In Situ Single-Event Effects Detection in 22-nm FDSOI Flip-Flops

In Situ Single-Event Effects Detection in 22-nm FDSOI Flip-Flops

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Veröffentlicht in:IEEE TRANSACTIONS ON NUCLEAR SCIENCE 2024-04, Vol.71 (4), p.802-808
Hauptverfasser: Appels, Karel, Weigand, Roland, Dehaene, Wim, Prinzie, Jeffrey
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container_title IEEE TRANSACTIONS ON NUCLEAR SCIENCE
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creator Appels, Karel
Weigand, Roland
Dehaene, Wim
Prinzie, Jeffrey
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title In Situ Single-Event Effects Detection in 22-nm FDSOI Flip-Flops
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