEktzkzPU0jMSwEyy1Jz8gtyU_NKFPLTFBIVSjIyi1IU0lPzUosSSzLz8xT8g11dFTLzikuKSkGqeBhY0xJzilN5oTQ3g4yba4izh25eYnFifF5JUXG8oaWlqYGBkamxuaUxAWkAf1EszA</recordid><startdate>19950301</startdate><enddate>19950301</enddate><creator>Perey, D. F.</creator><creator>Yost, W. T.</creator><creator>Stone, F. D.</creator><creator>Welch, C. S.</creator><creator>Scales, E.</creator><creator>Gasser, E. S.</creator><creator>Joe, E.</creator><creator>Goodman, T.</creator><creator>Pascual, X.</creator><creator>Hefner, B.</creator><scope>CYE</scope><scope>CYI</scope></search><sort><creationdate>19950301</creationdate><title>The design and development of a third generation OSEE instrument</title><author>Perey, D. F. ; Yost, W. T. ; Stone, F. D. ; Welch, C. S. ; Scales, E. ; Gasser, E. S. ; Joe, E. ; Goodman, T. ; Pascual, X. ; Hefner, B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-nasa_ntrs_199500253793</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1995</creationdate><topic>Optics</topic><toplevel>online_resources</toplevel><creatorcontrib>Perey, D. F.</creatorcontrib><creatorcontrib>Yost, W. T.</creatorcontrib><creatorcontrib>Stone, F. D.</creatorcontrib><creatorcontrib>Welch, C. S.</creatorcontrib><creatorcontrib>Scales, E.</creatorcontrib><creatorcontrib>Gasser, E. S.</creatorcontrib><creatorcontrib>Joe, E.</creatorcontrib><creatorcontrib>Goodman, T.</creatorcontrib><creatorcontrib>Pascual, X.</creatorcontrib><creatorcontrib>Hefner, B.</creatorcontrib><collection>NASA Scientific and Technical Information</collection><collection>NASA Technical Reports Server</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Perey, D. F.</au><au>Yost, W. T.</au><au>Stone, F. D.</au><au>Welch, C. S.</au><au>Scales, E.</au><au>Gasser, E. S.</au><au>Joe, E.</au><au>Goodman, T.</au><au>Pascual, X.</au><au>Hefner, B.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>The design and development of a third generation OSEE instrument</atitle><date>1995-03-01</date><risdate>1995</risdate><abstract>Optically Stimulated Electron Emission (OSEE) has been used to quantify surface contamination in the aerospace community. As advances are made towards the understanding of OSEE, it is desirable to incorporate technological advances with succeeding generations of instrumentation, so that improvements in the practical application of OSEE may be disseminated among the user community. Several studies undertaken by Yost, Welch, Abedin and others have expanded the knowledge base related to the underlying principles of OSEE. The conclusions of these studies, together with inputs from the user community were the foundation upon which the development of a third generation OSEE instrument was based. This manuscript describes the significant improvements incorporated into a third generation OSEE instrument as well as the elements unique to its design.</abstract><cop>Legacy CDMS</cop><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_nasa_ntrs_19950025379 |
| source | NASA Technical Reports Server |
| subjects | Optics |
| title | The design and development of a third generation OSEE instrument |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T04%3A45%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-nasa_CYI&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=The%20design%20and%20development%20of%20a%20third%20generation%20OSEE%20instrument&rft.au=Perey,%20D.%20F.&rft.date=1995-03-01&rft_id=info:doi/&rft_dat=%3Cnasa_CYI%3E19950025379%3C/nasa_CYI%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |